via reliability: stresses and strains explained · model validation – plating thickness •...

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Via Reliability: Stresses and Strains Explained Geert Willems, Steven Thijs ACB Technology seminar April 25 th , 2012

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Page 1: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

Via Reliability: Stresses and Strains Explained

Geert Willems, Steven Thijs

ACB Technology seminar

April 25th, 2012

Page 2: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

To support industry in the development of high

quality, reliable and cost-effective electronic modules

(PBA) by means of knowledge creation and sharing,

scientifically sound methodologies and

collaboration throughout the electronic supply chain. Collective • Awareness creation

• Design Guidelines

• PBA development tools

• Seminars - training

Bilateral • Consultancy

• Knowledge transfer

• Implementation

• Training

Better electronics at reduced cost through

science based design & production methodologies.

Electronic Design & Manufacturing program MISSION

2

Page 3: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

Outline

1. Via fatigue failure: basics

2. Via elastic strain during operation Fundamental understanding and new analytical model

3. Via plastic strain

4. Conclusions

3

Page 4: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

1. Via fatigue failure: basics

• Driving force: Difference in CTE between laminate and Cu-plating of via

• Via cracking observed for PTVs – Worse with decreasing via diameter

– Worse with increasing PCB thickness

4

Paul Reid, PWB Interconnect solutions

WRONG!

Page 5: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

1. Via fatigue failure: basics

• High cycle fatigue (elastic) – During product use due to thermal cycling

• Low cycle fatigue (plastic) – During soldering due to high temperature

excursions

• “medium” cycle fatigue (elastic/plastic) – During accelerated testing (-40oC/125oC)

• Reliability prediction required – Analytical closed form preferred instead of time consuming and

expensive Finite Element Analysis

– Model (Engelmaier): IPC-D-279 (Design Guidelines for Reliable SMT PBA)

• EDM target: – Improve physical understanding of influencing parameters

– Improve analytical model using FEA as virtual test

5

Page 6: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

• Wöhler curve describes fatigue behavior of metals (IPC-D-279)

• Cycles-to-failure determined by amount of cyclic strain

• Strain range needs to be analyzed by FEM

1. Via fatigue failure: basics

6

0

1

2

3

4

5

6

7

8

9

10

1 10 100 1000 10000

N 50% cycles-to-failure

str

ain

(%

)

Df=5%

Df=8%

Df=10%

Df=15%

Df=20%

Df=25%

Df=30%

Experiment

Low strain: higher sensitivity to cycles-to-failure

FE analysis of experimental points by Melina Lofrano, imec Ref.: EDM’s DfM Guideline: PCB Specification

Page 7: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

• Elastic Engelmaier's “2-beam” model (IPC-D-279/Eq. B6)

Displacement and force equilibrium

• Validity of expression for epoxy loading area AE?

• Use FEM to check model and validity of AE

1. Via fatigue failure: basics Strain model

7

E

Cu

E

Cu

CuE

Cu

zCu

Cu,z

E

E

A

A

TFETFE

E

1

)()(,

][4

22 ddA EE

d dE

AE

D

t ACu

dD

dE 22

2

2

3444

dDdD

AE

Empirical relationship:

Page 8: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain FEM simulations

• 2-D axisymmetric FEM simulations show

• Engelmaier up to 30% error in Cu-strain

Poisson effect in copper needs to be included

8

Cu

zCu

zCuE

,

,

)(1

,,,, tCuCurCuCuzCu

Cu

zCuE

r=radial t=circumferential z=axial

t

r z

Page 9: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Physical effect

• In plane stress in epoxy ‘pulls’ on barrel in r-direction, thereby causing circumferential tensile stress in barrel: the barrel is pulled ‘open’: this reduces the axial strain.

• Epoxy is anisotropic

– Ez (2.8GPa) important for tensile axial stress in barrel

– Exy (17GPa-stiffer due to glass fibers) important for reducing tensile axial stress in barrel

• Poisson effect in epoxy can be neglected – FEM: 1% impact on strain in Cu

9

r=radial t=circumferential z=axial

t

r z

Page 10: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Interpretation analytical solution

• Approximate solution for

In-plane young’s modulus epoxy Exy impacts

– Poisson correction factor to Engelmaier model (range 1.1-1.13)

– Epoxy loading area AE,z

10

xyCuCuCuCu

xyCuCu

z

Cu

zE

zCu

zCuzE

zCu

EE

EE

E

E

A

A

TFETFE

)21()1()1(

)1(1

)()(

22

2

,

,

,,

,

CuxyEE ,,0

Page 11: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain AE,z extraction based on FEM

11

Extracting AE,z by fitting analytical model to FEM strain data

• Linear function of via diameter d: AE,z=b1+a1*d

• Dependency coefficient a1 on D: Linear

• Dependency coefficient b1 on D: Parabolic

0 1 2 3 4 5

D=0.8

D=1.2

D=1.6

D=2.2

D=3.2

Ep

oxy lo

ad

ing a

rea

AE

,z [

mm

2]

