totolerance limit is given by i -ks -987.2 - (3.064)(5.963) -968.9 4. c0trt ion of tre tam.u for the...

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UNCLASSIFIED AD NUMBER AD148179 NEW LIMITATION CHANGE TO Approved for public release, distribution unlimited FROM Distribution authorized to U.S. Gov't. agencies and their contractors; Administrative/Operational Use; 01 NOV 1957. Other requests shall be referred to Office of Naval Research, Arlington, VA 22203. AUTHORITY ONR ltr dtd 26 Oct 1977 THIS PAGE IS UNCLASSIFIED

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  • UNCLASSIFIED

    AD NUMBER

    AD148179

    NEW LIMITATION CHANGE

    TOApproved for public release, distributionunlimited

    FROMDistribution authorized to U.S. Gov't.agencies and their contractors;Administrative/Operational Use; 01 NOV1957. Other requests shall be referred toOffice of Naval Research, Arlington, VA22203.

    AUTHORITY

    ONR ltr dtd 26 Oct 1977

    THIS PAGE IS UNCLASSIFIED

  • - -"

    /

    frmed Services Technical Information OgenRqlprwouced by

    DOCUMENT SERVICE CENTERKNOTT BUILDING, DAYTON, 2, OHIO

    NOTJCF: WHEX GOVER NMP1TOR OTHER DRAWING SPEC'IFICATIONS CR C1H! R ),!L-"rAARE USED FGR ANY PURPOSE OTHER THAN IN CONCIEO"II WITH A DEFINITELY RELATEDCOVERNMENT PROCUREMENT OPER", THE V. S. COVERNME1r'TTHEREBY INCURSNO RESPONSIBIL ITY NOR ANY OUGATIONI WAIATSOSVE' AND 'THE FACT THAT THE,OVERNME NT MA Y HAVE FORMIJLAI'E URI IftHED OR IN ANY WAY SUPPLIED THE5AID DRAVUGSSPECIFICATIONJ U01 OTHER DATA NOT TO BE REGARDED BY'IMPLICA1101 09 OTHERWISS AS lAIY MANIER LICENSING THE HOLDER OR ANY OTHERPEAR5N OR CORPORAtION OR CONVEYING ANY RIGHTS OR PERMISSION TO MANUFACTURE,' Sr OR SELL ANY PATENID 114VEWION THAT MAY IN ANY WAY BE RELATED THERFTO.

    * i}-*

  • TABLES FOR ONE-SIZED STATISTICAL TOLERUCE LIMITS

    Z:::J.BY

    (Z~GERALD J. LIEBRM

    TECHNICAL REPORT NO. 34NOVEKBER I, 1957

    PMEARE UNDER CONTIRACT N6onr -25126

    GERALD J, LIKEKAN, PROJRT DIRECT'ORFOR

    OFFCR OF NAVAL R ACH

    REPOUTION IN WHOLE OR IN PART IS KI1TKD FORANY rURPOSE OF THE UNITED STATE

    APPLIED MATHD(ATICS AND STATISTICS LABORATORYSTANFORD UNIVERSITYSTANFORD, CALIFORNIA

  • .- .*1, - .- \.

    " " .

    . A- ,. ,.q

    TABLES FOR ONE-SIDED STATISTICAL TOLERANCE LIXITS

    by

    Gerald J. Lieberman

    'A

    1. INTROUCTION.

    The quality of manufactured product is often specified by setting

    a range, the bounds of which are called tolerance i ts. These limits

    have the property that a certain percentage, 00(]-a) % , of the product

    may be expected to fall within these limits. If the quality of the items

    is normally distributed with known mean, 14 , and known standard deviation,

    a , two-sided tolerance limits are formed by adding to and subtracting from

    p" the quantity K a' , where K2 is the normal deviate correspondingU/22to a/2 . An upper one-sided tolerance limit Is given by p + K or and alover one-sided tolerance limit is given by p- K a . Unfortunately, In

    apractice, the values p and a, are rarely known and estimates of these

    A values, - and a , respectively, are used. However, where before it

    could be stated that 95% of a manufactured product lies below 1 + .64 a,

    the upper one-sided tolerance limit, this statement cannot be extended to

    the limit i + 1.645 a . The quantities i and s arp random variables,

    and hence the limit depends upon the particular outcome of the sample.

