chris frost presentation (may 27th 2014)

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How Alien Invaders Can Change Governments Christopher Frost ISIS Facility

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Page 1: Chris Frost Presentation (may 27th 2014)

How  Alien  Invaders  Can  Change  Governments  

Christopher  Frost  ISIS  Facility  

Page 2: Chris Frost Presentation (may 27th 2014)
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0 0 0 0 0 1 0 0 0 1 1 0 0 1 1 0 1

Schaerbeek,  Belgium:  May  18th  2003,  22:30  

4096

“worried  about  the  influence  of  MarJans  on  these  elecJons….  unless  the  cosmic  rays  affect  our  lists  in  a  posiJve  way!”  

4096  (212)  votes  added  to  an  electronic  voJng  machine  

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SUN  Microsystems  -­‐  2000  n  Flagship  Enterprise  systems  had  problem  in  

‘cache’  memory    

Cisco  Systems  -­‐  2003  n  High  end  12000  series  router  line  cards  suffered  

failures  

Cypress  Semiconductor  CorporaJon  -­‐  2001  n  $1bn  factory  ground  to  halt  every  month  due  to  

single  bit-­‐flip  in  network  

 Sources: Daniel Lyons “Sun Screen”, Forbes magazine Nov 2000: Cisco 12000 Single Event Upset Failures Overview and Work Around; www.cisoc.com: James F. Ziegler and Helmut Pucher, SER-History, Trends and Challenges, Cypress 2004

Images courtesy of Shutterstock and Cisco Systems

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Incident  Primary  Cosmic  Ray  Atmospheric Neutrons at

‘Ground Level’

 Neutrons    disrupt  electronic  devices  

Cosmic  Ray  neutrons  are  a  major  problem  

Incident  Primary  Cosmic  Ray  

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+ +

+ +

+ + -

-

- -

- -

Source Drain

Gate

Neutron collides with silicon atom causing ejection of heavy ion

Trail of ionisation and current pulse

High energy neutron

A  Single  Event  Effect  (SEE)  is  when  a  highly  energeJc  parJcle  present  in  the  environment,  strikes  sensiJve  regions  of  an  electronic  device  

disrupJng  its  correct  operaJon  

Page 7: Chris Frost Presentation (may 27th 2014)

Recoverable Error Non-Recoverable Error

Diagram Courtesy: Xilinx

A  Single  Event  Effect  (SEE)  is  when  a  highly  energeJc  parJcle  present  in  the  environment,  strikes  sensiJve  regions  of  an  electronic  device  

disrupJng  its  correct  operaJon  

Source: MBDA

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Reproduced from J.F.Ziegler et al IBM. J. Res. Develop. 40, 1996, p23

Incident  Primary  Cosmic  Ray  

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~  once  a  minute  

E Normand and TJ Baker IEEE Trans Nucl Sci 40, 1484, (1993)

Neutron  RadiaJon  from  Cosmic  Rays     Incident  Primary  Cosmic  Ray  

Page 10: Chris Frost Presentation (may 27th 2014)

E Normand and TJ Baker IEEE Trans Nucl Sci 40, 1484, (1993)

Neutron  RadiaJon  from  Cosmic  Rays     Incident  Primary  Cosmic  Ray  

~  300  a  minute  More  neutrons  at  35,000  feet  

Page 11: Chris Frost Presentation (may 27th 2014)

Incident  Primary  Cosmic  Ray  

~  300  a  minute  

E Normand and TJ Baker IEEE Trans Nucl Sci 40, 1484, (1993)

Neutron  RadiaJon  from  Cosmic  Rays    

More  neutrons  at  35,000  feet  

The  dominant  reliability  issue  in  aircrab  avionics    

Becoming  a  dominant  reliability  issue  in  all  advanced  electronics  

 

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 7th  October  2008    at  04:40:26    

Flight    Qantus    QF72  –  Singapore  to  Perth  

‘Real-­‐world  Incident’  

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ATSB TRANSPORT SAFETY REPORT Aviation Occurrence Investigation AO-2008-070 Final

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Blackpool  Rollercoaster  has  a  213  b  drop  

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“We  conclude  that  a  significant  SEU  phenomenon  exists  at  airplane  al9tude,  that  it  is  most  likely  due  to  energe9c  neutrons  created  by  cosmic  ray  interac9ons”  

     Norman  and  Taber  1993        

 

   

 

Sources: Single Upsets in Avionics, Normal and Taber, IEEE Trans. Nuc. Sci. Vol 40, April 1993, p120

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ATSB TRANSPORT SAFETY REPORT Aviation Occurrence Investigation AO-2008-070 Final

.....but  the  invesJgaJon  idenJfied  SEE  as  an  ongoing  risk  for  airborne  equipment.”  

