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The top documents of kuen-jong
On Deadlock Problem of On-Chip Buses Supporting Out-of-Order Transactions
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Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing
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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design,
215 views
[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - A Complete Logic BIST Technology with No Storage Requirement
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[IEEE 2006 International Symposium on VLSI Design, Automation and Test - Ambassador Hotel, Hsinchu (2006.4.26-2006.4.26)] 2006 International Symposium on VLSI Design, Automation and
217 views
[IEEE 2007 International Symposium on VLSI Design, Automation and Test - Hsinchu, Taiwan (2007.04.25-2007.04.27)] 2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)
215 views