1200 v, 25 a npt trench igbt

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©2006 Fairchild Semiconductor Corporation 1 www.fairchildsemi.com FGA25N120ANTDTU Rev. C2 FGA25N120ANTDTU — 1200 V, 25 A NPT Trench IGBT April 2014 FGA25N120ANTDTU 1200 V, 25 A NPT Trench IGBT Features NPT Trench Technology, Positive Temperature Coefficient Low Saturation Voltage: V CE(sat), typ = 2.0 V @ I C = 25 A and T C = 25°C Low Switching Loss: E off, typ = 0.96 mJ @ I C = 25 A and T C = 25°C Extremely Enhanced Avalanche Capability Applications Induction Heating, Microwave Oven Description Using Fairchild's proprietary trench design and advanced NPT technology, the 1200V NPT IGBT offers superior conduction and switching performances, high avalanche ruggedness and easy parallel operation. This device is well suited for the reso- nant or soft switching application such as induction heating, microwave oven. G C E G C E GCE TO-3P Absolute Maximum Ratings Symbol Description Ratings Unit V CES Collector-Emitter Voltage 1200 V V GES Gate-Emitter Voltage ± 20 V I C Collector Current @ T C = 25°C 50 A Collector Current @ T C = 100°C 25 A I CM (1) Pulsed Collector Current 90 A I F Diode Continuous Forward Current @ T C = 25°C 50 A Diode Continuous Forward Current @ T C = 100°C 25 A I FM Diode Maximum Forward Current 150 A P D Maximum Power Dissipation @ T C = 25°C 312 W Maximum Power Dissipation @ T C = 100°C 125 W T J Operating Junction Temperature -55 to +150 °C T stg Storage Temperature Range -55 to +150 °C T L Maximum Lead Temp. for soldering Purposes, 1/8” from case for 5 seconds 300 °C Notes: (1) Repetitive rating: Pulse width limited by max. junction temperature Thermal Characteristics Symbol Parameter Typ. Max. Unit R θJC (IGBT) Thermal Resistance, Junction-to-Case -- 0.4 °C/W R θJC (DIODE) Thermal Resistance, Junction-to-Case -- 2.0 °C/W R θJA Thermal Resistance, Junction-to-Ambient -- 40 °C/W

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Page 1: 1200 V, 25 A NPT Trench IGBT

©20FG

FGA

25N120A

NTD

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1200 V, 25 A N

PT Trench IGB

T

April 2014

FGA25N120ANTDTU1200 V, 25 A NPT Trench IGBT

Features • NPT Trench Technology, Positive Temperature Coefficient

• Low Saturation Voltage: VCE(sat), typ = 2.0 V @ IC = 25 A and TC = 25°C

• Low Switching Loss: Eoff, typ = 0.96 mJ @ IC = 25 A and TC = 25°C

• Extremely Enhanced Avalanche Capability

Applications• Induction Heating, Microwave Oven

DescriptionUsing Fairchild's proprietary trench design and advanced NPT technology, the 1200V NPT IGBT offers superior conduction and switching performances, high avalanche ruggedness and easy parallel operation. This device is well suited for the reso-nant or soft switching application such as induction heating, microwave oven.