    Different samples will lead to different limits. How close thebe 11mit

    are to u + 1.645 a depends upon how good the estimates are.

    It is evidnt then that the fraction of the ;tems lnc'u,&ed bet.--,r

    A,, A~ -

  • - ~; -2

    ",a. t -K., , i + K a.,s I for two-sided tolerance limits,

    b. - o, + K ] for an upper one-sided tolerance limit,

    c. Ix- Kas , co] for a lower one-sided tolerance limit

    will not always contain a specified proportion I- a of the manufactured

    items. However, it is possible to determine constants K such that in a

    large series of samples from a normal distribution, a fixed proportion 7

    of the int( rvals

    a. [-Ks, + Ks ] for two-sided tolerance limits,

    b. [- ;0, i + Ks] for an upper one-sided tolerance limit, and

    -c. - Ks, co] for a lower one-sided tolerance limit

    C will include 100(1-a)% or more of the distribution. The finite limits

    of these intevals are known as statistical tolerance limits. Thus, an

    upper one-sided statistical tolerance limt is given by x + Ks and has

    the property that the probability is equal to a preassigned value 7 that

    the interval [- co, i + Ks] includes at least a specified proportion

    1 - a of the distribution. Note that in most practical situations y is

    usually a large number close to 1 . Statistical tolerance intervals

    should not be confused with confidence intervals for a parameter of the

    distribution. Confidence limits for the mean of a normal distribution are

    such that in a given fraction, say .95 , of the samples from which they

    are computed, the interval bounded by the limits will include the true mean

    of the distribution. For confidence interval estimation, .95 is a!lso

    called the confidence coefficient.

  • Many extensive tables of factol-i K for two-sided o~lera~n:e limitshave been computed. A. R. Bovker presents such a table in [1) and very

    recently A. Lieberman issued a set of tables [2) which are an extension

    of Bowker's tables in that they can be used when s is computed from saple

    si~es other than n . Resnikoff (33 and JMitra (14) computed values of

    K when a Is estimated by the average range of subgroups. Tables of

    factors K for one-sioe. tolerance limits have never been conputed anid It

    is the purpose of this paper to present such tables.

    2.* TABfL OF ONE-SIDED T01"ACE LIM.

    Factors K such that i+ Ku and -Ks are an upper one-sided

    tolerance limit and a lower one-sided tolerance limit, respectively, for

    a normal universe are given in Table 1 for n a3,2d,...,2530,354,245,50;

    for Y a 0.75, 0.90, 0.95, 0.99; and for Q a 0.25, 0.1000.05,0.01..0.001

    iis the sample mean a (x1 + x', x.. x)/n ) and a is the sample

    st~zdard deviation

    (( a!__( )2 + (x2- ) + .+(Xn )2 /(n-l).For n greater than 50, the values of K can be obtained using the

    asymptotic normality property of x+ Ks . With tLhis approximation, K

    is given by

    K a

    a

    where

    K'~

    a 1

    K2

    .... .-. .. . . . . . . . .1* - b

  • . . . 3C M V. '1 ° -.. 4. .

    -4--

    and K and K (which equals -K, that 2 ) are thea -7 7

    normal deviates corresponding to a and 7 respectively, i.e.

    o-1 2 00 1 2

    fe nds a dz -,

    7

    3. .XAMPLZ.

