active device characterization at millimeter wave frequencies conference... · agenda •...
TRANSCRIPT
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Active Device
Characterization At
Millimeter Wave
Frequencies
Suren Singh
Lead Application Engineer Millimeter and THz
Solutions
Agilent Technologies
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Agenda
• Millimeter wave and THz applications
• Measurement Solution
• Basic system architecture
• Capability Enabling Active Device Measurements
• Active Device Measurements
• SCMM Broadband Amplifier Characterization
• SCMM of 60 GHz Tx / Rx components
• IMD Spectrum measurements
• THz Power Calibration
• Materials Measurements at THz
• Q&A
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Millimeter Wave Frequency Band Applications
Millimeter Wave Component Test
• On Wafer Device Characterization
• Wireless HDMI & WiGiG ( E-Band)
• Automotive Radar Components ( E& W-Band)
Antenna
• Integrated on-wafer antenna arrays
• (Sub) mm-wave interferometer for astrophysics (Emerging)
• Atacama Large Millimeter Array (ALMA) (NRAO, ESO, IRAM)
• Deep Space Radio Telescopes
Materials and Imaging
• Free space material measurements.
• Security Imaging Systems
• Corrosion Detection
• Bio-fuel (Emerging)
HD Disc Player
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THz Frequency Applications
• Radio Astronomy • Atmospheric Studies • Chemical / Molecular Spectroscopy • Plasma and Accelerator Diagnostics • Biological Imaging • Materials Characterization • General Test and Measurement
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Agenda
• Millimeter wave and THz applications
• Measurement Solution
• Basic system architecture
• Capability Enabling Active Device Measurements
• Active Device Measurements
• SCMM Broadband Amplifier Characterization
• SCMM of 60 GHz Tx / Rx components
• IMD Spectrum measurements
• THz Power Calibration
• Materials Measurements at THz
• Q&A
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Measurement Driven Architecture
• Passive Devices
• Amplifiers
• Mixers
• Semiconductors
• Antennas
• Materials
• S-Parameters (N-port,
Differential )
• Absolute power
• Gain compression
• Pulsed measurements
• Material parameters
• Time domain
Millimeter wave
Devices
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Millimeter wave
Measurements
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Measurement Driven Architecture
• Calibration: S-Parameters & Power
• Bias Tee
• Differential Source
• Remote Modules
• Measure & level power
• Pulse drive and measure
• Measure mixers
• Measure multi-ports
• Wide dynamic range
• Measure multiple bands
• Probing
• S-Parameters (N-port,
Differential, Translated)
• Absolute power
• Gain compression
• Pulsed measurements
• Material parameters
• Time domain
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Millimeter wave
Measurements
Millimeter wave
Features
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Network Analyzer is the
measurement engine.
Optional Test Set Controller
interfaces to modules
THz Frequency Extenders
provide frequency conversion
and signal coupling
Solution Architecture
Vector Network Analyzer
Millimeter Wave Test Set controller
Frequency
Extenders
Device under test
Frequency
Extenders
Frequency
Extenders
Frequency
Extenders
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PNA / PNA-X Network Analyzer
Key Enabling Features:
• 26.5 /43.5/50/67GHz versions
• Configurable Test set options
• Rear panel RF / LO Output
• Rear panel direct IF Access
• Test set controller interface
• Frequency Offset Capability
• Dual, spectrally pure sources with low phase noise
• Integrated pulse measurements
• Source Power Calibration & Receiver power leveling
• Broadband match corrected power Calibration
N5247A 4-Port PNA-X
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Millimeter Wave Test Set Controller
• Provides LO & RF distribution to modules
• Provides DC power to modules
• 2-port (N5261A) and 4-port (N5262A) versions
• Flexible setup: measure multiple bands
• Mixer Measurements without external Sources
• Easily switch between PNA/PNA-X and mm-wave mode
PNA / PNA-X
Splitter RF Sw IF Switch Pwr
Ctl
LO Src1
Isolators
IO
RF Sw
Src2 IF x 5
Millimeter Wave Frequency Extenders
RF x 4 LO x 4 IF x 8 Pwr x 4
Four Port N5262 A Test Set Controller
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Millimeter Frequency Extenders
