xis calibration on the ground status report k. hayashida (osaka university) and the xis-team
TRANSCRIPT
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XIS Calibration on the GroundXIS Calibration on the GroundStatus ReportStatus Report
K. Hayashida (Osaka University) aK. Hayashida (Osaka University) and the XIS-team nd the XIS-team
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XIS ComponentsXIS Components XIS-SensorsXIS-Sensors
CCID41-FI CCDCCID41-FI CCDEU (Engineering Unit)EU (Engineering Unit)FM FM FI0FI0,,FI1FI1,,FI2,FI3FI2,FI3
• CCID41-BI CCDCCID41-BI CCD• FM FM BI0BI0,,BI1BI1
AE/TCEAE/TCE FM AE/TCE01,23FM AE/TCE01,23 EM AE/TCEEM AE/TCE
DEDE FM 4PPU+MPUFM 4PPU+MPU
XRT
SensorAE/TCE
to DP
MPU
PPU
PPU
Bonnet
Base
DE
FM Spare before LaunchFM Spare before Launch
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Calibration Task ShareCalibration Task ShareComponentsComponents LocationLocation X-ray SourceX-ray Source QE referenceQE reference
Chip levelChip level CSR/MITCSR/MIT Fluorescent X-rays (C,O,Fluorescent X-rays (C,O,F,Al,Si,P,Ti,Mn,Cu)F,Al,Si,P,Ti,Mn,Cu)
ACIS chips ACIS chips calibrated at calibrated at BESSYBESSY
Camera Camera without OBFwithout OBF
+FM AE+FM AE
OsakaOsaka Grating SpectrometerGrating Spectrometer
0.2-2.2keV0.2-2.2keV
Polypro-window Polypro-window Gas PC & XIS-Gas PC & XIS-EUEU
KyotoKyoto Fluorescent X-rays (Al,CFluorescent X-rays (Al,Cl,Ti,Mn,Fe,Zn,Se)l,Ti,Mn,Fe,Zn,Se)
Window-less Window-less SSDSSD
OBFOBF Synchrotron Synchrotron FacilityFacility
Synchrotron X-rays + moSynchrotron X-rays + monochrometernochrometer
(Transmission (Transmission measurement measurement with PIN diode)with PIN diode)
Camera Camera onboard the onboard the satellitesatellite
ISAS/JAXAISAS/JAXA 55Fe55Fe
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XIS Data ReductionXIS Data Reduction
Frame Data /8secFrame Data /8secDark-level SubtractionDark-level SubtractionEvent Pickup (PH(E)>Event Threshold)Event Pickup (PH(E)>Event Threshold)5x5 mode, 3x3 mode or 2x2 mode 5x5 mode, 3x3 mode or 2x2 mode
Event dataEvent dataCharge Trail CorrectionCharge Trail CorrectionGrading / PHA-reproduction for PH(i)>Split ThGrading / PHA-reproduction for PH(i)>Split Th
resholdresholdPHA-dependent Split Threshold for BIPHA-dependent Split Threshold for BI
Bad Columns FilterBad Columns Filter Spectrum / Image / Light CurveSpectrum / Image / Light Curve
Onb
oard
DE
On
the
grou
nd
XIS Response depends on the reduction procedure
* :Newly introduced
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Event Grades Event Grades Grades 02346 are Grades 02346 are
used as X-ray used as X-ray events.events.