Via diameter d [mm]

0 0.5 1 1.5 2 2.5 3 3.5 4

Coefficient a1

Coefficient b1

Coe

ffic

ien

ts

PCB thickness D [mm]

Page 12: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain AE,z extraction based on FEM

• New model:

• Engelmaier: dependency d2 is wrong strain overestimated for large via diameters

12

DdEaDEbdabA xyxyzE )()( 2

2

211,

0 1 2 3 4 5

EngelmaierNew modelFEM

Ep

oxy lo

ad

ing a

rea

AE

,z [

mm

2]

Via diameter d [mm]

][4

22 ddA EE

dD

dE 22

2

2

3444

dDdD

AE

Page 13: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain AE,z dependency on Epoxy XY-stiffness

Laminate property (Exy) dependency of AE,z

• Coefficients a2 and b2 can be approximated by a linear function of Exy

• Meaning: With increasing in-plane stiffness the zone of influence enlarges.

13

0 5 10 15 20

Coefficient a2

Coefficient b2

Coe

ffic

ien

ts

In-plane young's modulus Exy

[GPa]

DdEaDEb

dabA

xyxy

zE

)()( 2

2

2

11,

Page 14: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Model validation

• Comparison old (Engelmaier) and new model with FEM results

• Based on two PCB density classes

– PCB thickness 2.2 mm and minimum via diameter 0.6

• Aspect ratio 3.7

• Relaxed end of standard PCB density class

– PCB thickness 2.2 mm and minimum via diameter 0.3

• Aspect ratio 7.3

• Advanced end of standard PCB density class

14

Page 15: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Model validation – plating thickness

• D=2.2mm, d=0.3mm, CTEz=50ppm/°C, ΔT=100°C

• Increasing plating thickness reduces strain

• Reduced strain leads to increased via lifetime

15

0

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

15 20 35

EngelmaierNew modelFEM

Cyclic

str

ain

[%

]

Plating thickness [µm]

0

5

10

15

20

25

15 20 35

EngelmaierNew modelFEM

Cycle

s to

fa

ilure

(0

.01

%)

[x1

00

0]

Plating thickness [µm]

Page 16: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Model validation – plating thickness

16

• D=2.2mm, d=0.6mm, CTEz=50ppm/°C, ΔT=100°C

• Engelmaier overestimates strain for increased via diameter

• Via lifetime underestimated using Engelmaier

0

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

15 20 35

EngelmaierNew modelFEM

Cyclic

str

ain

[%

]

Plating thickness [µm]

0

50

100

150

200

15 20 35

EngelmaierNew modelFEM

Cycle

s to

fa

ilure

(0

.01

%)

[x1

00

0]

Plating thickness [µm]

Page 17: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Model validation – thermal Z-expansion

• D=2.2mm, d=0.3mm, t=20µm, ΔT=100°C

17

100

1000

104

105

106

40 50 70

EngelmaierNew modelFEM

Cycle

s to

failu

re (

0.0

1%

)

CTEz [ppm/°C]

• Increased z-expansion of the epoxy drastically reduces via lifetime: laminate selection is critical!

Logarithmic Y-axis!

Entering plastic

domain!

Page 18: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Model validation - thermal Z-expansion

• D=2.2mm, d=0.6mm, t=20µm, ΔT=100°C

• Larger via diameter, larger Engelmaier model deviation

18

100

1000

104

105

106

40 50 70

EngelmaierNew modelFEM

Cycle

s to

failu

re (

0.0

1%

)

CTEz [ppm/°C]

Logarithmic Y-axis!

Entering plastic

domain!

Page 19: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Model validation – thermal XY-expansion

• D=2.2mm, d=0.3mm, t=20µm, ΔT=100°C

• Small impact αE,XY for small hole diameters

• Not modeled by Engelmaier

19

0

1

2

3

4

5

6

7

14 17 20

EngelmaierNew modelFEM

Cycle

s t

o f

ailu

re (

0.0

1%

) [x

10

00

]

E,xy

[ppm/°C]

0

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

14 17 20

EngelmaierNew modelFEM

Cyclic

str

ain

[%

]

aE,xy

[ppm/°C]

Page 20: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Model validation – thermal XY-expansion

• D=2.2mm, d=0.6mm, t=20µm, ΔT=100°C

• Up to 25% impact of αE,XY for large via diameter

20

0

5

10

15

20

25

14 17 20

EngelmaierNew modelFEM

Cycle

s t

o f

ailu

re (

0.0

1%

) [x

10

00

]

E,xy [ppm/°C]

0

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

14 17 20

EngelmaierNew modelFEM

Cyclic

str

ain

[%

]

aE,xy

[ppm/°C]

