AD-E401 069

TECHNICAL REPORT ARLCD-TR-83040

• SIMPLIFIED THERMAL TRANSIENT TEST FORELECTRO EXPLOSIVE DEVICES

YONG WON KWONWALLACE E. VORECK

SEPTEMBER 1983

"U.S. ARMY ARMAMENT RESEARCh AND DEVELOPMENT CENTERV LARGE CAUSBER WEAPON SYSTEMS LABORATORY

*d APPROVED FOR PUBLIC RELEASE; DISTRIBUTION UNLIMITED.:-:. DT•CG

r E CTE

"�• SEP 0 9 1983 :

-8 0

. FIX O't83 09 09 004

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The views, opinions, and/or findings contained inthis report are those of the author(s) and shouldnot be construed as an official Department of theArmy position, policy.or decision, unless so desig-nated by other documentation.

Destroy this report when no longer needed. Donot return to the originator.

q.o

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UNCLASSIFIEDSECURITY CLASSIFICATION OF THIS PAGE (When Date Entered)

REPORT DOCUMENTATION PAGE BEFREAD CNSTRUCTIONSFORE COMPLETING FORIMI . REPORT NUMBER 2. GOVT ACCESSION No. 3. RE'CIPIENT'S C'A'TALOG NUMBER ''

Technical Report ARLCD-TR-83040 A&A•'as/•- ti o4. TIlTLE (and Subtitle) 5 . TYPE OF REPORT & PERIOD COVERED

SIMPLIFIED THERMAL TRANSIENT TEST FORELECTRO EXPLOSIVE DEVICES Final

6. PERFORMING ORG. REPORT NUMBER

7. AUTHOR(e) 8. CONTRACT OR GRANT NUMBER(*)

Yong Won Kwon and Wallace E. Voreck

9. PERFORMING ORGANIZATION NAMF A~n ADDRESS 10. PROGRAM ELEMENT, PROJECT. TASKAREA & WORK UNIT NUMBERS

ARDC, LCWSLEnergetic Materials Div [DRSMC-LCE(D)] AMCCMS 691000H180021Dover, NJ 07801 8047-01-001 (GF4)

'I. CONTROLLING OFFICE NAME AND ADDRESS 12. REPORT DATE

ARDC, TSD September 1983STINFO Div [DRSMC-TSS(D)J 13. NUMBER OF PAGESDover, NJ 07801 30

14. MONITORING AGENCY NAME & ADDRESS(If diffoent from Controlling Office) 15. SECURITY CLASS. (of this report)

Unclassified

1aS. DECLASSI FICATION/DOWN GRADIN GSCHEDULE

16. DISTRIBUTION STATEMENT (of this Report)

Approved for public release; distribution unlimited.

17. DISTRIBUTION STATEMENT (of the abstract entered In Block 20, It ditferent from Report)

IS. SUPPLEMENTARY NOTES

19. KEY WORDS (Continue on reverse aids If necessary and Identify by block number)Thermal transient EEDRosenthal

BridgewireTesting

Detonator20. ABSTRACT ( a eere shk N necowesme y Identlfy by block number)

A simplified thermal transient test system for bridgewire- initiatedelectro explosive devices is described. The method used is that developed byRosenthal. An automated data recording system and computer analysis of resultsare included.

FOOMDD IJAN 1473 llo OF I NOV SS IS OBSOLETE UNCLASSIFIED

SECURITY CLASSIFICATION' OF THISPAGE (When Data Entered)

• :•-'..' ,,, '- . , 4% ,, 4- ."4 ,' - ,- - ." - - -,• '.- .- .. '-. . -, - -, - ., -, . .-- . • .- - . . .- . . -.- . . - . .'