    A mnufacturer of light bulbs would like to specify a single lower

    limit above which he can be assured, with probability 0.95 , that at

    least 99% of his production will lie. A sample of 30 bulbs is taken

    and the sample mean and sample standard devir.tion are found to be 987.2

    and 5 963 respectively. A value of K a 3.064 corresponding to a - 30

    7 a 0.95 and a a 0.01 is obtained from Table 1 . The required lower

    tolerance limit is given by i - Ks - 987.2 - (3.064)(5.963) - 968.9

    4. C0TRT ION OF TRE TAM.U

    For the case of a normal distribution with wkziown parameters P

    and w , exact one-sided tolerance limits my be computed by the follow-

    ing procedure. Let ta-1 , IS % be a non-central t statistic with

    n-i degrees of freedom and non-etrality parameter n K . K isaadefined by

    -2S e-Z dz -a

    Determine t0 such that P tn K > t 1 - '• Let

    K - to/ /'-. Then if i and s are the sample mean and the sample

    standard deviation, respectively, bae. on a sample x ,x ,. .Vn .e

  • -2% X 2 _ _ix= - and s n

    n n-i

    i + Ks and x - Ks are upper one-sided tolerance limit and a lower

    one-sided tolera-ice limit, respectively Thus, the probability is y that

    . at least a proport!on l-a of the distribution will be less than x + Ks

    (or greater than x .. Ks )

    The value to may be obtained from tables of the distribution of the

    non-central t sta'clstic. Such tables are those of Johnson & Welch [5]

    and Resnikoff and Lieberman [6]. The latter tables are perhaps more

    convenient for thiv application, and were used in the computation of Table 1.

    ,2

    :i

    !I

    -p.

    .1

    ---------.-- p~ . .

  • -S

    .06-

    TABLE 1.

    Tolerance Factors for Normal DistributionsFactors K such that the probability is 7 that at least a proportion

    "-a of the distribution will be less than x + Ks (or greater than x - Ks),where i and s are estimates of the mean and the standard deviation com-

    puted from a sample of size n

    7 - 0.75 I 7 - 0.90['-Cr-0.25 0.10 0.05 0.01 0.001 0.25 0.10 0.05 0.01 0.001

    3 1.464 2.501 3.152 4.396 5.805 2.602 4.258 5.310 7.340 9.651

    4 1.256 2.134 2.680 3.726 4.910 1.972 3.187 3.957 5.437 7.1285 1.152 1.961 2.463 3.421 4.507 1.698 2.742 3.400 4.666 6.112

    6 1.087 1.860 2.336 3.243 4.273 1.540 2.494 3.O91 4.242 5.556

    7 1.043 1.791 2.250 3.126 4.118 1.435 2.333 2.894 3.972 5.201

    8 1.010 1 740 2,190 3.042 4.OO8 . 1.360 2.219 2.755 3.783 4.9559 0.984 1.702 2,141 2 977 3.924 1.302 2.133 2.649 3.641 4.772

    1o 0.964 1.671 2.103 2,927 3.858 1.257 2.065 2.568 3.532 4.629

    11 0.947 1.646 2.073 2.885 3.8c4 1 219 2.012 2.503 3.444 4.51512 0.933 1.624 2.048 2.851 3.760 1.188 1.966 2.448 3.371 4.42013 0.919 1.606 2.026 2.822 3.722 1..162 1.928 2.403 3.310 4.34114 0.909 1.591 2.007 2.796 3.690 1.139 1.895 2.363 3.257 4.274

    " 15 0.899 1.577 1.991 2.776 3.661 1.119 1.866 2.329 3.212 4.215

    16 0.891 1.566 1.977 2.756 3.637 1.101 1.842 2.299 3.172 4.164

    17 0.883 1.554 1.964 2.739 3.6'r- 1.085 1.820 2.272 3.136 4.118V, 18 0.876 1,544 1.951 2.723 3.595 1.071 1.800 2.249 3.106 4.078

    :19 0.870 1.536 1.942 2.710 3.577 1.058 1.781 2.228 3.078 4.O41i20 0865 1.526 1.933 2.697 3.561 I.o46 1.765 2.208 3.052 4.009

    21 0.859 1.520 1.923 2.686 3.545 1.035 1.750 2.190 3.028 3-979022 .851, 1.514 1.916 2.675 3.532 1.025 1.736 2.174 3.007 3.952

    23 0.849 1.508 1.907 2.665 3.520 1.016 1.724 2.159 2.987 3.927* 24 0.845 1.502 1.901 2.656 3.509 1.007 1.712 2.145 2.969 3.904

