Disclosure to Promote the Right To Information

Whereas the Parliament of India has set out to provide a practical regime of right to information for citizens to secure access to information under the control of public authorities, in order to promote transparency and accountability in the working of every public authority, and whereas the attached publication of the Bureau of Indian Standards is of particular interest to the public, particularly disadvantaged communities and those engaged in the pursuit of education and knowledge, the attached public safety standard is made available to promote the timely dissemination of this information in an accurate manner to the public.

इंटरनेट मानक

“!ान $ एक न' भारत का +नम-ण”Satyanarayan Gangaram Pitroda

“Invent a New India Using Knowledge”

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“Step Out From the Old to the New”

“जान1 का अ+धकार, जी1 का अ+धकार”Mazdoor Kisan Shakti Sangathan

“The Right to Information, The Right to Live”

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“Knowledge is such a treasure which cannot be stolen”

“Invent a New India Using Knowledge”

है”ह”ह

IS 15635-1 (2006): Geometrical products specification (GPS)- Acceptance and reverification tests for coordinatemeasuring machines (CMM) : Part 1 Vocabulary [PGD 25:Engineering Metrology]

IS 15635 (Part 1) :2006ISO 10360-1:2000

+lR’i%7‘J7T7v

Indian Standard

GEOMETRICAL PRODUCT SPECIFICATIONS(GPS) — ACCEPTANCE AND REVERIFICATION

TESTS FOR COORDINATE MEASURINGMACHINES (CMM)

PART 1 VOCABULARY

Ics 01 .040.17; 17.040.30

,,

@ BIS 2006

BUREAU OF INDIAN STANDARDSMANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG

NEW DELHI 110002

hkf~Ch 2006Price Group 13

Engineering “Metrology Sectional Committee, PG 25

NATIONAL FOREWORD

This Indian Standard (Part 1) which is identical with ISO 10360-1 :2000 ‘Geometrical ProductSpecifications (GPS) — Acceptance and reverification tests for ‘coordinate measuring machines(CMM) – Part 1 : Vocabulary’ issued by the International Organization for Standardization (ISO) wasadopted by the Bureau of Indian Standards on the recommendation of the Engineering MetrologySectional Committee and approval of the Medical Instruments, General and Production EngineeringDivision Council.

Coordinate measuring machines (CMMS) are most modern method of dimensional inspection, With theadvent of numerically controlled machine tools, demand grew for a means to support this equipmentwith faster first piece inspection and in many cases 100 percent inspection. To fill this gap CMMS weredeveloped by modifying precision layout machines.

The text of this ISO Standard has been approved as suitable for publication as an Indian Standardwithout deviations. Certain terminology and conventions are, however, not identical to those used inIndian Standards. Attention is particularly drawn to the following:

a) Wherever the words ‘International Standard’ appear referring to this standard, they shouldbe read as ‘Indian Standard’.

b) Comma (,) has been used as a decimal marker while in Indian Standards, the current practiceis to use a point (.) as the decimal marker.

ISO 10360 consists of the following other parts:

Part 2 CMMS used for measuring sizePart 3 CMMS with the axis of a rotary table as the fourth axis

,,,

Part 4 CMMS used in scanning measuring modePart 5 CMMS using multiple-stylus probing systemsPart 6 Estimation of errors in computing Gaussian associated features

Technical Corrigendum 1 to the above International Standard has been given at the end of thispublication.

For the purpose of deciding whether a particular requirement of this standard is complied with, the finalvalue, observed or calculated, expressing the result of a test or analysis, shall be rounded off in accordancewith IS 2 : 1960 ‘Rules for rourtding off numerical values (revised)’. The number of significant placesretained in the rounded off value should be the same as that of the specified value in this standard.

?

IS 15635 (Part 1) :2006ISO 10360-1:2000

Indian Standard

GEOMETRICAL PRODUCT SPECIFICATIONS(GPS) – ACCEPTANCE AND REVERIFICATION

TESTS FOR COORDINATE MEASURINGMACHINES (CMM)

PART 1 VOCABULARY

1 Scope

This part of ISO 10360 establishes a vocabulary forcoordinate measuring machines (CMM), and theiracceptance and reverificationtests.