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“It   idenJfied   a   number   of   specific  lessons   for   the   manufacturers   of   new,  complex,  safety-­‐criJcal  systems...”  

The  Chief  Commissioner  of  the  ATSB,  Mr  MarJn  Dolan  Media  Report  19  December  2011  

ATSB TRANSPORT SAFETY REPORT Aviation Occurrence Investigation AO-2008-070 Final

Page 18: Chris Frost Presentation (may 27th 2014)

ATSB TRANSPORT SAFETY REPORT Aviation Occurrence Investigation AO-2008-070 Final

There   were   significant   logisJcal   difficulJes   in  obtaining   access   to   appropriate   test   faciliJes  and  developing  test  sobware  and  procedures.....  

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“For   example   an   autopilot   system   was   found   to  upset  on  average  every  200  flight  hours…  if  a  major  GLE   had   occurred   before   this   problem   was  eventually  fixed  such  an  upset  could  have  occurred  every  hour  making  safe  flight  very  difficult.”  

UK Parliament - Commons Select Committee: Science and Technology Inquiry in Scientific Advice and Evidence in Emergencies: (iii) Solar Storms Report HC 498

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FuncJonality          

Scale          

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MarJn  Cooper  Invented  mobile  phone  and  made  the  

first  call  in  1973  

FuncJonality          

Scale          

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Reproduced from data in ITRS Roadmap 2011

FuncJonality          

Scale          

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The  Intel  Edison  board  features  a  low-­‐power  22nm  400MHz  Intel®  Quark  processor  with  two  cores,  integrated  Wi-­‐Fi  and  Bluetooth  

Source Intel

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Kilobyte 1,000 bytes

Megabyte 1,000,000 bytes

Gigabyte 1,000,000,000 bytes

Terabyte 1,000,000,000,000 bytes

Petabyte 1,000,000,000,000,000 bytes

Exabyte 1,000,000,000,000,000,000 bytes

Zettabyte 1,000,000,000,000,000,000,000 bytes

Capacity of 3.5” Disk

Capacity of DVD

Capacity of human being’s functional memory

Amount of digitally stored information in the world

(2010)

Source: Cisco

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Date from IRPS11: The Impact of New Technology on Soft Error Rates Anand Dixit and Alan Wood Oracle Corporation Santa Clara, CA USA

FuncJonality          

Scale          

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Date from IRPS11: The Impact of New Technology on Soft Error Rates Anand Dixit and Alan Wood Oracle Corporation Santa Clara, CA USA

FuncJonality          

Scale          

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Data reproduced from R C Baumann, Neutron and Alpha Particle Effects in Electronics, RADECS 2012

FuncJonality          

Scale          

Page 30: Chris Frost Presentation (may 27th 2014)

Data reproduced from R C Baumann, Neutron and Alpha Particle Effects in Electronics, RADECS 2012

CriJcal  

High    

Consum

er  

Reliability  

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High  Power  Diodes  and  Transistors      §  Higher  than  expected  failure  when  introduced  into  electronic  systems  in  the  1990’s  

§  IEC  guidance  is  that  avionics  requires    voltage  de-­‐raJng  by  50%    

IEC/TS 62396 part 4: Guidelines for designing with high voltage aircraft electronics and potential single event effects

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.. an autopilot system was found to upset on average every 200 flight hours

Consumer  

Commercial  

CriJcal  

PredicJng  the  Consequences  

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NVIDIA    Graphics  Processor  Technology    

Images NVIDIA

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NVIDIA    Graphics  Processor  Technology  employed  in  pedestrian  detecJon    High  reliability  requirement      

Images from Volvo and NVIDIA

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Images from Volvo and NVIDIA

Work  at  ISIS  reported  at  RADECS  2013  (Oxford)    The  control  circuitry  (scheduler)  on  a  GPU  can  be  corrupted  by  radiaJon,  with  severe  repercussions  on  its  reliability      

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High Energy Protons

Rutherford Appleton Laboratory

ISIS Spallation Neutron Source n  800MeV n  High Flux Source

Pulsed  Neutron  Field  Broad  Energy  (>Reactors)  

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High Energy Protons

ISIS Second Target Station

Mimic Cosmic Ray Spectrum

1  hour  at  ISIS  =  100’s  years  in  real  environment  

100-­‐1000  million  Jmes  more  intense  

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ISIS Second Target Station: ChipIr

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ISIS Second Target Station: ChipIr

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ISIS Second Target Station: ChipIr

n  Funded by UK’s Large Facilities Capital Fund

n  Strong links to UK and European communities n  UK-Italian CNR-ISIS agreement n  UK’s SPASERANE Project n  UK’s SEEDER Consortium

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ISIS Second Target Station: ChipIr

Opportunity for State-of-the-Art Instrument

n  Optimise flux and spectrum n  Build on 25 year experience of neutron ‘user facilities’ n  Bespoke design n  Unique capabilities

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Flood Beam

n  500mm to 1000mm beam n  >104 n/cm2/s (above 10MeV) n  Systems testing

Collimated Beam n  1mm to 250mm beam n  >106 n/cm2/s (above 10MeV) n  Board and device testing

ISIS Second Target Station: ChipIr

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The  CNR  InsJtutes  where  diamond  detectors  are  made.    