    25 0.842 1.496 1.895 2.647 3.497 0.999 1.702 2.132 2.952 3.882

    S3 0.825 1.475 1.869 2.613 3.441 0.966 1.657 2.c80 2.884 3.79435 0.812 1.458 1.849 2.588 3.421 0.942 1.623 2.041 2.833 3.73040 0.803 1.445 1.834 2.568 3.395 0.923 1.598 2.010 2.793 3.67945 0.795 1.435 1.821 2.552 3.375 0.908 1.577 1.986 2.762 3.638. 0 O 788 1.426 1.811 2,538 3.358 ,894 .56G 1.965 2 73c 3.604

    iT-4

  • t --7.

    TkA=L 1.

    Tolerance Factors for Normal Distributions (continued).

    7 - 0.95 7 - 0.99\i" 0.25 0.10 0.05 0.01 0.001 0.25 0.10 0.05 0.01 0.001

    3 3.8C14 -. . 7.655 10.552 13.857C 4 2.619 4.163 5.145 7.o42 9.2155 2.149 3.4o7 4.202 5.741 7.501

    6 1.895 3.006 3.707 5.062 6.612 2.849 4.4o8 5.409 7.334 9.5407 1.732 2.755 3.399 4.641 6.o61 2.490 3.856 4.730 6.411 8.3488 1.617 2.582 3.188 4.353 5.686 ;Z 252 3.496 4.287 5.811 7.566

    1.532 2.454 3.031 4.143 5.414 2.085 3.242 3.971 5.389 7.0]4. 10 1.465 2.355 2.911 3.981 5.203 .954 3.048 3.739 5.075 6.60311 1.411 2.275 2.815 3.852 5.036 1.854 2.897 3.557 4.828 6.28412 1.366 2.210 2.736 3.747 4.900 1.771 2.773 3.41o 4.633 6.03213 1.329 2.155 2.670 3.659 4.787 1.702 2.677 3.290 4.472 5.82b14 1.296 2.108 2.t,14 3.585 4.690 1.645 2.592 3.189 4.336 5.65115 1.268 2.068 2.566 3.520 4.607 1.596 2.521 3.102 4.224 5.507

    16 1.242 2.032 2.523 3.463 4..534 1.553 2.458 3.028 4.124 5.37417 1.220 2.001 2.486 3.415 4.471 1.514 2.405 2.962 4.038 5.26813 1.200 1.974 2.453 3.370 4.415 1.1481 2.357 2.906 3.961 5.16719 1.183 1.9149 2.423 3.331 4.364 1.450 2.315 2.855 3.893 5.078W20 1.167 1.926 2.396 3.295 4.319 1.424 2.275 2.807 3.832 5.003

    21 1.152 1.905 2.371 3.262 4.276 1.397 2.241 2.768 3.776 4.932122 1.138 1.887 2.350 3.233 4.238 1.376 2.208 2.729 3.727 4.866. 23 1.126 1.869 2.329 3.206 4.204 1.355 2.179 2.693 3.680 4.80624 1.114 1.853 2.309 3.181 4.171 1.336 2.154 2.663 3.638 4.7550-4 25 1.103 1.838 2.292 3.158 4.143 1.319 2.129 2.632 3.6ol 4.706

    3C 1.059 1.778 2.220 3.064 4.022 1.249 2.029 2.516 3.446 4.50835 1.025 1.732 2.166 2.99'. 3.934 1.195 1.957 2.431 3.334 4.36,.40 0.999 1.697 2.126 2.941 3.866 1.154 1.902 2.365 3.2'0 -.. 2 545 0.978 1.669 2.092 2.897 3.811 1.122 1.857 2.313 3.181 4.16850 0.961 1.646 2.065 2.863 3.766 1.096 1.821 2.296 3.124 !,.0 9 6

    .'. "*,1

  • ~-8-

    BIBLIOGRAPHY

    [i Bowker, Albert H., "Tolerance Limits for Normal Distributions,"

    Techniques of Statistical A edited by Eisenhart, Hastay

    . and Wallis, McGraw-Hill, New York, 1947, Chapter 2.