• Broadband Extenders: 10M-110GHz
• Banded Extenders: 50 GHz ... 1 THz WR 15 50 – 75 GHz
WR 12 60 – 90 GHz
WR 12E 54 – 92 GHz
WR 10 75 – 110 GHz
WR 6 110 – 170 GHz
WR 5 140 – 220 GHz
WR 3 220 – 325 GHz
WR 2.2 325 – 500 GHz
WR 1.5 500 – 750 GHz
WR 1.0 750 – 1.1 THz
x N RF in
LO
in
Ref
IF
Test
IF
Mwave Test
Port RF RF
LO
Banded Frequency Extenders
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• Single-sweep over 10MHz-110GHz
• 2-port & 4-port options
• Based on N5247A 67 GHz PNA
• 1.0 mm Test Port
• Key Features:
• Built in Kelvin Bias Tees
• Power leveling
• Settable Power to -50 dBm
• True differential drive
• Pulse measurements
• Mixer measurements
MHz to 110 GHz Broadband Solution
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Banded Waveguide solutions to 1.1 THz
PNA / PNA-X Banded Waveguide
Solution With Test Set Controller
Banded Waveguide solution Without
Test Controller
Banded Waveguide solution With
Proprietary Test Controller
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Agenda
• Millimeter wave and THz applications
• Measurement Solution
• Basic system architecture
• Capability Enabling Active Device Measurements
• Active Device Measurements
• SCMM Broadband Amplifier Characterization
• SCMM of 60 GHz Tx / Rx components
• IMD Spectrum measurements
• THz Power Calibration
• Materials Measurements at THz
• Q&A
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Broadband Amplifier Measurement Application
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Port 1
Measurement Requirements
Port 3
• Single Connection Measurement
• Input match
• Output match
• Amplifier gain
• Amplifier compression
• Amplifier pulsed response
• 4 Port True Differential
Port 4
Port 2
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4- Port Match corrected Source power Calibration
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Broadband Amplifier Match and Gain Results
Input Match
Output Match
Gain Characteristics
Reverse Isolation
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Broadband Amplifier Adding Power Sweep
Input Output Power Sweep Input Output Power Sweep
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Broadband Amplifier Adding Pulsed Response
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Broadband Amplifier Adding Pulsed Response
Input Match
Amp 1 Input output Pulse
Profile
Amp 2 Input output Pulse
Profile
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Broadband Amplifier Adding True Mode
Measurements
• Applies DUT/VNA mismatch-corrected true-differential or true-common-mode stimulus in forward, reverse or both directions.
• Precisely control amplitude and phase offsets.
• Make fully-error-corrected balanced measurements on balanced-input and balanced-output as well as one port single-ended and one port balanced devices.
2 1
4 3
Integrated True-mode Stimulus Application: iTMSA (Option 460)
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Broadband Amplifier Adding True Mode
Measurements
Differential Gain & Isolation Differential Input / Output Match
Single-ended Gain & Isolation Single-ended Input / Output Match
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Agenda
• Millimeter wave and THz applications
• Measurement Solution
• Basic system architecture
• Capability Enabling Active Device Measurements
• Active Device Measurements
• SCMM Broadband Amplifier Characterization
• SCMM of 60 GHz Tx / Rx components
• IMD Spectrum measurements
• THz Power Calibration
• Materials Measurements at THz
• Q&A
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SCMM of 60 GHz Tx/Rx Components
• Conversion and S-Parameters of Tx
• Spectrum of Tx output with RF applied
• Spectrum measurement of Tx output for
LO Leakage
• Tx Detector versus Output power
• Tx Detector vs. Input Power Sweep
• Rx Conversion and S-Parameters
• Rx Power Sweep of input Power
• Rx Swept LO Response
• Rx Noise Figure measurement
Agilent Confidential
Measurement Requirements
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Tx Measurement Configuration Using SMC
Agilent Confidential
Tx 60-90 GHz
Extender
RF
Tx RF Input
TST IF
REF IF
DC IN
LO
ANALOG INPUT ALI1
Tx Detector Output
Configure Tx as Up-converter
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Tx Measurement Configuration - Calibration
Using SMC Calibration allows for independent calibration of each port.