-'. .. . .. .. . ....... - . * . - .. . .. -- - - - . . .• - - • • . .. 1L• • • •

"I

ACKNOWLEDGMENT.1i

Mr. Yong Won Kwon spent from October 1981 through August 1982 at theUnited States Army Armament Research and Development Command (ARRADCOM) as partof the Army Exchange Scientist Program with the Republic of Korea. The simpli--fied thermal transient tester was designed and built by Dr. L. Rosenthal, whileworking as an Army Research Office Consultant at ARRADCOM.

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Accession For

NTIS GRA&IDTIC TABUnannounced 0Justification

By - .

Distribution/

Availability CodesjAvail and/or

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CONTENTS

Page

Introduction I

Theoretical Background I

Simplified Test System 3

Data Analysis 4

Conclusions 5

References 7

Appendixes

NA - Typical Results on MKL Squibs 15B - BASIC Program for Thermal Transient Test 23

Distribution List 27

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tiii

::• • .. •` a •• `••; .•-•.-. `•` `•.` • • ` • ` • • ```• -. - . -.. •.. . .-. . - -. •]:i] .."

FIGURES

Page

1 Thermal response curve 9

2 Block diagram of thermal transient test instrumentation 10

3 Simplified thermal transient test circuit 11

4 Typical thermal transient test circuit 12

5 Typical types of wave forms 13

6 Cursor points on oscilloscope trace to calculate results 14

iv

INTRODUCTION

The Rosenthal thermal transient test for bridgewire-type electro explosivedevices (EED) is used for nondestructive testing of the interface between the

wire and the explosive (ref 1).

The thermal transient test is based on the application of a current toheat the bridgewire, and then monitoring the change in resistance of the wireas it heats to determine its temperature response. For this reason, onlybridgewires with a measurable thermal coefficient of resistance can be tested.This work describes a simplified testing system and an improved method of dataanalysis.

THEORETICAL BACKGROUND

According to Rosenthal's differential equation for bridgewire temperaturerise as a limped thermal system (ref 1), bridgewire heat balance is:

C, dC + y• = p(t) I R(1+0) (1)

where

C = heat capacity, watt-second/degreep

= temperature increase, 0C

t = time, secondy = heat loss factor (linear thermal conductance term), watt/degreep = power input, wattsI = excitation current, ampsRo = initial resistance, ohmsa temperature coefficient of resistivity of bridgewire

The solution for equation 1 is:

I Ro[I-exp (0 C

tP (2)

2where yy-IR a0

The voltage drop v(t) across the bridgewire is:

v(t) = IR(t) (3)

where R(t) = Ro[l + a4(t)I.

1i

-e - -. - . - -.. .- . -

By combining equations 2 and 3, the result is:

a2R

v(t) = IR{1 + [--exp -)M}. (4)

The bridgewire thermal response from equation 4 is represented in figure 1.

The apparent time constant is defined as

• (5) "

This time constant is derived from the current wave form, which is intrinsic toan exponential rise in the bridgewire thermal response. From the above equa- :1tions and figure 1, useful thermal parameters, which can define thermal

behavior of the bridgewire-explosive interface, are derived as follows (refs 2 -through 9). 'i

Temperature rise (•) is computed from

.4

-AV (6)

o

Thermal conductance (y'), modified heat loss factor due to feedback, from

I3 R 20o, watts/ohm change . (7)

Heat capacity of the system (Cp) is

aI 3R 20 dV

C R= - ,where S=- . (8)p S dt

Thermal time constant, (W) from

Ct -2- = time to 0.63 (Vmax), seconds (9)

0.69 y'

where t' = time to half voltage, second.

2.2

-4

SIMPLIFIED TEST SYSTEM"I!

A simplified thermal transient tester was developed which can be used to

control initial current and null out initial resistance of EED. Additional

inbtrumentation included a square wave generator, a digital voltmeter, and two

oscilloscopes. One was used to monitor the wave form and the other for

recording a digitized wave form. A HP85 desktop computer was used to calculateresults fru.,i the digital recording and plot data output. The system block dia-gram is st.,wn in figure 2.