    12) Lieberman, Alfred, "Table for the Determination of Two-sided Tolerance

    A Limits for the Normal Distribution," Report No. 373-17(55), Bureau of

    Ships, Navy Department, Washington 25, D.C., 20 August 1957.

    (33 Resnikoff, George J., "Two-sided Tolerance Limits for Normal

    - Distributions Using the Range," Technical Report No.33, Applied

    - Mathematics and Statistics Laboratory, Stanford University, California,

    April 25, 1957.

    (41 Mitra, S. K., "Tables for Tolerance Limits for a Normal Pcpulation

    * -Based on Sample Mean and Range or Mean Range," Journal of the

    American Statistical Association March 1957.

    (5] Johnson, N. L., and Welch, B. L., "Applications of the on-central

    t- Distribution," Biometri Vol. 31, (1940), Pp. 362-389.

    L61 Resnikoff, George J., and Lieberman, Gerald J., '"ables of the

    Son-central t- Distribution," Stanford University Press, Stanford,

    California, (1957), pp. 736.

    Kr.oK.-

    ,F.2.2;

    0.%--

  • -'.. -

    STANFOR Ly~wRb.&aY

    Technical Reports Distribution List

    Contract N6onr-25126

    Federal Telephone and Radio Co. Chief

    100 Kingsland Rd. Atlanta Air Procurement DistrictClifton, New Jersey Warner Robins Air Materiel Area

    Attn: Quality Control DivisionAF Plant Representative Office 441 West Peachtree Street N. E.Oklahom City Air Materiel Area Atlanta, Georgia 1General Electric CompanyP. 0. Box 91 ChiefCincinnati 15, Ohio Boston Air Procurement District

    Middletown Air Materiel AreaAmes Aeronautical Laboratory Attn: Quality Control DivisionMo "ffett Field, California Boston Arm Terminal

    Attn: Technical Librarian 1 3oston 10, Massachusetts 1

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    Ohic

  • SChief chief

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    Attn: Q4Ality Control DivisionNewark, New Jersey CChief.. Bureau or OrdnanceChief quality Control Division, QCCNew York Air Procurement Distrint Department of the NavyMiddletown. ir W*'eriel Are, Washington 25, D. C.

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    Chief, Bureau of Ship8Chief Research and Dev. Division,Philadelphia Air Procurement District Code 373Middletown Air Materiel Area Department of the NavyAttn: Quality Contr,. Division Washington 25, D. C. 6I I1 'Walnut StreetPhiladalphia 2, Pennsylvania

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    The Pentagon China Lake, Calif.Washington 25, D.C. 1 Attn: Technical Library

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  • -iv-

    Commnder el.-,zanderMobile Air Materiel Area Oklahom& city Air Materiel AreaAttn: Quality Control Office Attn: Materiel Quality DivisionBrookley Air Force Base Directorate of Supply andAlabama Services

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    AMobile Air Materiel Area:.,.,.Attn: quality Control Division Commader-. :Directorate of Procurem|ent Ogden Air Materiel Area

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    Coinsnder CommanderMobile Air Materiel Area Ogden Air Materiel AreaAttn: Materiel Quality Division Attn: Assistant for Quality

    Directorate of Supply and Directorate of MaintenanceServices Engineering

    Brookley Air Force Base Hill Air Force Base, Utah 1

    Alabama 1Comander

    Cozander Ogden Air Materiel AreaOklahoma City Air Materiel Area Attn: Materiel Quality DivisionAttn: Quality Control Office Directorate of Supply andTinker Air Force Base ServicesOslahoma City, Oklahom 1 Hill Air Force Base, Utah

    Conmander ComwAnderOklahoma City Air Materiel Area San Antonio Air Materiel Area-ttn: Quality Control Division Attn: Quality Control Office

    Directorate of Procurement Kelly Air Force Base, Texas& Production

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    Tinker Air Force Base San Antonio Air Materiel Area-, Oklahoma City, Oklahoma 1 Attn: Assistant for Quality

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    rL',

  • L ' X .•

    Com.ander CommanderSan Antonio Air Materiel Area Sa-ramento Air Materiel AreaAttn: Materiel quality Division Attn: Assistant for Quality

    Directorate of Supply ani Directorate of MaintenanceServices Engineering

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  • ',.