Italian Expertise: Fast Neutron Detectors - Diamond

CVD  Diamond  detector  is  a  compact  and  versaJle  soluJon  for  nuclear  radiaJon  spectroscopy.  Diamond  radiaJon  hardness,  high  radiaJon  sensiJvity,  low  dark  current  and  high  thermal  conducJvity  allow    accurate  Jme  of  flight  measurements  

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Italian Expertise: Fast Neutron Detectors - GEM

Thin  Kapton  insulaJng  foil  copper-­‐clad  on  both  sides  and  perforated  by  a  high  density,  regular  

matrix  of  holes      

Charge  amplificaJon  structure.  

Page 46: Chris Frost Presentation (may 27th 2014)

Aviation Nuclear Industry

Automotive

Medical

Internet Infrastructure

“ISIS  is  one  of  few  facili/es  in  the  world  capable  of  producing  enough  very  high  energy  neutrons  to  perform  accelerated  tes/ng.”    Andrew  Chugg,  UK  SEEDER  consor=um  

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Making  ISIS  a  centre  for  neutron  radia=on  

tes=ng  and  solu=ons  

Aviation Nuclear Industry

Automotive

Medical

Internet Infrastructure

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“Chipir  will  be  the  world’s  best  facility  for  screening  microchips  with  neutrons,  leading  to  safer,  more  reliable  electronic  systems  and  encouraging  leading  scienJsts  and  manufacturers  to  do  their  research  in  the  UK.”    David  Willeus  MP  Minister  of  State  for  UniversiJes  and  Science  March  14th  2011  

 

Fast  Neutrons  Research  at  ISIS:  Stakeholders  

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“ConJnuing  UK  investments  in  ISIS,  such  as  a  new  instrument  to  help  companies  test  microelectronics,  will  enable  it  to  be  at  the  forefront  of  academic  and  industrial  research  for  many  years  to  come.”    The  Right  Honourable  Vince  Cable  MP  Secretary  of  State  for  Business,  InnovaJon  and  Skills  13  August  2013  

 

Fast  Neutrons  Research  at  ISIS:  Stakeholders  

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“We  have  an  excellent  track  record  of  nearly  30  years  close  collaboraJon  with  Italy…..  I’m  delighted  that  the  signing  of  this  agreement  provides  a  framework  for  conJnued  success  and  the  expansion  of  the  partnership  into  new  and  exciJng  areas.”  

Robert  McGreevy,  ISIS  Director  5th  March  2014  

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“There  are  also  efforts  to  improve  radiaJon  tesJng;  for  example,  a  facility  to  simulate  effects  of  neutrons  on  aircrab  systems  has  recently  been  developed  as  part  of  the  ISIS  facility  for  neutron  

science  at  the  STFC  Rutherford  Appleton  Laboratory”  

-­‐  RAL  Space  and  Lloyds  of  London  

 

Fast  Neutrons  Research  at  ISIS:  Stakeholders  

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“This  situaJon  should  improve  in  the  next  two  year  s  with  the  opening  of  a  dedicated  beamline  (ChipIR)  …..  The  ChipIR  

wide  beam  facility  will  enable  complete  powered  and  monitored  equipment  and  systems  to  be  irradiated  at  radiaJon  levels  equivalent  or  greater  than  a  Carrington  

event  to  verify  equipment  SEE  tolerance.”  

-­‐  Royal  Academy  of  Engineering  

 

Fast  Neutrons  Research  at  ISIS:  Stakeholders  

Page 54: Chris Frost Presentation (may 27th 2014)

“The  micro-­‐electronics  industry  is  on  the  verge  of  architectural  shib  as  devices  get  to  below  20  nm.  It  was  predicted  in  1979  that  there  will  be  a  watershed  moment  when  such  devices  become  suscepJble  to  muon  ionisaJon,  and  we  believe  current  technologies  are  approaching  this  threshold.”  

-­‐  Prof.  Bhuva  from  Vanderbilt  University  

Dr Nelson Tam of Marvell Semiconductor Muons– First seen in cosmic rays

 

Fast  Neutrons  Research  at  ISIS:  Stakeholders