G

C

E

G

C

EG C ETO-3P

Absolute Maximum RatingsSymbol Description Ratings Unit

VCES Collector-Emitter Voltage 1200 V

VGES Gate-Emitter Voltage ± 20 V

ICCollector Current @ TC = 25°C 50 A

Collector Current @ TC = 100°C 25 A

ICM (1) Pulsed Collector Current 90 A

IFDiode Continuous Forward Current @ TC = 25°C 50 A

Diode Continuous Forward Current @ TC = 100°C 25 A

IFM Diode Maximum Forward Current 150 A

PDMaximum Power Dissipation @ TC = 25°C 312 W

Maximum Power Dissipation @ TC = 100°C 125 W

TJ Operating Junction Temperature -55 to +150 °C

Tstg Storage Temperature Range -55 to +150 °C

TLMaximum Lead Temp. for soldering Purposes, 1/8” from case for 5 seconds 300 °C

Notes:(1) Repetitive rating: Pulse width limited by max. junction temperature

Thermal CharacteristicsSymbol Parameter Typ. Max. Unit

RθJC(IGBT) Thermal Resistance, Junction-to-Case -- 0.4 °C/W

RθJC(DIODE) Thermal Resistance, Junction-to-Case -- 2.0 °C/W

RθJA Thermal Resistance, Junction-to-Ambient -- 40 °C/W

06 Fairchild Semiconductor Corporation 1 www.fairchildsemi.comA25N120ANTDTU Rev. C2

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Package Marking and Ordering Information

Part Number Top Mark Package PackingMethod Reel Size Tape Width Quantity

FGA25N120ANTDTU_F109 FGA25N120ANTDTU TO-3PN Tube N/A N/A 30

Electrical Characteristics of the IGBT TC = 25°C unless otherwise noted

Symbol Parameter Test Conditions Min. Typ. Max. Unit Off Characteristics

ICES Collector Cut-Off Current VCE = VCES, VGE = 0 V -- -- 3 mA

IGES G-E Leakage Current VGE = VGES, VCE = 0 V -- -- ± 250 nA

On Characteristics

VGE(th) G-E Threshold Voltage IC = 25 mA, VCE = VGE 3.5 5.5 7.5 V

VCE(sat)Collector to Emitter Saturation Voltage

IC = 25 A, VGE = 15 V -- 2.0 -- V

IC = 25 A, VGE = 15 V, TC = 125°C

-- 2.15 -- V

IC = 50 A, VGE = 15 V -- 2.65 -- V

Dynamic Characteristics

Cies Input Capacitance VCE = 30 V, VGE = 0 V, f = 1 MHz

-- 3700 -- pF

Coes Output Capacitance -- 130 -- pF

Cres Reverse Transfer Capacitance -- 80 -- pF

Switching Characteristics

td(on) Turn-On Delay Time

VCC = 600 V, IC = 25 A,RG = 10 Ω, VGE = 15 V,Inductive Load, TC = 25°C

-- 50 -- ns

tr Rise Time -- 60 -- ns

td(off) Turn-Off Delay Time -- 190 -- ns

tf Fall Time -- 100 -- ns

Eon Turn-On Switching Loss -- 4.1 -- mJ

Eoff Turn-Off Switching Loss -- 0.96 -- mJ

Ets Total Switching Loss -- 5.06 -- mJ

td(on) Turn-On Delay Time

VCC = 600 V, IC = 25 A,RG = 10Ω, VGE = 15 V,Inductive Load, TC = 125°C

-- 50 -- ns

tr Rise Time -- 60 -- ns

td(off) Turn-Off Delay Time -- 200 -- ns

tf Fall Time -- 154 -- ns

Eon Turn-On Switching Loss -- 4.3 -- mJ

Eoff Turn-Off Switching Loss -- 1.5 -- mJ

Ets Total Switching Loss -- 5.8 -- mJ

Qg Total Gate ChargeVCE = 600 V, IC = 25 A,VGE = 15 V

-- 200 -- nC

Qge Gate-Emitter Charge -- 15 -- nC

Qgc Gate-Collector Charge -- 100 -- nC

06 Fairchild Semiconductor Corporation 2 www.fairchildsemi.comA25N120ANTDTU Rev. C2

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Electrical Characteristics of DIODE TC = 25°C unless otherwise noted

Symbol Parameter Test Conditions Min. Typ. Max. Unit

VFM Diode Forward Voltage IF = 25 A TC = 25°C -- 2.0 3.0

VTC = 125°C -- 2.1 --

trr Diode Reverse Recovery Time

IF = 25 AdiF/dt = 200 A/μs

TC = 25°C -- 235 350ns

TC = 125°C -- 300 --

IrrDiode Peak Reverse Recovery Cur-rent

TC = 25°C -- 27 40A

TC = 125°C -- 31 --

Qrr Diode Reverse Recovery ChargeTC = 25°C -- 3130 4700

nCTC = 125°C -- 4650 --

06 Fairchild Semiconductor Corporation 3 www.fairchildsemi.comA25N120ANTDTU Rev. C2

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PT Trench IGB

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Typical Performance Characteristics