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Adding Conversion and S-Parameters of Tx
Configure for swept RF/ IF output Fixed
LO
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Adding Spectrum of Tx output with RF applied
Using IMDx
Configure for Fixed RF& IF
Configure Signal Path
Set input Output Sweep
Set input Power
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Adding Spectrum measurement of Tx output for
LO Leakage – Uses IMDx
Set full span sweep Reduce RF input to Tx
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Adding Tx Detector versus Output power -
Simulated
Set full span sweep
Use Equation Editor to simulates
Detector voltage
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Adding Tx Detector vs. Input Power Sweep -
Simulated
Fixed RF input Frequency
Set Power Sweep
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Rx Measurement Configuration Using SMC
60-90 GHz
Extender Rx
LO
Tx
RF
In
pu
t DC IN
RF
REF IF
TST IF
Rx LO Input
Agilent Confidential
Configure Rx as Down-converter
Set Power Levels
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Rx Measurement Configuration - Calibration
Using SMC Calibration allows for independent calibration of each port.
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Adding Rx Conversion and S-Parameters
Configure Frequency for broadband
sweep
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Adding Rx Power Sweep of Input Power
Configure Fixed Frequency
Configure RF Power Sweep
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Adding Rx Swept LO Response
Configure LO Power Sweep
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Summary SCMM of 60 GHz Tx / Rx components
Agilent Confidential
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Agenda
• Millimeter wave and THz applications
• Measurement Solution
• Basic system architecture
• Capability Enabling Active Device Measurements
• Active Device Measurements
• SCMM Broadband Amplifier Characterization
• SCMM of 60 GHz Tx / Rx components
• IMD Spectrum measurements
• THz Power Calibration
• Materials Measurements at THz
• Q&A
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Measurement Setup
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Confidential
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IM Spectrum: Measurement
• Measurement Setup
• Assign Measurement class
• Set Path configuration to Thru path
• Setup the port power to correct
• Stimulus
• Set start and stop frequency
• Measure
• Input and output Spectrum
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Input Spectrum
Input Spectrum
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Agenda
• Millimeter wave and THz applications
• Measurement Solution
• Basic system architecture
• Capability Enabling Active Device Measurements
• Active Device Measurements
• SCMM Broadband Amplifier Characterization
• SCMM of 60 GHz Tx / Rx components
• IMD Spectrum measurements
• THz Power Calibration
• Materials Measurements at THz
• Q&A
Page 41
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THz Power Calibration
WR1.5 System Configuration
LO
TEST IF
500 – 750 GHz WR-1.5
DC
REF IF
Power
Supply Calorimeter
Module
0-10 Volt Output
Per Power Range
Analogue Input (Al1)
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Sweep Setting – PM-4 200 µWatt Range
PM4 Port Power Characterization
1. Measurement of power with the PM4 at these frequencies are very sensitive and require at
least a 20 second settling time for a valid measurement
2. Configure the system to sweep the frequency range of interest as well as the number of points
3. In this example we use 500 GHz - 750 GHz with 201 point characterization, while it is not
required for the source calibration it provides the full characterization
4. Turn off RF to the Frequency extender zero and calibrate the Calorimeter
5. Turn on the RF and save the measurement results as a file.
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PM4 Port Power Characterization
• Note Trace 3 above is created by using the equation editor to convert the analog input Al1,1 into a
power reading of dBm.
• In this example we do this by taking the displaying the (sqrt (Tr2/50)), in which 50 is the 10V to 200
uWatt range
• Save Trace 3 above into a file and add the RF power setting used, in this example we used +3 dBm
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Verification of calibration
Measurement of port 2 source power as shown by the PNA-X receiver R2,2 in
comparison to the actual measured PM4 power at port 2.
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Agenda
• Millimeter wave and THz applications
• Measurement Solution
• Basic system architecture
• Capability Enabling Active Device Measurements
• Active Device Measurements
• SCMM Broadband Amplifier Characterization
• SCMM of 60 GHz Tx / Rx components
• IMD Spectrum measurements
• THz Power Calibration
• Materials Measurements at THz
• Q&A
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THz Materials Measurement Solution
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Calibration is Required
Before a measurement can be made, a calibration
must be performed to remove systematic errors.
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THz Materials Measurements e’ Real Part
Permittivity
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THz Materials Measurements e’/e’’ Tan Delta
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Agenda
• Millimeter wave and THz applications
• Measurement Solution
• Basic system architecture
• Capability Enabling Active Device Measurements
• Active Device Measurements
• SCMM Broadband Amplifier Characterization
• SCMM of 60 GHz Tx / Rx components
• IMD Spectrum measurements
• THz Power Calibration
• Materials Measurements at THz
• Q&A
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Thank You
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