towards a connected world tlf at introduction.pdf · v93000 smart scale t2000 memory test systems...

Towards A Connected World

29 June 2016

Confidential

Reorganization (M&A) in semiconductor world

What’s Next??

Moore’s law ：Slowing down?

PC, Tablet : Decrease in demand?

Smartphone : Saturated?

Mega Trend

• Trillion sensors

• 50billion device

connected

• 4ZB->44ZB data

generated

• Communication:

4G->5G

• Server storage:

HDD->SSD

• Optical

interconnect

What’s Coming…..

More & More Data

Sensed,

Communicated,

Analyzed, Stored,

and Loop

Cost Sensitive and Shorter Development Cycles

Source: Yole Development

Source: NXP Inc

Source: smarthomeenergy.co.uk

High product mix, low to high volumes

More precision and high quality aspects

Big data storage management and cloud computing

Increasing connectivity

Sustainability, Security and Safety

What Applications....

Advantest in our Lives

Technology Support on the Leading Edge

All Rights Reserved - ADVANTEST CORPORATION

Eco-friendly management

policies emphasize reduction

of our carbon footprint

60+ years of innovation in

the measurement arena

A global leader in the ATE

industry with an installed base

of over 20,000 worldwide

Listed on NYSE & TSE, for

better communication and

optimal brand positioning

Our diverse workforce

includes 4,600 employees

from 50 countries

2016/7/5 8

28 consecutive years on

VLSIresearch’s 10 BEST

supplier list

Advantest at a Glance

2016/7/5 All Rights Reserved - ADVANTEST CORPORATION

1 North America 4 South Korea

2 Europe 5 Taiwan

3 Singapore 6 China

1 San Jose

2 Munich

Boeblingen

Amerang

Gunma

Sendai

4 Cheonan

Penang

13

9

14

Regional Headquarters Major R&D Facilities Major Factories

Gunma

Saitama

Advantest Laboratories

Kitakyushu

7

8

9

10

11

12

Head Office: Tokyo, Japan

9

Global Network


＜＜＜＜Southeast Asia＞＞＞＞ Head Office： Singapore

● Production Site ：1site

・Penang, Malaysia （ＤＩ）

● Sales & Support Sites ：：：：7Sites

・Singapore

・Penang, Malaysia

・Malacca, Malaysia

・Clark, Philippines

・Baguio, Philippines

・Bangkok, Thailand

・Ho Chi Min, Vietnam

● R&D Sites •Singapore (ATE and THz)

＜＜＜＜India＞＞＞＞

●R&D Sites

• Chennai, India (wireless test software)

●

2016/7/5 10

Global Coverage: Asia

Circuits are printed(drawn) on the wafer

…trimmed and formed.

…molded…

…wire bonded to their packages…

The wafers are diced…

The dies (chips) are mounted…

Burn-in

Role in Semiconductor Manufacturing

A silicon ingot is grown from a seed crystal…


Package Test

Circuit design /pattern design

Photomask writing

The wafer is put into an oxide etch process

Transistors are built on the wafer through Oxidization / diffusion /

CVD / ion implantation processes

…and planarized

The wafer surface is oxidized…

…coated with photoresist material…

The wafers are finely polished…

The ingot is sliced into wafers…

Electrodes are formed Wafer test

Front End

Back End

MVM-SEM

Repeat

EB lithography

Test system and device interface

Marking

Complete

Burn-in tester

Test systemDevice interface

Test handler

2016/7/5 All Rights Reserved - ADVANTEST CORPORATION 12

Semiconductorand Component

Test Systems

Mechatronics

Systems

Service,Support,

& Others

● EVA Measurement System

● Electronic Measuring Instruments

● Test Burn-in Systems

Test Handlers ●

Device Interfaces ●

MVM-SEM ●

EB Lithography ●

● Support & Service

● Lease & Rental

● Terahertz Analysis Systems

● SSD Test Systems

SoC Test Systems ●

Memory Test Systems ●

Display Driver Test Systems ●

Business Segment

All Rights Reserved - ADVANTEST CORPORATION 13

■ Automated Test Equipment (ATE)

● SoC Test Systems

Advantest’s comprehensive portfolio of test solutions

offers superior productivity and flexible support for the

semiconductor supply chain. V93000 Smart Scale T2000

● Memory Test Systems

The industry-best parallel test capacity of Advantest’s test

systems for DRAM, NAND flash, and other memory devices

helps customers to minimize test cost and test times.T5503HS

T6391

● Display Driver Test Systems

With over 1,500 units shipped, Advantest’s display driver test

systems are the industry standard for testing these specialized

devices which control displays.