Figure 1. Typical Output Characteristics Figure 2. Typical Saturation Voltage

0 1 2 3 4 50

20

40

60

80

100

120Common EmitterVGE = 15VTC = 25°C TC = 125°C

Col

lect

or C

urre

nt, I

C [A

]

Collector-Emitter Voltage, VCE [V]

0 2 4 6 8 100

20

40

60

80

100

120

140

160

180

10V

9V

8V

7V

20V17V

15V 12V

VGE = 6V

TC = 25°C

Col

lect

or C

urre

nt, I

C [A

]

Collector-Emitter Voltage, VCE [V]

Characteristics

Figure 3. Saturation Voltage vs. Case Figure 4. Saturation Voltage vs. VGETemperature at Variant Current Level

25 50 75 100 1251.5

2.0

2.5

3.0Common EmitterVGE = 15V

40A

IC = 25A

Col

lect

or-E

mitt

er V

olta

ge, V

CE [V

]

Case Temperature, TC [°C]

0 4 8 12 16 200

4

8

12

16

20

40A25A

Common EmitterTC = -40°C

IC = 12.5A

C

olle

ctor

-Em

itter

Vol

tage

, VC

E [V

]

Gate-Emitter Voltage, VGE [V]

Figure 5. Saturation Voltage vs. VGE

0 4 8 12 16 200

4

8

12

16

20

40A25A

Common EmitterTC = 125°C

IC = 12.5A

Col

lect

or-E

mitt

er V

olta

ge, V

CE [V

]

Gate-Emitter Voltage, VGE [V]

0 4 8 12 16 200

4

8

12

16

20

40A25A

Common EmitterTC = 25°C

IC = 12.5A

Col

lect

or-E

mitt

er V

olta

ge, V

CE [V

]

Gate-Emitter Voltage, VGE [V]

Figure 6. Saturation Voltage vs. VGE

06 Fairchild Semiconductor Corporation 4 www.fairchildsemi.comA25N120ANTDTU Rev. C2

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Typical Performance Characteristics (Continued)

Figure 7. Capacitance Characteristics Figure 8. Turn-On Characteristics vs. Gate Resistance

0 10 20 30 40 50 60 7010

100

Common EmitterVCC = 600V, VGE = ±15VIC = 25ATC = 25°C TC = 125°C

td(on)

tr

Sw

itchi

ng T

ime

[ns]

Gate Resistance, RG [Ω]

1 100

500

1000

1500

2000

2500

3000

3500

4000

4500

5000

Ciss

Coss

Common EmitterVGE = 0V, f = 1MHzTC = 25°C

Crss

Cap

acita

nce

[pF]

Collector-Emitter Voltage, VCE [V]

Figure 9. Turn-Off Characteristics vs. Figure 10. Switching Loss vs. Gate ResistanceGate Resistance

0 10 20 30 40 50 60 70

1

10

Common EmitterVCC = 600V, VGE = ±15VIC = 25ATC = 25°C TC = 125°C

Eon

Eoff

S

witc

hing

Los

s [m

J]

Gate Resistance, RG [Ω]

0 10 20 30 40 50 60 7010

100

1000

Common EmitterVCC = 600V, VGE = ±15VIC = 25ATC = 25°C TC = 125°C

td(off)

tf

Sw

itchi

ng T

ime

[ns]

Gate Resistance, RG [Ω]

Figure 11. Turn-On Characteristics vs. Figure 12. Turn-Off Characteristics vs.Collector Current Collector Current

10 20 30 40 50

100

Common EmitterVGE = ±15V, RG = 10Ω

TC = 25°C TC = 125°C

tr

td(on)

Sw

itchi

ng T

ime

[ns]

Collector Current, IC [A]