2 General terms

2.4

coordinate measuring machineCMMmeasuring system with the means to move a probingsystem (2.6) and capability to determine spatialcoordinates on a workpiece surface

NOTE For a description of some common CMMS andtheir physical axes, see annex A.

2.2

coordinate measurementmeasurement of spatialCMM (2.1)

2.3

measuring volumemeasuring range of

coordinates carried out by a

a CMM (2.1), stated assimultaneous limits on all spatial coordinatesmeasured by the CMM

2.4

workpiece coordinate systemcoordinate system fixed with respect to a workpiece

1 Domaine d’application

La presente partie de 1’1S0 10360 etablit unvocabulaire relatif aux machines a mesurer tri-dimensionnelles (MMT) et a Ieurs essais de receptionet de verificationperiodique.

2 Termes generaux

2.1.,, ,

machine a mesurer tridimensionnelle, fMMT, fsysteme de mesure avec des moyens pour deplacerun systeme de palpage (2.6) et capacite adeterminer des coordonnees spatiales sur la surfaced’une piece

NOTE Pour la description de quelques MMTcommunement utilisees et Ieurs axes physiques, voirI’annexe A.

2.2

mesure par coordonnees, fmesure de coordonnees spatiales conduite par uneMMT (2.1)

2.3

volume de mesure, metendue de mesure d’une MMT (2.1), etablie commeIes Iimites simultanees de toutes Ies coordonneesmesurees par la MMT

2.4

repere piece, msysteme de coordonnees lie a la piece

IS 15635 (Part 1): 2006ISO 10360-1:2000

2.5

machine co-ordinate systemcoordinate system fixed with respect to physical orcalculated axes of a CMM (2.1)

NOTE For a description of some common CMMS andtheir physical axes, see annex A.

2.6

probing systemsystem consisting of a “ probe (3,1) -and, wherepresent, probe extensions, probe changing system,stylus (4. 1), stylus changing system and stylusextensions

See Figures 1 and 2.

NOTE 1 A probingsystem is connectedto a ram (2.-23).

NOTE 2 A probing system is not limited to contactingprobing systems (3.2).

2.7

probing (to probe), verbaction which results in the determinationof coordinatevalues

2.8

discrete-point probingparticular probing (2.7) mode where the recording of anindicated measured point (2. 12) is assessed directlyafter an intermediate point (2.11) has been left

2.9

scanningparticular probing (2.7) mode for taking consecutivemeasured points in order to characterize lines on aninspected surtace

2.10

program pointany point expressed by coordinates and used forcontrolling the movement of a specified point of aprobing system (2.6)

2.11

intermediate pointspecial program point (2.1 O) where no probing (2.7)is made

NOTE Intermediate points are normally used forcontrolling the movement of a probing system (2.6),altering its speed or direction of movement, and forclearance movement.

2.5

rep~re machine, msysteme de coordonnees lie aux axes, physiques oucalcules, d’une MMT (2.1)

NOTE Pour une description de quelques types courantsde MMT et de Ieura axes physiques, voir I’annexe A.

2.6

syst~me de palpage, msysteme constitue d’un palpeur (3.1) et, selon Ie cas,de rallonges de palpeur, d’un systdme de changementde palpeur, de stylets (4.1), d’un systeme dechangement de stylet et de rallonges de stylet

Voir Figures 1 et 2,

NOTE 1 Un systbme de palpage est connecte ausupport du systbme de palpage (2.23).

NOTE 2 Un systeme de palpage n’est pas Iimite auxsystemes de palpage A contact (3.2).

2.7

palpage, maction qui consiste a determiner des valeurs decoordonnees

2.8

palpage discret, mmode de palpage (2.7) patticulierou I’enregistremantd’unpoint de mesurea indrque (2.12) eat efktue directernantapres avoir quitte un point internfkdiairs (2.1 1)

2.9

scanningbalayage, mmode de palpage (2,7) particulier qui prend despoints de mesure consecutifs afin de caracteriser desIignes sur une surface a verifier

NOTE En frangais, il est preferable d’utiliser Ie terrneplutbt que ~,balayage~~.