The thermal transient test circuit, which is the heart of the test 'ystem,

can be easily and economically made, as compared to commercial instrumentation(for example, the Model 605B thermal transient test set, made by Pasedena Sci-

entific Industries). On the other hand, the simplified circuit is slower and

requires a skilled operator. Results obtained are the same as those for themore complicated automatic system. Either system is helpful in understandingthermal behavior of bridgewire-explosive interfaces.

The simplified circuit diagram (fig. 3) is basically the same as the

standard circuit shown in figure 4. Resistance (R ) and capacitance (C 2 ) are

eliminated and a separate square wave generator is used. By changing thegrounding location, use of a differential amplifier was avoided.

Because it does not have R and C in figure 4, the simplified circuitproduces the various types of floating exponential thermal wave forms shown infigure 5. The operator must adjust zero axis and exponential wave forms to setR properly. The exponential wave form can be dropped below the zero axis

[fig. 5 (B)] by increasing RI and above the zero axis by decreasing R,, [fig. 5

(A)]. When the values of R and R0 (EED net resistance) are equal, the

exponential wave form starts Irom zero axis [fig. 5 (C)]. The net positiveexponential wave form is proportional to the value of AR/Ro for the electroexplosive device and represents the increasing bridgewire temperature. The

peak value can be easily found by adjusting the wave form to that shown infigure 5 (D). The following operational steps are used:

1. The electro explosive device is mounted in a shielded test chamber and

electr'nically connected to the shorted test leads.

2. The square wave generator is turned on and set at 10 cps.

3. The test current is adjusted by using the by-pass button and current

control knob. It should be noted that 200 mA for high sensitivity EED cannotbe used.

4. The exponential wave form is displayed on both oscilloscope screens.Again, it should be noted that the amplitude of the Nicolet digital oscillo-

scope is 50 times that of the Tektronix 1904 oscilloscope, since its input is

taken from the output of the 7A13 amplifier in the Tektronix 7904.

3

5. Read hot resistance, equal to (RI) when the wave form corresponds tofigure 5 (D).

6. Reset both oscilloscopes wave forms back to that shown in figure 5(C).

7. Read offset, zero time, and volts needed to enter data into computer

8. Read the voltage and time when the cursor on the oscillosope is placedon C of the wave-form (fig. 6) to calculate Vmax and stop time, and enter datainto computer.

9. Steps 7 and 8 are used for thermal time constant, Av calculations, andfor plotting wave forms. A typical data output is shown in appeadix A.

The original wave form was recorded on a Nicolet Explorer III oscilloscopeand stored on mini floppy disc. Calculations were made on a HP35 calculator.All calculated data were plotted by a HP 7215k plotter.

DAMT ANALYSIS

The data analysis is programmed in BASIC. This program provides calcula-tions of equations 6 through 9, plotting of a smoothed thermal exponential waveform, calculation of T, and print out by paper or plotter. Basically, thereare seven steps in the program.

Step 1. Read input data, which is needed for calculations using the cur-sor on the oscilloscope - to, Vo, I, a), Ri, Ro. Instructions are included inthe program.

Step 2. Input data for plotter - X1, X2, X3, Y1, Y2, Y3.

Step 3. Input digital data which is recorded on floppy disc as a functionof volts and time (V,t), smooth data, and plot at the same time.

Step 4. Calculate shape of the thermal exponential wave form to define Sin equation 8 by moving average method.

Step 5. Calculate Vmax of the thermal exponential wave form to defineequations 6 and 7 by mean value determination.

Step 6. Determine thermal time constant by time interpolatec for 0.63% ofVmax to define equation 9.

Step 7. Print out all results. Plot of % Vmax versus time, Vmax, I, R0 ,

a, T, slope, *, X. and Cp.