grade0
grade1
grade2
grade3
grade4
grade5
grade6
grade7
Pixel level is maximum among 3x3 area and larger than Event threshold
Pixel level is larger than Split threshold and added to the PHA
Pixel level is larger than Split threshold but NOT added to the PHA
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PH(2),PH(7) distributionPH(2),PH(7) distributionPH(2)PH(2) = preceding pixel = preceding pixel ,,PHPH
(7)(7) =trailing pixel=trailing pixel
PH [ADU] PH [ADU]
PH [ADU]PH [ADU]
Near readout node
Far from readout node
BI1 5.9keV X-ray incidenceR
AW
Y
d
c
b
a
a b
c d
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Amount of Charge in the TrailAmount of Charge in the Trail
BI1
PH
(7)C
en
ter
[AD
U]
CTI = (4.5±0.3)×10 [ /Transfer ]-6
Slope ↓CTI estimated from this trailing charge
Mn K
Number of V-Transfer in the Imaging Area
*) temperature dependence was observed
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Incident X-ray Energy Dependence Incident X-ray Energy Dependence
VCTI= (1.72 ・ 10 )×E- 0.5- 4
HCTI= (6.06 ・ 10 )×E- 0.5- 4
We can tell the amount of charge deposited in PH(7) and PH(5) => Charge Trail Correction
V-transfer H-transfer
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PH(2),PH(7) Distribution before/after Charge Trail CorrectionPH(2),PH(7) Distribution before/after Charge Trail Correction
PH [ADU] PH [ADU]
PH [ADU]PH [ADU]
PH [ADU] PH [ADU]
PH [ADU]PH [ADU]
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Effects of Charge Trail CorrectionEffects of Charge Trail Correction
Correct Grade Branching Ratio and PH()Correct Grade Branching Ratio and PH()Reduce Grade7 events due to Charge Trail. Reduce Grade7 events due to Charge Trail.
10%-20% increase in Grade02346 ratio at 10%-20% increase in Grade02346 ratio at high energies. high energies.
Restore Non-uniformity in effective QE.Restore Non-uniformity in effective QE. (Partial) Restoration in the Energy Scale.(Partial) Restoration in the Energy Scale.
Traps with Other time scales are not negligible. Traps with Other time scales are not negligible.
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Optimization of Split Threshold for Optimization of Split Threshold for BI1BI1 G02346 event numberG02346 event number FWHM (eV)FWHM (eV)
Spth (ADU)
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PHA-dependent SpThPHA-dependent SpTh
4
6
8
10
12
14
16
0.1 1 101
spth_20050309
5percent_plus2adu3percent_plus2adu97%/spth=20ADU0.5%/ADU
y = 9.6236 + 1.6084log(x) R= 0.898
y = 10.359 + 2.2075log(x) R= 0.93167
y = 9.577 + 2.7211log(x) R= 0.97172
y = 11.313 + 3.3202log(x) R= 0.96443
Ex(keV)
PHA-dependent Split Threshold for BI
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Bad (CTE) ColumnsBad (CTE) Columns
Bad CTEBad CTE Typically long trail in each event.Typically long trail in each event. Sometimes flickering pixel is observed.Sometimes flickering pixel is observed. Rows near the readout node can be used.Rows near the readout node can be used.
Identification logic without accumulating Identification logic without accumulating 10^7events was developed. 10^7events was developed. EU= 21 bad columns/chipEU= 21 bad columns/chip FI0=14, FI1=12, FI2=17,FI3=24FI0=14, FI1=12, FI2=17,FI3=24 BI0=23, BI1=50BI0=23, BI1=50
How should we do for adjacent columns ?How should we do for adjacent columns ?