2.10

point de programme, mtout point caracterise par des coordonnees et utilis6pour commander Ie replacement d’un point sp6cified’un systeme de palpage (2.6)

2.11

point intermediaire, mpoint de programme (2.1 O) special sur Iequel aucunpalpage (2.7) n’est effectue

NOTE Les points interm&fiaires sent norrnalementutilises pour commander Ie replacement d’un syat~me depalpage (2.6), en modifiant sa vitesae et direction dereplacement, et pour Ies movements de jeu.

2

IS 15635 (Part 1) :2006ISO 10360-1:2000

11

Key

3{

5

1

2

*4

-l--l-JLegende

1 Ram 7 Stylus shaft 1 Support du systeme de 7

2 Probe extension 8 stylus palpage 8

3 Probe changing system 9 Stylus tip 2 Rallonge du palpeur ~

4 -Probe 10 Tip diameter 3 Systeme de 10

5 Stylus changing system 11 Probing systemchangement de palpeur

11

6 Stylus extension 12 Stylus system4 Palpeur

5 Systeme de12

(composed of stylussystem components) changement de stylet

6 RaHonge de .stylet

Figure 1 — Probing system

Figure 1 — Systeme de palpage

Arbre du stylet

Stylet

Touche du stylet

Diametre de la touche

Systeme de palpage

Systeme de stylet(constitue decomposants du systemede stylet)

3

IS 15635 (Part 1) :2006ISO 10360-1:2000

8

Key

1 Ram 5 Probe

2 Articulation system 6 Stylus extension

3 Probe extension 7 stylus

4 Probe changing system 8 Articulatedprobingsystem

5●

6

Legende

1 Support du systeme depalpage

2 Systeme d’orientation

3 Rallonge du palpeur

4 Systeme de

5 Palpeur

6 Rallonge du stylet

7 Stylet

8 Systeme de palpagearticule

changement de palpeur

Figure 2 — Articulating probing system

Figure 2 — Systeme de palpage artieule

4

IS 15635 (Part 1) :2006ISO 10360-1:2000

2.12

indicated measured pointspecified point of a probing system (2.6) for whichthe coordinates are indicated at the instant whenprobing (2.7) occurs

.See Figure 3.

NOTE The specified point is typically at or near thecentre of the stylus tip (4.2).

2.13

corrected measured pointestimate for a point on a workpiece surface, based on

an indicated measured point (2.12)

See Figures 3 and 4.

NOTE In the case where no stylus system (4.4) isattached to a probe (3.1) [e.g. in case of an opticalprobing system (3.4)] the indicated measured point(2.1 2) and the corrected measured point could be identical.

a

b

c

d

Indicated measuredpoint

Tip correction vector,

Corrected measuredpoint

Target contact point

e

f

?g

h

2.12

point de mesure indique, mpoint specifie d’un systeme de palpage (2.6) pourIequel Ies coordonnees sent indiquees au moment ouIe palpage (2.7) intefvient

Voir Figure 3.

NOTE Le point specifie est typiquement au centre oupres du centre de la touche du stylet (4.2).

2.13

point de mesure corrige, mestimation pour un point de la surface d’une piece,basee sur un point de mesure indique (2.12)

Voir Figures 3 et 4.

NOTE Dans Ie cas ou aucun systeme de etylet (4.4)n’est attache a un palpeur (3.1) [par exemple clans Ie casd’un systbme de palpage optique (3.4)], Ie point demesure indique (2.12) et Ie point de mesure corrigepeuvent @tre identiques.

a

b

c f

-———————

““T T

————————————-

e d q

Actual contact point a

Real feature b

Nominal feature, targetscan line c

Positional error d

Point de mesure indique

Vecteur de correction de

touche, ?