Page 21: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

0

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

3 10 17

EngelmaierNew modelFEM

Cyclic

str

ain

[%

]

In-plane young's modulus Exy

[GPa]

2. Via elastic strain Model validation – Epoxy XY-stiffness

• D=2.2mm, d=0.3mm, t=20µm, ΔT=100°C

• Reduced Exy increases via lifetime

• Not modeled by Engelmaier

21

0

2

4

6

8

10

3 10 17

EngelmaierNew modelFEM

Cycle

s t

o f

ailu

re (

0.0

1%

) [x

100

0]

In-plane young's modulus Exy

[GPa]

Polyimide FR4

Page 22: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

2. Via elastic strain Model validation – Epoxy XY-stiffness

• D=2.2mm, d=0.6mm, t=20µm, ΔT=100°C

• Reduced Exy increases via lifetime for large via diameter

22

0

10

20

30

40

50

3 10 17

EngelmaierNew modelFEM

Cycle

s to f

ailu

re (

0.0

1%

) [x

1000

]

In-plane young's modulus Exy

[GPa]

0

0.05

0.1

0.15

0.2

0.25

0.3

0.35

0.4

3 10 17

EngelmaierNew modelFEM

Cyclic

str

ain

[%

]

In-plane young's modulus Exy

[GPa]

Polyimide FR4

Page 23: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

3. Via plastic strain

• Large thermal mismatch drives Cu barrel into plastic deformation domain.

• Note: fatigue modeling elastic strain range limit = 2x 0.2% = 0.4%

23

Strain

Stress Inelastic Energy

density

Inelastic strain

Page 24: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

3. Via plastic strain Influence CTEz, ΔT=-40+125°C

• D=2.2mm, d=0.3mm D=2.2mm, d=0.6mm

• CTEz=50ppm/°C: Cu elastic; CTEz=70ppm/°C: Cu plastic

24

0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

0.8

50 ppm/°CFEM

50 ppm/°CModel

70 ppm/°CFEM

70 ppm/°CModel

Plastic

Elastic

Cyclic

str

ain

[%

]

10

100

1000

10000

50 70

New model

FEM

Cycle

s to f

ailu

re (

0.0

1%

)

CTEz [ppm/°C]

0

0.1

0.2

0.3

0.4

0.5

0.6

0.7

50 ppm/°CFEM

50 ppm/°CModel

70 ppm/°CFEM

70 ppm/°CModel

Plastic

Elastic

Cyclic

str

ain

[%

]

100

1000

104

50 70

New model

FEM

Cycle

s to

failu

re (

0.0

1%

)

CTEz [ppm/°C]

Page 25: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

E

Cu

E

Cu

ECu

CuCu

E

CuyCuE

zCu

E

E

A

A

EE

EE

A

ASTFETFE

'

'

,

1

2)()(

3. Via plastic strain

Updated Plastic Engelmaier's 2-beam model (IPC-D-279/Eq. B7)

25

-0.6 -0.4 -0.2 0 0.2 0.4

-200

-150

-100

-50

0

50

100

150

200

Str

ess

[M

Pa

]

Strain [%]

Elastic model Plastic model

Transition region

0.4

0.5

0.6

0.7

0.8

0.9

1D=2.2mm, d=0.3mm

FEMEngelmaierEngelmaier 2SyNew model

Cyclic

str

ain

[%

]

Same AE as in elastic region!

Engelmaier overestimates strain

Page 26: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

Via plastic strain

• Δε < 0.5%: Elastic model

• 0.5% < Δε < 0.7%: Transition region

• Δε > 0.7%: Plastic model

26

0 1 2 3 4 5

FEM

Plastic model

Elastic model

0.4

0.45

0.5

0.55

0.6

0.65

0.7

0.75

0.8

Cyclic

str

ain

[%

]

Via diameter d [mm]

Transition region

Further modeling required for

transition region

D=2.2mm

Page 27: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

4. Conclusions

• Via strain during operation and accelerated test

– Poisson coefficient copper needs to be taken into account

– Anisotropy of epoxy needs to be included

– Correction factor to original Engelmaier model introduced

– Improved model for epoxy loading area

• Also dependent on Epoxy parameters

– New model verified

• For geometric dimensions

• For material parameters

• For temperature dependency

– Epoxy loading area model validity confirmed in plastic region

– Further modeling required for elastic-plastic transition region.

• New model will be included (mid 2012) in DfM Guideline: PCB Specification V2

27

Page 28: Via Reliability: Stresses and Strains Explained · Model validation – plating thickness • D=2.2mm, d=0.3mm, CTE z =50ppm/°C, ΔT=100°C • Increasing plating thickness reduces

© imec 2012 | www.edmp.be

Thank you!

[email protected]

++32-498-919464

www.edmp.be

28

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