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High-speed Serial Interface Lect. 9 – Noises 2013-1 High-Speed Circuits and Systems Lab., Yonsei University 1

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Page 1: High-speed Serial Interface

High-speed Serial Interface

Lect. 9 – Noises

2013-1High-Speed Circuits and Systems Lab., Yonsei University1

Page 2: High-speed Serial Interface

Block diagram

2013-1High-Speed Circuits and Systems Lab., Yonsei University2

Serializer Sampler

ClockRecovery

Deserializer

PLL

Channel

Tx Rx

• Where are we today?

RxEqualizer

TxDriver

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Sampling in Rx• Interface applications usually employ binary-

level signaling– Rx samples input signal with single threshold.

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ChannelDATA

Sampler

Tx Rx

SamplingPoint

Threshold

InputSignal

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Noise in time domain• Noises in high-speed interface can be easily

observed in time-domain– Noise waveform is added on the signal waveform

2013-1High-Speed Circuits and Systems Lab., Yonsei University4

SamplingPoint

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How noise affects sampling?• Noise at sampling point can cause wrong

sampling

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SamplingPoint

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How noise affects sampling?• Noise can disturb the disturb sampling point

– Noise can distorts clock generation both in Tx and Rx.– If sampling point goes outside of data period, sampling results in

wrong data.– Timing noise reduces sampling margin.

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SamplingPoint

TxCLK

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How noise affects sampling?• AM-to-PM noise conversion

– Amplitude noise at signal transition reduces timing margin.– Shorter the transition time, less the noise conversion

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Threshold

Bit period

Timing margin

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Jitter• Definition

– “Jitter is the undesired deviation from true periodicity of an assumed periodic signal in electronics and telecommunications, often in relation to a reference clock source.” –by wikipedia

– Jitter is noise observation in time domain.• Amplitude noise can be also observed as jitter

– Jitter reduces timing margin of sampling

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Bit-error rate (BER)• Most important performance metric.

– BER shows end-to-end system performance.– Timing margin is evaluated from BER performance.

• BER is calculated as follows;

=

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Bit-error rate (BER)

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BER: Probability that the noise will exceed a given value

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Bit-error rate (BER)• For Gaussian noises,

Probability that the noise will exceed a given value:

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Bath-tub

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http://prphotos.tm.agilent.com/2009/19oct-em09165/

Eye-diagram BER contour

Bath-tubfor

Timing

Bath-tubfor

Amplitude

Timing margin for BER<10-6 and 10-12

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Where are noises from?• Device noise

• Channel noise

• Power supply

• Coupling

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Page 14: High-speed Serial Interface

Device noise• Noise sources in MOSFETs

– Thermal noise in the channel– 1/f noise– Noise in the resistive poly gate– Noise due to the distributed substrate resistance– Shot noise associated with the leakage current of the drain

source reverse diodes* Reference: “ http://www.nikhef.nl/~jds/vlsi/noise/sansen.pdf ”

• Noise sources in other devices– resistor / capacitor / diode

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Device noise• Device noise in amplifiers

– Device noise of Tx output and Rx input buffer stage generate random noise.

– This kind of noise is not significant in electrical-channel-based interface since the signal amplitude is usually large enough.

• Device noise in clock generators– Device noise of Tx clock generator and Rx clock recovery circuit

generate random noise.– This noise is significant and will be covered in next lectures.

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Device noise• Duty-cycle distortion

– Originally metric of clock generation.– This kind of noise is deterministic and static.– Duty-cycle distortion gives asymmetric timing margin for high

and low signal.– Defined as follows;

= " "2013-1High-Speed Circuits and Systems Lab., Yonsei University16

Threshold

ClockSignal

Period of “High”

Bit period

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Device noise• Duty-cycle distortion

– Single-ended signaling: threshold variation• Single-ended signaling requires threshold which is usually

generated in Rx side.• If threshold is not exactly mid-level, duty cycle is distorted.

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Threshold > 0.5

InputSignal

Period of “High”

Bit period

Duty cycle = 50%

Duty cycle < 50%

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Device noise• Duty-cycle distortion

– Differential signaling: differential offset• Differential amplifier has differential

offset which is caused by mismatch of input transistor pair.

• Cross-point of differential signals is changed, thus, duty-cycle is distorted.

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InputSignal +

InputSignal -

Period of “High”

Bit period

Duty cycle < 50%

OUT-

IN+

OUT+

Ibias

Zload Zload

gm gm IN-

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Channel noise• Random noise

– Electrical channel• Thermal noise in electrical channel generate random noise.• This kind of noise is not significant compared to channel ISI since

the signal amplitude is usually large enough.

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Channel noise• Inter-symbol interference

– ISI is covered in previous lectures.– Reduces both amplitude and timing margin.– Dominant noise source in BW-limited channel.