Point de mesure corrige

Point de contact cible

Figure 3 — Naming of points (simplified representation)

e

f

9

h

Point de contact r6el

Element reel

Element nominal, Iignecible

Erreur de position

Figure 3 — Designation des points (representation simplified)

5

IS 15635 (Part 1) :2006ISO 10360-1:2000

e

—

o

/

a Indicated measured d Vector of the corrected a Point de mesure indique d Vecteur du point de

point measured point, F b Vecteur de correction de mesure corrige, I

b Tip correction vector, ? e Vector of the indicated touche, ? e Vecteur du point dec Corrected measured measured point, ~ c Point de mesure corrige mesure indlque, 3

point

Figure 4 — Tip correction vector (simplied representation)

Figure 4 — Vecteur de correction de touche (representation simplified)

2.34

target contact pointintended point of ~ontact on a nominal integral feature

See Figure 3.

NOTE A nominal integral feature is a theoreticallyexact surface in accordance with ISO 14660-1.

2.15

actual contact pointpoint of contact between a stylus tip (4.2) and a realfeature

See Figure 3.

NOTE A real feature is an integral feature, part of areal surface of a workpiece in accordance withISO 14660-1.

2.16

tip correction vector.—?I

vector used to translate an indicated measuredpoint (2.1 2) to a corrected measured point (2.1 3)

See Figures 3 and 4.

2.14

point de contact cible, m,.,

point de contact souhaite sur un element nominal

integral

Voir Figure 3.

NOTE Un element nominal integral est une surlacetheoriquement exacte selon I’ISO 14660-1.

2.15

point de contact reel, mpoint de contact entre la touche du stylet (4.2) etI’element reel

Voir Figure 3.

NOTE Un element reel est un element integral, partied’une surface reelle d’une piece selon I’ISO 14660-1.

2.16

vecteur de correction de touche, m

vecteur utilise pour la translation d’un point demesure indique (2.12) vers un point de mesurecorrige (2.13)

Voir Figures 3 et 4.

6

IS 15635 (Part 1) :2006ISO 10360-1:2000

NOTE 1 The tip correction vector normally includes thephysical size of the tip (e.g. radius) and a correction for thesystematic errors of the probing system (2.6). Thetranslation from an indicated measured point (2.12) to acorrected measured point (2. 13) is expressed by theequation:

where

,t~ isthevector of thecorrected measured point;

~ is the vector of the indicated measured point;

? is the tip correction vector.

NOTE 2 The conventional practice is normally to use anapproximate stylus tip (4.2) radius to establish themagnitude of this vector and an estimated surface normal toestablish the direction. The tip diameter can includecorrection effects such as stylus shaft bending and isusually referred to as “effectivetip diameter”.

2.17

acceptance test (of a CMM)set of operations agreed upon by the CMM (2.1)manufacturer and the user to verify that theperformance of a CMM is as stated by themanufacturer

2.18

reverification test (of a CMM)test to verify that the performance of a CMM (2.1) isas stated by the user and executed according to thesame procedures as those of the -acceptance test(2.17)

2.19

interim check (of a CMM)test specified by the user and executed betweenreverification to maintain the level of confidence inthe measurements taken on the CMM (2.1)

2.20

Gaussian radial distanceRdistance between the centre of a Gaussian (least

squares) sphere that is the associated feature basedon a finite number of corrected measured points

(2.1 3) on a spherical material standard of size (8.2),and a corrected measured point on the samespherical material standard of size

NOTE All the measured points establish the extractedfeature from which the associated feature is established andhence a range of values for the Gaussian radial distance, R.

NOTE 1 Le vecteur de correction de touche inclutnormalement la taille de la touche (par exemple Ie rayon) atune correction de I’erreur systematique du systbme depalpage (2.6). La translationd’un point de mesure indiqu6(2.12) vers un point de mesure corrige (2.13) estexprimee par I’equation:

2=5+?

Ou

~ est Ie vecteur du point de mesure corrge;

~ est Ie vecteur du point de mesure indique;

? est Ie vecteur de correction de touche.

NOTE 2 La pratique conventionnelle utilise courammentun rayon approche de touche du styfet (4.2) pour etablirf’amplitude de ce vecteur et une normale a la surfaceestimee pour etablir la direction. Le diametre de la touchepeut inclure das 61ements de correction tels que ta flexionde I’arbre du stylet, et il est couramment appe16 ,,diametreeffectif de touche~~.