X-ray image (number of events /pixel)
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Kyoto Cal Kyoto Cal SystemSystem
Fluorescent X-rays (AFluorescent X-rays (Al,Cl,Ti,Mn,Fe,Zn,Se)l,Cl,Ti,Mn,Fe,Zn,Se)
Windowless Si-SSD is Windowless Si-SSD is used as the reference used as the reference counter, assuming 10counter, assuming 100% efficiency >1.5keV0% efficiency >1.5keV
XIS FI-CCD XIS FI-CCD QE=96%@4.5keVQE=96%@4.5keV is a is assumedssumed
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Detector Chamber
Manson Soft X-ray Generator
Hetrick Spectrometer
Calibration Facility in the Osaka Calibration Facility in the Osaka Clean Room Clean Room
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Dispersion (Grating) Dispersion (Grating) SpectrumSpectrum
X-ray imageX-ray image
O-Kα( 0.53keV )
C-Kα(0.28keV)
X-r
ay
en
erg
y
Number of events/columns
Dispersion direction
projection
FWHM ~ 5eV
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Line profile against O-K line incidenceLine profile against O-K line incidence
Astro-E1 (FI) XISAstro-E1 (FI) XIS
5 kV
PHA(ADU)XIS1 (H.Katayama master thesis)
FI2
Astro-E2 (FI) XISAstro-E2 (FI) XIS
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Line Profile model
(1) Main Peak :Absorption in Depletion Layer
(2) Sub Peak : Lost charge below Split-threshold
(3) Triangle Comp. :Channel Stop origin
(4) Constant Comp. :Partial absorption in SiO2
parameters :
T1 (normalization), C1(center), S1(sigma)
T2 (relative to T1), C2(spth/2, fixed), S2 (1.78×S1, fixed)
T3 (relative to T1), F3( 三角形の幅 , 0.5×C1)
T4 (T1 で規格化した面積 ) → フリーパラメタ 6 個 でフィット
F3
BI structure
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Line profile for FI1 sensor
T2=0.033, T4=0.0052 T2=0.020, T4=0.0045 (Seg.B)
O-K lineE=0.525keV
Se-L lineE=1.379keV
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Line profile for BI1 sensorO-K lineE=0.525keV
T2=0.19, T4=0.015 T2=0.071, T4=0.011 T2=0.078, T4=0.016
Al-K lineE=1.487keV
C-K lineE=0.277keV
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スペクトルの比較スペクトルの比較BI1 g02346
カウントカウント数 数
エネルギー分解能 エネルギー分解能 [e[eV]V]
補正前補正前 6240362403 165.7±0.6165.7±0.6
補正後補正後 7205772057 163.0±0.6163.0±0.6
補正+バッドコラム除去補正+バッドコラム除去 6889468894 162.6±0.6162.6±0.6
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Energy and Pulse-height LinearityBI1, Seg.CFI1, Seg.C
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Energy Resolution (FWHM)FI-1, Seg.C BI-1, Seg.C
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Quantumn Efficiency Measurement Quantumn Efficiency Measurement at Osakaat Osaka
Relative Efficiencies of FM-Relative Efficiencies of FM-FI0,FI1,FI2,FI3,BI0,BI1 and XIS-EU are FI0,FI1,FI2,FI3,BI0,BI1 and XIS-EU are measured by irradiating X-rays from the measured by irradiating X-rays from the spectrometer to whole the CCD area. spectrometer to whole the CCD area. Generator beam current is always monitored and Generator beam current is always monitored and
stabilized <1%.stabilized <1%.
XIS-EU was cross-calibrated to a Gas PC on XIS-EU was cross-calibrated to a Gas PC on 2003Dec & 2004Jul. XIS-FM are not installed in 2003Dec & 2004Jul. XIS-FM are not installed in the chamber with the Gas PC simultaneously.the chamber with the Gas PC simultaneously.
The gas PC was calibrated through the slant The gas PC was calibrated through the slant incident method in 2004 January. incident method in 2004 January.
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X-raysX-rays
Slant Incident Method: Application Slant Incident Method: Application to Gas PCto Gas PC
We determined to use the Gas PC as the reference counter
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Cou
nts
PH (ch)
0° 30° 45°
Gas PC Spectra for Different Gas PC Spectra for Different Incident AngleIncident Angle
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0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1
0.2 0.4 0.6 0.8 1
cou
nt
rate
ra
tio
Ex (keV)
30°/0°
45°/0°
Ratio of Counting rate of Gas PC
Best fit estimateBest fit estimate
Poly propylene Poly propylene thicknessthickness
1.011.01±0.06±0.06mm
HH22OO 0.2810.281±0.048±0.048mm
P10gas dead P10gas dead layerlayer
79.6±9.779.6±9.7mm