  • " -vii.

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    Maywood Air Force Depot 4 ,ain Air Materiel AreaChell Air Force Station Attn: uality Control OfficeAttn: Directorate of Supply & APO 28i

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    Attn: Quality Control Office, MCQComander Wright-Patterson Air Force BaseAir Materiel Force, European Area Ohio 10Attn: Quality Control OfficeAPO 633, New York, New York 1 Comaunder

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    Division 1CommanderAir Materiel Force, Pacific Area Commanding GeneralAttn: Quality Control Office Chemical Corps Materiel Command

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    4 BranchSCommander

    Northern Air Mterel Area, Pacific Commanding GeneralAttn: Quality Control Office Ordnance, Amunition CenterFEANCOM Air Base Joliet, Illinois

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    Comanding OfficerComander Office of Naval ResearchSouthern Air Materiel Area, Pacific Branch OfficeAttn: Quality Control Office 346 BroadwayClark Air Force Base New York 13, New YorkAPO 74 Attn: Dr. J. LadermanSan Francisco, California I

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  • Commanding Officer Commanding OfficerOffice of Naval Research S. C. Supply Agency

    Branch Office 225 South 18th Street1000 Geary Street Philadelphia 3, Ph.San Prancisco 9, California 1 Attn: Chief, SIGSU-H6d 2

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    Office, Chief of Engineers Computation DivisionAttn: Procurement Division, Directorate of Managemnt

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    Commanding Officer Detroit Air Pro-'tremenz D strictDiamond Ordnance Fuze aboratories W. Warren Aven t. Linyc Bl,,d.

    Attn: Mr. N. S. Leibmn bttroit 32, MichigpnRoom 100, Bldg. 52 Attn: 14OHDQPQConnecticut Ave. and Van Ness St.Washingten 25, D. C. 1 Director, Development Division

    Field ComndCommanding Officer 'med Forces Special WeaponsNaval Awmnition and Net Depot ProjectSeal Beach, California Albuquerque, New ,.exico

    Attn: QE Laboratory(Technical Library) 1 Engineering Statir'Acs Group

    Research DivisionCoanding Officer New York UniversityOffice of Naval Resedrch New York 53, N. Y.

    Branch OfficeNavy No. 100 Field Inspectton SectionFleet Post Office DES DivisionNew York, N. Y. 2 Armed Services Medical Procurement

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    Sperry Gyroscope C:.Commanding Officer Great Neck, New York

    * I Rock Island Arsenal Attn: Mr. Herbert Jaffe, CP-25 LRock Island, Illinois

    Attn: R&D Division

    S"

  • -ix-

    Eq. Mobile Air Materiel Area office of Operations AnalySis

    Materiel Quality Division (MOSQA) DCS/Operationgs

    Brookley A.Lr Force Base Hq. Air Proving Ground CoUmYnd

    Alabama Eglin Air Force Base

    Florida

    Inspection and Quality ControlDivisic.n Office

    of Technical Services

    Office, Assietant Secretary of Department of Commerce

    Defense (S&L, Washington 25, D. C.

    Washington 25, D. C.

    Attn: Mr. Irving B. Altman 1 Ordnance CorpsIndustrial Engineering Division

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    "-Washington 5, D. C. U. S. Naval Magazine

    Attn: Mr. John J. Riordan 1 Port Chicago, California

    Librarian The RAND Corporation

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    University of California Santa 14onica, California

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    George Washington University 156 ,.-dar Avenue

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    Washington 7, D. C. IAttn: Mr. Carl D. LarsonWahno 7Chief Inspector

    52HN.A. ^ 3' • N .. t;tiattcal Laboratory,\ %-."1512 11 S. N,- , .W.