2.17

essai de reception (d’une MMT), mensemble d’operations acceptees entre Ie fabricant

d’une MMT (2.1) et I’utilisate.ur pour verifier que laperformance d’une MMT est telle que declaree par Iefabricant

2.18 .

essai de verification p6riodique ,,, ,

(d’une MMT), messai pour verifier que la performance d’une MMT(2.1 ) est telle que declaree par I’utilisateur et executeavec ks m6mes procedures que celles pour I’essaide reception (2.17)

2.19

centrble interm6diaire (d’une MMT), m*ssai specifie par I’utilisateur et execute entre Ies

verifications periodiques pour maintenir Ie niveau de

confiance clans fes mesurages realises avec la MMT(2.1)

2.20

distance radiale gaussienne, fRdistance entre Ie centre dune sphere gaussienne

(ales moindres carres), qui est I’element associe base

sur un nombre fini de points de mesure corriges(2.1 3) sur un etalon materialise de taille (8.-2),spherique, et un point de mesure corrige sur Ie m~meetaton materialise de taille, spherique

NOTE Tow Ies points mesures etablissent f’elementextrait a parfir duquel .I’element associe est etabli et doneune etendue de valeurs pour la distance radiafegaussienne, R.

7

IS 15635 (Part 1) :2006ISO 10360-1:2000

2.21

rangedifference between the greatest and the smallestvalue of nominally the same quantity

2.22

hysteresisproperty of a measuring instrument whereby itsresponse to a given stimulus depends on thesequence of preceding stimuli

NOTE Although hysteresis is normally considered inrelation to the measurand, it may also be considered inrelation to influence quantities.

2.23

ramcomponent of a CMM (2.1) that carries a probingsystem (2.6)

3 Terms relating to the probing system

3.1

probedevice that generates the signal(s) during probing(2.7)

3.2

contacting probing systemprobing system (2.6) which needs material contactwith a surface being measured in order to function

3.3

non-contacting probing systemprobing system (2.6) which needs no materialcontact with a surface being measured in order tofunction

NOTE An optical probhg system (3.4) is a non-contacting probing system.

3.4

optical probing systemnon-contacting probing system (2.6) which creates acorrected measured point (2.13)by probing (2.7)using an optical system

3.5

multi-probe systemprobing system (2.6) -with more than one probe (3.1)

2.21

&endue, fdifference entre la plus grande et la plus petite valeurd’urra m~me grandeur nominale

2.22

hysteresis, fpropriete d’un instrument de mesute selon Iaquelle sareponse a un signal donne depend de la sequence dusignal prec6dent

NOTE Ehen que I’hysteresis soit norrnalementconsidered en Iialson avec Ie mesurande, elle peut aussi&tre considered en liaison avec Ies grandeur sd’influence.

2.23

support du systeme de palpage, mcomposant d’une MMT (2.1) qui porte Ie systeme depalpage (2.6)

3 Termes relatifs au systeme de palpage

3.1

patpeur, mdispositif qui genere un (ales) signal (signaux) pendantIe palpage (2.7)

3.2 ,,, ,

systeme de palpage a contact, msysteme de palpage (2.6) qui necessite un contactmateriel avec une surface a mesurer pour fonctionner

3.3

systeme de palpage saris-contact, msysteme de palpage (2.6) qui ne necessite pas uncontact materiel avec une surface a mesurer pourfonctionner

NOTE Un systeme de palpage optique (3.4) est un

systeme de palpage saris contact.

3.4

systeme de palpage optique, msysteme de palpage (2.6) saris contact qui tree unpoint de mesure corrige (2.13) par palpage (2.7)utilisant un systeme optique

3.5

systeme a palpeurs multiples, msysteme de palpage (2.6) avec plusieurs palpeurs(3.1)

See Figures 5 and 6.Voir Figures 5 et 6.

8

IS 15635 (Part 1) :2006

3.6

articulating probing system

. probing system (2.6) which can be orientedvarious spatial angular positions by means ofmanual or motorized positioning device

ina

3.6

systeme de palpage articule, msysteme de palpage (2.6) qui peut 6tre oriente clansdifferences positions angulaires spatiales parI’intermediaire d’uri dispositif de positionnementmanuel ou motorise

-See Figure 2.