A listing of the HP85 BASIC program is given in appendix B. Sample re-suits for two MKI squib headers (table A-i) having a I mil nichrome bridgewire,before and after loading with borax at 10,000 psi, are shown in appendix A.

"4

CONCLUSIONS

A simplified thermal transient testing system has been developed and

demonstrated for use in measuring the thermal coupling between the bridgewire

and the explosive surrounding it in EED. It can be easily used to measure

thermal properties and control the quality of loaded EED nondestructively.

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. - .

REFERENCES

1. L.A. Rosenthal, "Electro-Thermal Equations for Electro Explosive Devices,"NAVORD Report 6684, AD 230917, August 1959.

2. L.A. Rosenthal and V.J. Menichelli, "Nondestructive Testing of InsensitiveElectro Explosive Devices by Transient Techniques," Materials Evaluation,vol 30, no. 1, pp 13-19, 1975.

3. C.T. Davy, J.F. Heffron, and L.V. Meyers, "Electro Thermal Analytical Re-sponse Inspection of Electro Explosive Devices," Contractor Report ARPAD-CR-82001, ARRADCOM, Dover, NJ, March 1982.

4. NASA Technical Briefing, "Simple Nondestructive 'rests for Electro ExplosiveDevices," pp B72-10315, June 1972.

5. A.C. Strasburg, "Data Acquisition System for Transient Pulse Testing," SAND75-0500, Sandia Labs, Albuquerque, NM, November 1975.

6. L.A. Rosenthal and V.J. Menichelli, "Nondestructive Testing of InsensitiveElectro Explosive Devices by Transient Techniques," Technical Report 32-1492, Jet Propulsion Laboratory, Pasadena, CA, July 1970.

7. V.J. Menichelli and L.A. Rosenthal, "Interrelationship of NondestructiveTesting to Fault Determination," Proceedings of the Seventh Symposium onExplosives and Pyrotechnics, Franklin Institute, Philadelphia, PA, 1971.

8. V.J. Menichelli and L.A. Rosenthal, "Fault Determination in Electro Explo-sive Devices by Nondestructive Techniques," Technical Report 32-1553, JetPropulsion Laboratory, Pasadena, CA, July 1972.

9. L.A. Rosenthal, "Thermal Response of Bridgewires Used in Electro Explosive

Devices," Rev Sci Instr, vol 32, pp 1033-1036, September 1961.

%.

41

7

.4h

/Slope a 1Ro Vmax aCp

Lk" /

"Vmax . - . . . ... . .

O.63Vmax /'I0.5Vmax -. * IAR:•.--.-

/: ,

tao6 ,4

0

IRo IRO + 13 Ro2

I

"LC ,TimeI :

't* I

Figure 1. Thermal response curve

9

.........................*-.-* 4.-.',.4**

L~ * - - - 4. . . . . . . .. - -... a..a

t.4

-§Square WaveGenerator

HP 211A

JJDigital Thermal Transient ODigitalVolt Tester Tektrlonix o a Recording

Meter(See Figure 3) 70 Nicolet~xlrrSils°el

Compu terHP 85

Plotter

HP 7215A :

Figure 2. Block diagram of thermal transient test instrumentation

10

4

Ro EED 10K

RI

+ 12V

4-.,

-. 1100 SI85K

5K

a I

Wet eMecury T urn

LiEDly To current measurement To wave form

(Pte rufedRecording Oscilloscope(JML 240-81)

To square wave"generator

"Figure 3. Simplified thermal transient test circuit

.~,1

4 -

1K I 500K

Mercury

R

Relay

Square

.

,I~i~ Wavef L Gen.