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Power supply noise• Performance degrades by power supply noise

– Lowered power supply voltage results in BW limitation.• Transition time is enlarged. AM-to-PM noise conversion ↑

– Decision threshold• Threshold voltage of CMOS logic is defined by P/N ratio and supply

voltage.

– Bias condition• Bias condition (gm or rout) is changed as supply voltage changes

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Power supply noise• IR drop in power-supply rail

– Power supply rail is resistive channel• Large current drawing results in significant voltage drop.• Resistance is reduced by large-width of supply rail.• Power supply branching topology is also important.• The width and topology of power-supply rail should not be the main

limiting factor in PCB or IC design.

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Device#1

Device#2

Device#3

VDD

I1 I2 I3VDD1 VDD2 VDD3

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Power supply noise• Self-generated supply noise

– Power supply rail is also inductive channel• BW of current flowing is limited.• Capacitances are located near devices.

– Instantaneous current drawing results in peak on the supply.

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OUTIN

VDD

VSS

IN

VSS

VDD

OUT

SupplySource

SupplySource

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Power supply noise• Induced supply noise

– Supply noise from the external noise source• Power management IC cannot reject noise perfectly.

– Supply noise from adjacent device• Supply noise is generated from device sharing power supply rail

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InterfaceChip

DC-DCConverter

Digital Signal Processing

Chip

220V AC

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Power supply noise• How to minimize the effect of power supply

noise?– 1. supply filtering

• Supply noise can be filtered by external components.• Trade-off in supply filtering and the number of external components

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InterfaceChip

DC-DCConverter

Digital Signal Processing

Chip

220V AC

Bead BeadCAP CAP

LC-typeSupply filter

(Ferrite bead, Ferrite choke)

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Power supply noise• How to avoid the effect of power supply noise?

– 2. on-chip supply regulator• Supply regulator can be integrated on the IC.• Internal VDD is reduced.• Very large capacitors should be integrated.

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VDD

Devices

VSS

Internal VDD

Vref

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Power supply noise• How to avoid the effect of power supply noise?

– 3. circuit topology using differential signaling• Single-ended signaling suffers from threshold variation by supply

noise.• Threshold of differential signaling is defined as crossing point.

• Differential signaling requires much larger power consumption and chip area. trade-off

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Threshold

InputSignal

InputSignal +

InputSignal -

Single-ended signaling Differential signaling

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Coupling noise• Crosstalk between lanes

– Neighboring channels have both capacitive and inductive coupling

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ZsZo

ZoZo

Mutual Capacitance, Cm Mutual Inductance, Lm

ZsZo

ZoZo

Cm

Lm

near

far

near

fardtdILV mLm

dtdVCI mCm

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Coupling noise– Near-End Crosstalk (NEXT) and Far-End Crosstalk (FEXT)

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ZsZo

ZoZo

ZsZo

ZoZo

ICmLm

near

far

near

far

ILm

LmCmfarLmCmnear IIIIII

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Coupling noise– Near-End Crosstalk (NEXT) and Far-End Crosstalk (FEXT)

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Driven Line

Un-driven Line“victim”

DriverZs

Zo

ZoZo

Near End

Far End

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Coupling noise

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TD

2TD

~Tr

~Tr

far end crosstalk

Near end crosstalk

Zo

V

Time = 2TD

ZoNear end Terminated at T=2TD

V

Time = 0

Zo

Near end crosstalk pulse at T=0 (Inear)

Far end crosstalk pulse at T=0 (Ifar)

Zo

ZoV

Time= 1/2 TD

ZoV

Time= TD

Zo Far end terminated at T=TD

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Coupling noise• How to minimize inter-lane crosstalk?

– Enlarge space between channel• Most effective but trade-off with PCB artwork.

– Adjust transition timing of each lane• Split transition timing of adjacent lanes.

– ex) ½ UI delayed timing for even-numbered lanes.» Fluctuation appears at center of data period

– Compensate coupling at Tx side• Tx knows output data patterns of all lanes.

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Coupling noise• Inter-chip crosstalk

– Similar coupling problem appears on the IC level.

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N coupled lines: (a) capacitive coupling only, (b) inductive coupling only, and (c) capacitive and inductive coupling.Victoria Vishnyakov, “Multi-aggressor capacitive and inductive coupling noise modeling and mitigation” Microelectronics journal, 2012

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Coupling noise• How to minimize inter-chip crosstalk?

– Separate sensitive signals

– Shield signal lines• Employing grounded-shielding line • Layout effort / area issues

– Use different metal layers for adjacent lanes• Usually minimum spacing within the same metal layer is much smaller

than the separation between metal layers

– Perpendicular routing for vertical metal layers (Manhattan routing)

– Limit maximum parallel routing distance

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Coupling noise• How to minimize inter-chip crosstalk?

– Maximize signal transition time

– For differential signals, periodically twist routing

– Separate sensitive signals

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