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0.1
1
0.2 0.4 0.6 0.8 1
pcqe 7:40:42 2005/02/25
PC QE (2005/02/14 version)
QE
mo
de
l
Ex (keV)
PC QE model
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XIS-EU and Gas PC cross XIS-EU and Gas PC cross calibration using a entrance slit calibration using a entrance slit
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X-rays through Slit ( ~1mm)X-rays through Slit ( ~1mm)
Dispersion Direction
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PC (0.525keV) XIS-EU (0.525keV)
PC Spectra and CCD Spectra PC Spectra and CCD Spectra
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0.01
0.1
1
0.2 0.4 0.6 0.8 1
XISEU-QE(2004Jul)XISEU-QE(2003Dec)XISEU-QE model(200500315version)
XIS
EU
-QE
Ex(keV)
Best Fit EstimatesBest Fit Estimates
SiO2SiO2 0.4710.471±0.039±0.039mm
SiSi 0.2050.205±0.029±0.029mm
Si3N4Si3N4 0.000±0.030.000±0.03mm
Si depletion 65m fixedm fixed
Constant Constant FactorFactor
0.852±0.0350.852±0.035
-1deg offset slant-PC is assumed
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Relative QE of FMFI / XIS-EU Relative QE of FMFI / XIS-EU
FI0 FI1
FI2FI3
Red=determined from the line components Long term variability is too high to be precisely corrected
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Relative QE of BI0,BI1 to XIS-EURelative QE of BI0,BI1 to XIS-EU
BI0 BI1
~ [email protected] keV~ [email protected] keV
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0.01
0.1
1
1 10
XIS FI1 QE
FI1-QE(Osaka)
FI1-QE(Kyoto)
Ex(keV)
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0.01
0.1
1
1 10
XIS FI1 QE
FI1-QE(Osaka)
FI1-QE(Kyoto)x0.8
FI1 QEmodel
Ex(keV)
Best Fit Best Fit EstimatesEstimates
SiO2SiO2 0.4430.443±0.039±0.039mm
SiSi 0.1810.181±0.029±0.029mm
Si3N4Si3N4 0.000±0.0160.000±0.016mm
Si depletion
68.9±1.7±1.7mm
Constant Constant FactorFactor
0.857±0.0030.857±0.003
-1deg offset slant-PC is assumed
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XAFS near the O-KedgeXAFS near the O-Kedge
FI-2
Eedge = 0.532 ±0.001 keV red.2 = 1.3178 (d.o.f. = 418)
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0.1
1
1 10
XIS BI1 QE
BI1-QE(Osaka -1deg)BI1-QE(Kyoto)BI1-QE(Osaka 0deg)BI1-QE(Osaka +1deg)BI1 QEmodel with H2OBI1 QEmoel without H2O
Ex(keV)
Best Fit Best Fit EstimatesEstimates
HfO2HfO2 0.0050.005m fixedm fixed
AgAg 0.0010.001m fixedm fixed
SiO2SiO2 0.000±0.00050.000±0.0005mm
Si depletion
45.7±0.7±0.7mm
Constant Constant FactorFactor
0.934±0.0030.934±0.003
-1deg offset slant-PC is assumed
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Upper limit of Surface dead layer in BI-CCDUpper limit of Surface dead layer in BI-CCD
0.45 0.5 0.55 0.6 keV
H2O on BI1 <0.11 μm
Dispersion Spectrum with BIμ
m (
H2O
)
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Absolute QE issuesAbsolute QE issues Reconsider the assumptionsReconsider the assumptions
96% at 4.5keV for XIS-FI Check grade7 events ?
Gas PC window model Mesh measurement ?
ACIS BESSY calibration How was the effective area or normalization calibrated ?
How about Channel Stop events ? Hidden dead space in FI ? Adopt the BI1 QE as a reference
BI QE should not be 1 (at least a few % grade 7 events) How do we model F_data-reduction ?
Application of the Slant Incidence method to BI0 after the Astro-E2 launch. Any other good way for the absolute QE cal ?
Energy independent factor of 10% is not a problem. Edge structure of 10% might be a problem.
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SummarySummary
We have completed the calibration experiments We have completed the calibration experiments on the ground for XIS flight models.on the ground for XIS flight models.
Data reduction procedures were updated for Data reduction procedures were updated for Astro-E2 XIS.Astro-E2 XIS. Conversion to FTOOLS will be required.Conversion to FTOOLS will be required.
Profile has less tail component than Astro-E1 Profile has less tail component than Astro-E1 XIS.XIS.
Relative QE between the XIS sensors were Relative QE between the XIS sensors were accurately measured <5%?.accurately measured <5%?.
We need further work on absolute QE.We need further work on absolute QE.