10 20 30 40 50

100

Common EmitterVGE = ±15V, RG = 10Ω

TC = 25°C TC = 125°C

td(off)

tf

Sw

itchi

ng T

ime

[ns]

Collector Current, IC [A]

06 Fairchild Semiconductor Corporation 5 www.fairchildsemi.comA25N120ANTDTU Rev. C2

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Typical Performance Characteristics (Continued)

Figure 13. Switching Loss vs. Collector Current Figure 14. Gate Charge Characteristics

10 20 30 40 500.1

1

10

Common EmitterVGE = ±15V, RG = 10Ω

TC = 25°C TC = 125°C

Eon

Eoff

Switc

hing

Los

s [m

J]

Collector Current, IC [A]

0 20 40 60 80 100 120 140 160 180 2000

2

4

6

8

10

12

14

16

600V

400V

Common EmitterRL = 24Ω

TC = 25°C

Vcc = 200V

Gat

e-E

mitt

er V

olta

ge, V

GE [V

]

Gate Charge, Qg [nC]

Figure 15. SOA Characteristics Figure 16. Turn-Off SOA

1 10 100 10001

10

100

Safe Operating AreaVGE = 15V, TC = 125°C

Col

lect

or C

urre

nt, I

C [A

]

Collector-Emitter Voltage, VCE [V]

0.1 1 10 100 10000.01

0.1

1

10

10050μs

100μs

1ms

DC Operation

Ic MAX (Pulsed)

Ic MAX (Continuous)

Single NonrepetitivePulse TC = 25°CCurves must be deratedlinearly with increasein temperature

Col

lect

or C

urre

nt, I

c [A

]

Collector - Emitter Voltage, VCE [V]

Figure 17. Transient Thermal Impedance of IGBT

1E-5 1E-4 1E-3 0.01 0.1 1 10

1E-3

0.01

0.1

1

10

0.1

0.5

0.2

0.05

0.02

0.01single pulse

Therm

al Response [Zthjc]

Rectangular Pulse Duration [sec]

Pdm

t1

t2

Duty factor D = t1 / t2Peak Tj = Pdm × Zthjc + TC

06 Fairchild Semiconductor Corporation 6 www.fairchildsemi.comA25N120ANTDTU Rev. C2

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Typical Performance Characteristics (Continued)

Figure 18. Forward Characteristics Figure 19. Reverse Recovery Current

0.1

1

10

50

0.0 0.4 0.8 1.2 1.6 2.0

TC = 125° )Χ

TC = 25° )Χ

TJ = 25° )Χ

TJ = 125° )Χ

Forward Voltage , VF [V]

Forw

ard

Cur

rent

, I F [A

]

5 10 15 20 250

5

10

15

20

25

30

diF/dt = 100A/μs

diF/dt = 200A/μs

Rev

erse

Rec

over

y C

urrn

et ,

I rr [A

]

Forward Current , IF [A]

Figure 20. Stored Charge Figure 21. Reverse Recovery Time

5 10 15 20 250

100

200

300

diF/dt = 100A/μs

diF/dt = 200A/μs

Rev

erse

Rec

over

y Ti

me

, trr [n

s]

Forward Current , IF [A]5 10 15 20 250

1000

2000

3000

4000

diF/dt = 100A/μs

diF/dt = 200A/μs

Sto

red

Rec

over

y C

harg

e , Q

rr [n

C]

Forward Current , IF [A]

06 Fairchild Semiconductor Corporation 7 www.fairchildsemi.comA25N120ANTDTU Rev. C2

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PT Trench IGB

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©2006 Fairchild Semiconductor Corporation 8 www.fairchildsemi.comFGA25N120ANTDTU Rev. C2

Mechanical Dimensions

Figure 22. TO3PN, 3-Lead, Plastic, EIAJ SC-65Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specif-ically the warranty therein, which covers Fairchild products.

Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:

http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TT3PN-003

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PT Trench IGB

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©2006 Fairchild Semiconductor Corporation 9 www.fairchildsemi.comFGA25N120ANTDTU Rev. C2

TRADEMARKSThe following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks.

*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.

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