    Wes&" - n 25, D. C. Univerity of California

    Atthr: Div. of Rezc?1-ch Berkeley 4, Calif'Olnia

    Infowwt,-. .Tecnnical Information Officer

    "Naval Inspector of Ordnance Naval Research LaboratoryNa,.va Iecer St rt Washington 25, C. C. 6/,'...', 00 S. Bieger Street

    Mishawaka, IndianaSAttn: N. L. Lindemmnn1

    TchcaLiryAOffice, Assistant Secretary of

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    50 West Main Street Room 3 E 1065, The ps.ntagon

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    Office of Naval Research, Code 200 Technical Operation, Tnc.

    A w and C.O..O.Washington 25, D. C.

    -..-.. Attn: Mr. John D. Wilkes Hq. Contnetal 1\rny C' r.vIt-! .

    F.- Monrre, Vlrgin ia.

    -

  • Dr. Adam Abruzzi Mr. Carlton M. BeyerDept. of Economics of Engineering Office of Ou-.ded MissilesStevens Inst. of Technology Office, Asst. Secretary ofHoboken, New Jersey 1 Defense (R & E)

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    Behavioral Sciences 2481 Davidsozi AvenueStanford, California 1 New York, N.Y.

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    Prof. Max Astrachan Prof. Irving W. BurrInstitute of Technology, USAF Dept. of MathematicsAir University Purdue University

    Wright-Patterson Air Force Base Lafayette, IndianaOhio 1

    Prof. A. Charnies

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    Mr. Allen ChopMr. J. R. Beck 162 - 8th StreetKodak Processing Laboratory Oakland 7, California925 Page Mill RoadPalo Alto, California 1 Prof. Paul Clifford

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    University of CaliforniaProf. Maurice H. Belz Los Angeles 24, CaliforniaUniversity of MelbourneCarlton N. 3 Mr. A. F. Cone, ManagerVictoria, Australia I Quality Assurance, Dept. 551

    Sandia CorporationProf. J. N. Berrettoni Albuquerque, New Mexi'oWestern Reserve UniversityCleveland, Ohio I Dr Louts COuurt

    Division .'N-t.nnal u.reau o: Stnl.arWasnington 2'., D.c'

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  • .-

    Mrs. J. Henley Crosland Mr. Donald FlischelDirector of Libraries Attn: MCRRGeorgia Inst. of Technology WA-ight-Patterson Air Force Base,Atlanta, Ga. Ohio

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    Pasadena AnnexProf. Cyrus Derman 3202 E. Foothill Blvd.Dept. of Industrial Engineering Pasadena 8, CaliforniaCol umbia UniversityNew York 27, N.Y. 1 Mr. Leoi Gilford, ADSS

    ~ 5j~y Dikuan 1-2U. S. Census BureauMr. Sidney Dickman, 9-2 Wuahington 25, D.C.Sperry Gyroscope Co.Great Neck, New York 1 Mr. Bernard P. Goldamith

    .Qality Control EngineerMr. H. F. Dodge Raytheon Mfg. Co.Bell Telephone Labs., Inc. 55 Chapel Street463 West Street Newton 58, Mass.New York, N.Y. 1

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    Cheshire, England

    Prof. Meyer Dvass c/o Office of Naval ResearchDept. of Mathematics London BranchNorthwestern University Navy No. 100, Fleet Po3st 0:'f! eEvanston, Illinois 1 New Yorm, N.Y.

    -V,

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  • ;."'."-xii -

    Prof. P rank M. Oryna, Jr. Mr. P t. LindreniQuality Control Consultant Joy Man,I'etu, g CompanySignal Corps ftgneering Lab. - *n StreetFort Monmouth, ew Jersey i C:remont, New eashire

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    Dr. James R. Jackr-zn Frederick, MarylandManagement Sciences Research Project Prof. a. W. Maclrath65 Administration Bld. Dept. of canical angneeringUniversity of California net of M in nesota~University of MinnesotaLos Angeles 24, California i Minneapolis 14, Minn.