0-100KR 1

+ 7V • 1-10 mf

SEED q0-10KR2i2

Figure 4. Typical thermal transient test circuit

12

N'

v +v

A)B) F

A)A

C) D)

0

Figure 5. Typical types of wave forms

13

- - --- - --- -- - - -- - -- - - -

MAXIMUM VOLTSE-4J

ITIME

Figure 6. Cursor points on oscilloscope trace to calculate results

14

MAXIMU VOLT

APPENDIX AI

TYPICAL RESULTS ON MKI SQUIBS

-- 9

-15

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w `40 c -4 C'-4 t-. .z

e-4 (1

101

01 -1 a% 0'Cu4 -4 >-1 -4 0ý C

-4.C) c

41~ 00ji 1')> D0 C 4* %0-

ca- -.4

o- c0

CC) %0 00-O

to -. to - 00 04 a'T

Si "A E4 ** .4 C jDC: 0; 0 0 0)Ai . 0 C)

r. to 0'C0r-4.- 41 41cJ -4C

44 0 0 0 oo WC.4. 4-j

0 co 4Cu~~r CuHi ILn4- ~ 0*.

-4 0v~s,-4 ~ 3 0 1 0

0 Cu tj

AJ A- W4-i99c 0E 4-H0j

04 b 4..4 0E-4~~~L 0.w j o 0 4.

0 tn 0CJi 414-i0r

0 41 41X0 co b U Cu

$4 00 1 41 5.4m

m4 " )-41

40 4.10 0 00m8-

0- 09 *9S

174.0WC

k49 -

22

'.i

l'K aillim p

TEST #1, PEAK VOLTAGE 8.16 millivolts

Figure A-1. Test number 1 on MKI squibs, unloaded

18

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r

"4.

360

2 -

. '.,

/

"., U5 1 2 3 4 5 1 7 B 9 .I

4., TEST #2, PEAK VOLTAGE 4.40 millivolt s

' 4q

Figure A-2. Test number 2 on MKl squibs, loaded with borax

19

, • .

..

75

B 1 2 3 4 5 6 8 91

TEST #3, PEAK VOLTAGE 2.62 mniJiivoIl.e

rigure A-3. Test number 3 on MKI. squibs, unloaded

20

9082 -

-21

4~ -

.S., _ . I I I _._ . I, . I _ I I . I_ I. I . i ] t I I

0.. 1 2 3 4 5 8 7 8 g I10S'TIlE ailliuso

•'• TEST #4, PEAK VOLTAGE =1.664 miliivol1=•

,',• Figure A-4. Test number 4 on MKI squibs, loaded with borax

,1 21

*,

•t" "-

-- -.------- . - .. **. -- ** -.- - *�*. *. * . - - -

V A'1-4

N A I:4

APPENDIX B j.3

4*1 BASIC PROGRAM FOR THERMAL TRANSiENT TEST ].4

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Li

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A23

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-i.........................................................................................................................--A. - . -

SLCaAW�J..-aMt...�. t&.A.� �W �

-- - - -- - ---------------------

I, ,, ,, • ,- • w -,• ; ; • , •. : • ,. ,7, • , , . . • : -, --•-° - • . . -r- ,c.- •--•

10 REM CODE "K3WIPE" 570 C' IZE 3, .3520 DISP "ENTER SAMPLE ID" 588 Lfi8EL USING "K" S$30 INPUT I$ 598 AXES X3/2,Y3.X1,YI40 PRINT ".si I600 CS!ZE 3, .3550 PRINT 610 FCU' X=X1 TO X2 STEP X360 PLOTTER IS 705 620 MOVE X,Yj70 LOCATE 30,110,20,.0 630 SE-GIJ80 DIM X$E(80,Y$E80JTsE8OJ,ssr 650 SETUU180]650 SETUU90 ISP 660 LABLIL USING "K" ; X

900 DISP X100 DISP "ENTER START OF X AXIS" 670 NEXt X110 INPUT Cl 680 MOVE X1+(X2-XI¾/2:Y1120 DISP 698 SETGJ130 DISP 700 IPLOT 0-G,--2140 DISP "ENTER END OF X AXIS" 710 LORG U 4150 INPUT C2 720 LABEL USING "K" ; X$"160 DISP 730 SETUU170 DISP 740 LORG 8180 DISP "ENTER TIC MARKS FOR X 750 FOR Y=Y1 TO Y2 STEP 2tY3