■ Semiconductor and Component Test Systems

● EVA(Evolutionary Value Added measurement system)

This all-in-one solution offers the functions necessary to

evaluate analog and mixed signal ICs with superior

measurement accuracy. Its intuitive interface does not

require programming knowledge. Dramatically reduces

device R&D time and cost.EVA100

● Cross-Domain AnalyzerTM

Advantest’s cross domain analyzers represent

a new category of measurement instruments

enabling dual-channel phase measurement for

the resolution of electromagnetic interference

(EMI) in electronic systems, among other

applications.


U3851

● Test Burn-in System

These systems apply electrical and thermal

stresses to screen devices for early failures,

an essential step in the test process.

B6700

■ Semiconductor and Component Test Systems


■ Mechatronics Systems

● Test Handlers

Test handlers transfer packaged semiconductors

in large batches to a test system, then sort them

based on the results of test. They enable

massively parallel test and lower semiconductor

test cost.

● Device Interfaces

These precision mechanical and

electrical components connect

semiconductor devices with test

systems.

M6245

Probe card

Change kit


■ Nanotechnologies

● MVM-SEM®

Advantest’s scanning electron microscopes

perform measurement in real time and in 3D of the

width, height, and side wall angles of nanoscale

patterns on semiconductor wafers and

photomasks.

● EB Lithography

Systems such as our F7000 use electron

beams to etch advanced nanoscale patterns

as fine as 1Xnm. EB lithography is ideal for

high-mix low-volume production and prototype

manufacturing.

E3640

F7000


■ New Businesses

● Terahertz Analysis Systems

Utilizing terahertz waves, these groundbreaking systems

perform non-invasive analysis of pharmaceuticals,

chemical samples, materials for advanced communications,

and other substances.

TAS7500SP with ThermalControl Accessory

2D Cross-Sectional Imaging

◆ Imaging Analysis of a Drug Tablet


● Mobile System Level Test

Software to validate mobile devices for smartphones

and other terminal types. Supports all usage

environments, signal carriers, and application software.

＊ Offered by W2BI, an Advantest subsidiary.

● SSD Test Systems

Supports SSD (solid state drive) test to meet

growing SSD demand from data centers, laptops,

and other applications.

MPT3000

■ New Businesses


CloudTesting™ Station

● AirLoggerTM

Real-time, wireless temperature

logger supports simultaneous

measurement of multiple points, in

small spaces, and even on the move.AirLogger™ WM1010

Measuring temperaturein motion

● CloudTestingTM Service

An industry first. Advantest’s e-commerce platform* offers

on-demand test solutions. Optimal for educational

institutions and semiconductor R&D.

* Offered through Advantest’s Cloud Testing Service subsidiary.

■ New Businesses


● Hadatomo™ Photoacoustic Microscope

A new hybrid imaging method enables non-invasive, high-contrast

imaging of blood vessels in the dermis to a depth of 3mm. Imaging

takes approx. 20 seconds for a 4mm x 4mm measurement area.

Hadatomo5100Flexible arm enables measurement

of any area of the body.

◆◆◆◆ Graphic Analysis of Blood Vessels

Images can be viewed in 3D with differentiation between

surface and dermis of blood vessels.

3D Image Skin Surface Dermis

■ New Businesses

IOT

PMIC

RF

MEMORY

SOC

PAC

TSV

SENSORS

ANALOG

MEMS

SSDAUTOMOTIVE 3D

EMBEDDED

THZ

CLOUD

SMART

PRODUCTIVITY

INNOVATION

AUTOMATION

CONNECTIVITY

TESTING

TECHNOLOGY

SOLUTIONS

PRECISION

SMART

PRODUCTIVITY

INNOVATION

AUTOMATION

CONNECTIVITY

TESTING

TECHNOLOGY

SOLUTIONS

PRECISION

Measure the Connected World

And Everything in It

towards a connected world tlf at introduction.pdf · v93000 smart scale t2000 memory test systems...

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