    Mr. Brtnt C. J&cb, Jr. Dr. Paul Meyer"Chief Industrial ngineer Department of MathematicsChrysler Division-Chrysler Corp. Washington State College12200 E. Jefferson

    AvenueDetroit 14, Michigan Pulman, Washington

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    Prof. Toslo K uality Evaluation Laboratory

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    Kyusyu University Dr. R. B. MurphyFukuoka, Japan c/o Bell Telephone Labs., Inc.Mr. Howard Laitin 463 West St.

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    Bell Telephone Labs.Marray Hill, New Jersey I

    .... .. ___________________________________ ,____

  • -.. r. r,, ,_'K -,", "k? V2 NO %W, ,

    -X i IL .

    Prof. E. G. Olds J:io-'. Seymour ShermanDept. of Mathemwtics Morc Sehool of Electrical Eng.Carnegie Institute of Technology

    Unersity of Pennsylvania

    Pittsburgh, Pa. 1 Philadelphia , P.

    Mr. Cyril Peckham Mr. Walter Shewart

    Project Globe Bell Telephone Labs., Inc.

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    Dr. Pu .Mr. J. Gordon SiddonsSDr. Paul R. Rider aality Control Supervisor

    Chief Statistician Boeing Airplane Company

    Aeronautical Research Laborary Seattle i, Washington

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    Columbia UniversityDr. Harry G. Romig New York 27, N.Y.351 Alma Real

    Drive

    Pacific Palisades, California 1 Dr. Milton SobelBell Telephone Labs.

    Dr. Alan J. Rowe 555 Union Blvd.General Electric Co.

    Allentown, Pa.

    Production Control Service, 20. 2Aea

    570 Lexington Avenue rof. Herbert SolomonNew York 22, N.Y. 1 Teachers College

    Columbia UniversityProf. Herman Rubin New York 27, N.Y.Dept. of MthematicsUniversity of Oregon Dr. M. D. SpringerEugene, Oregon Head, Statistical Analysis BranchPU.S. Naval Ordnance PlantProf. Norman Rudy Indianapolis, Indiana,1

    Statistics Department

    Sacramento State College Mr. Selig StarrSacramento, California 1 Research & Development Dept.Pro- U.S. Naval Powder FactoryProf. h- nry Schieff Indianhead, Md.

    Statistical Laboratory

    University of California Mr. Arthur SteinBerkeley 4, California 1 Cornell Aeronautical Laborator4 Inc.

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    Prof. Robert Schlaifer Buffalo, N.Y.

    Graduate School of Business Adm. .

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  • Eli Xizabeth VaU4±I&flD.?.A.'on?325 7th StreetDrM.A iobyBremerton~, V&Shlyton De~pt. of )ktheatics

    cesareo, vilUeo York U4vrstInsetitute ds *tetc& Y s~ltc New York 53, N. Y.AY. J. iferrtr. e isi .R .~i

    M. Vnir' Che NPt. 2220.'1Tw, Project RAN.MW~weerin fttlsicsLb ~ Ctn'"Vo0a0t Al re taft,chemicla Corps ftgt~aeg Agency Da. - ?-BX 5WArW cbdj Cefat., aiam alad*~

    P. Stts.ca A"Itloval copies for ~jcKin~ oz MfCndLd ~e, wid reserve ror futurK~ ga on C tArio, OCad& I r qure

    Pro0f W - Allen Walliscomittee on Statistics

    t~z'res~y of (2hIcASChica3 P, Ilinois

    Prof - A. Wuto?ebatsebe xSohchui.Lerutett, ()rawy

    * ~&resu Of iSUM Co4. 20D*rmU~t of the jhyVasbgW-Oft 25, D. C. 2

    Riysicia loa rahg, %ftm'*an's 8 1uI£boMLoy aIBelmr, New Jrey

    Dr. Irvin4 Vjejebell ? -epbooe Labs.lortb Ardoyer, Is.

    yx. Silas William, Jr.StrA#ndazs BranchProcurement DivisionDCS/Logisticz c U. S. AqWshigton 25, 1b. C.

    M~r. j. W. YoungQilaty Control

    7.?rhAMriclAn Aviation, Icr~t-cntioa1Airport

    knge)E 45 Cal