AXIS" 760 MOVE XYl,198 INPUT C3 770 LABEL USING "K" ; Y.;" "200 DISP 780 NEXT Y210 DISP 790 MOVE X1Y1+(Y2-Y1)z-2,220 DISP "ENTER START OF Y AXIS" 800 SETGU230 INPUT C4 810 IPLOTU-60-2240820 SETUUDISP 830 DEG250 DISP84LOR9260 DISP "ENTER END OF Y AXIS" 850 LDIR 96270 INPUT C5 850 LORG 6280 DISP 860 LABEL USING "K" Y$290 DISP 870 LDIR 0" 38 S "880 DISP "ENTER OFFSET VOLTAGE (-. •300 DISP "ENTER TIC MARKS FOR Y

SAXIS" millivolt)"310 INPUT CE 890 INPUT G320 X1=C1 900 DISP " ZERO TIME OFFSET (mil330 X2=C2 lisec)"340 X3=C3 910 INPUT 0350 Y1=C4 920 DISP " ENTER MAX VOLTS IN rni360 Y2=C. iilivolts"370 Y3=CG 930 DISP "UNCORRECTED VALUE"380 SCALE XI,X2,Y1,Y2 940 INPUT MI390 T$="TEST #3, PEAK VOLTAGE = 950 01SF "ENTER CURRENT (amperes

2.62 millivolts" 960 INPUT 10400 S$=""410 X$="TIME, millisec" 970 DISP "ENTER COLD RESISTANCE"420 Y$=TERCENT OF PEAK VOLTAGE"98 IUT R990 DI P " ENTER TEMP. COEFF. OF430 FRAME RSTACRES ISTANCE"440 FRAME 1800 INPUT Ri450 FRAME 1010 A1=0t40+1460 MOVE XI+(X2-XI)/2,Y2 1020 AO=A1470 SETGU 1030 A2=AI+101480 IPLOT 0,-70,-2 1040 A3=1490 SETUU 1050 A5=4500 LORG 6 1066 DIM B$E280J,A$(82003510 CSIZE 4,.5 1070 OUTPUT '02 ;"NO"520 LABEL USING "K" ; T$ 1080 IOBUTFFE7 B$,,,530 MOVE X+(X2-X)/2,Y2 1090 TRANSFFR 701 TO B$ FHS ; CO540 SETGU:.• .. UNT 230

.' 550 IPLOT 0,2,-2 1100 CLEAR 72 560 SETU'J

25

-". - .. -% , .%.• % . ° % . . . .. % ° . .. _° . . .. .. ., . . -° . . • .... . . .

1118 IO=VAL(B$E5,83) 1690 PRINT "HEAT CAPACITY =";C1120 H8=VAL(B$E(,813J) 1700 GOTO 17401138 V1=VAL(B$E14,20]) 1710 T1=(Y6-63)/(Y6-Y7)t(X6-X7)+1140 H1=VAL(BSE21o273) X71150 OUTPUT 782 ;"D3D2" 1720 F=1 I1168 IOBUFFER A$ 1730 GOTO 12001170 TRANSFER 701 TO AS FHS ; CO 1740 FOR Z=8 TO .75 STEP .05

UNT 8192 1750 L=631180 CLEAR 7 1760 PLOT ZL1190 F=8 1770 NEXT Z1200 X5=0 1780 PENUP1210 Y5=0 1790 FOR Z=T1-.5 TO T1+.5 STEP1220 N=O 051236 FOR I=Al TO A2 STEP 2*A3 1808 L=631240 P=256*NUM(ASEIJ)+NUM(A$[I+1 1818 PLOT Z,L

])-65536*(NUM(A$EIJ)>=128) 1820 NEXT Z :1250 J=I/2-.5 1830 PENUP i1260 V=P*VI 1840 FOR L=8 TO 10 STEP .11270 V=V-G'1888 1850 Z=T11280 V=V*1888 1868 PLOT Z,L1298 T=(J-HO)*H1 1870 NEXT L1388 T=T*1800 1880 PENUP1310 T=T-O 1890 FOR L=58 TO 68 STEP .11320 X4=T 1900 Z=TI1330 Y4=V*10'/MI 1918 PLOT ZL1340 X4=X4+X5 1928 NEXT L1350 X5=X4 1930 PENUP1360 Y4=Y4+Y5 1948 END1370 Y5=Y41380 N=N+l 21390 NEXT I1400 PLOT X6,Y61410 X6=X4/N1428 Y6=Y4'N1430 PLOT X6,Y61'-40 PENUP1458 YE=Y6+.8051460 Y6=INT(Y6*1008)100.1470 DISP Y6,X61480 IF F=1 THEN 15801490 IF Y6>63 THEN 17101500 Rl=Al+R51510 A2=A2+A51520 Y7=Y61530 X7=X61548 IF A2<RO+40*10 THEN 12081550 M1=Ml*.02/10001560 S=MI/T11570 T2=M1/(IOtRtO*R1.1580 C=RI*IOA3*RO^2/S1598 C1=R1*R0^2tIA^3/M11600 PRINT "VOLT (max) =";Ml1618 PRINT "CURRENT(arAPs) =";I01620 PRINT "R (ohms) =".;PO1630 PRINT "COEFF of RES :";1R1640 PRINT1650 PRINT "TIME CONST =";T11660 PRINT uSLOPE(Vmax/')=";S1670 PRINT "TEMP PISE(C' =";T21680 PRINT "HEAT LOSS =";Ci

26

* **'* - - .-.-- '---,

- -- -- . .7 -

SCmnDISTRIBUTION LIST

• • Commander

Armament Research and Development CenterU.S. Army Armament, Munitions and Chemical CommandATTN: DRSMC-LCE(D) (3)

DRSMC-LCE-D(D) (20)DRSMC-GCL(D)DRSMC-TSS(D) (5)

Dover, NJ 07801

AdministratorDefense Technical Informat'on CenterATTN: Accessions Division (12)

Cameron StationAlexandria, VA 22314

DirectorU.S. Army Materiel Systems Analysis ActivityATTN: DRXSY-MPAberdeen Proving Ground, MD 21005

Commander*1 Chemical Research and Development Center

U.S. Army Armamant, Munitions and Chemical CommandATTN: DRSMC-CLJ-L (A)

DRSMC-CLB-PA (A)APG, Edgewood Area, MD 21010

DirectorBallistics Research LaboratoryArmament Research and Development CenterU.S. Army Armament, Munitions and Chemical CommandATTN: DRSMC-BIA-S (A)Aberdeen Proving Ground, MD 21005

ChiefBenet Weapons Laboratory, LCWSLArmament Research and Development CenterU.S. Army Armament, Munitions and Chemical Command

ATTN: DRSMC-LCB-TLWatervliet, NY 12189

CommanderU.S. Army Armament, Munitions and Chemical CommandATTN: DRSMC-LEP-L(R)Rock Island, IL 61299

27

DirectorU.S. Army TRADOC Systems

Analysis ActivityATTN: ATAA-SLWhite Sands Missile Range, NM 88002

Dr. L.A. Rosenthal384B Stirling DriveCranbury, NJ 08512

"CommanderNaval Surface Weapons CenterATTN: Technical Library (2)

Code WR-12, J. Laib (2)White Oak LaboratorySilver Spring, MD 20910

CommanderAD/DLJFATTN: R. MabryEglin Air Force Base, FL 32542

28

f-': .- +..-.+...-. .+ .. , .+.. .+.. .+. +-+ ..- . ... _ . . . .