Voir Figure 2,

3.7

probing system qualWicationestablis~ment of the ‘parameters of a probing system(2.6) necessary for subsequent measurements

3.8

multiple stylimultiple stylusprobing system (2.6) incorporating more than onestylus system (4.4) with one or more styli, or onestylus system with more than one stylus (4.1 ) orhaving a multi-probe system (3.5) -or probingsystem (2.6) that can articulate a stylus or styli inmultiple orientations

See Figures 5 to 9.

4 Terms relating to the stylus system

4.1

stylusmechanical device consisting of a stylus tip (4.2) anda shaft

4.2

stylus tipphysical element that establishes the contact with theworkpiece

NOTE A stylus tip can be a ball, a cylinder, a disk, anapex etc.

4.3

stylus system componentsmechanical components such as stylus extensionsand styli that make possible material contact with aworkpiece

4.4

stylus systemany combination of stylus system components (4.3)which includes at least one stylus (4.1)

ISO 10360-1:2000

3.7

qualification du syst~me de palpage, fetablissement des parametres d’un systeme depalpage (2.6) necessaires pour Ies mesurages avenir

3.8

stylets multiples, mstylet multiple, msysteme de palpage (2.6) comprenant plusieurssystemes de stylet (4.4) avec un stylet (4.1) ou plus,ou comprenant un syst~me de stylet avec plusieursstylets, ou avec un systeme a palpeurs multiples(3.5) ou systeme de palpage (2.6) pouvant articulerun (OUales) stylet(s) selon des orientations multiples

Voir Figures 5 a 9.

4 Termes relatifs au systeme de stylet

4.1

stylet, mdispositif mecanique constitue d’une touche de stylet(4.2) et d’un arbre

4.2

touche de stylet, felement physique qui etablit Ie contact avec la piece

NOTE Une touche de styiet peut &re une bille, uncylindre, un disque, un sommet, etc.

4.3

composants du systeme de stylet, mcomposants mecaniques tels que rallonges de stylet-et styiets qui rendent possible Ie contact materiel avecla piece

4.4

systeme de stylet, mtoutes combinaisans de composants du systeme destylet (4.3) comprenant au moins un stylet (4.1)

IS 15635 (Part 1): 20061S0 10360-1:2000

4.5

stylus length

(spherical stylus tip) distance from the centre of thestylus tip (4.2) to the shoulder of the shaft

See Figure 10.

4.6

stylus tip offsetrelative coordinates of a stylus tip (4.2) centre

expressed in relation to a datum established in a

machine coordinate system (2.5)

NOTE The datum may be established by the centre ofthe first stylus (4.1 ) which has been qualified.

4.5

Ion.gueur du stylet, f(touche de stylet spherique) distance du centre de latouche de stylet (4.2) a I’epaulement de I’arbre

Voir Figure 10.

4.6

canstante de palpage, fcoordonnees relatives d’un centre de touche destylet (4.2) exprimees par rapport a une referenceetablie clans un repere machine (2.5)

NOTE La reference peut ~tre etablie par Ie centre dupremier stylet (4,1) qui a ete qualifie.

/’

,.

Key Legende1 Ram 4 Styli 1 Support du systeme de 4 Stylets2 Probe extension 5 Stylus extension palpage 5 Rallonge de stylet3 Probes 2 Rallonge de palpeur

3 Palpeum

Figure 5 — Probing system with multiple styli and multi-probe system (two probes and two single styli)

Figure 5 — Systeme de palpage avec styiets multiples et systeme a palpeurs multiples (deux palpeurs etdeux stylets simples)

10

IS 15635 (Part 1) :2006ISO 10360-1:2000

1

}2

Key Legende1 Ram 3 Probe 1 Support du systeme de 3 Palpeurs

2 Probe changing system 4 Styli palpage 4 Stylets2 Systeme de

changement de palpeur

Figure 6 — Probing system with multiple styli, multi-probe and probe-changing systems (two probes,two single styli and probe-changing system)

Figure 6 — Systeme de palpage avec stylets multiples, systemes a palpeurs multiples et de changementde palpeur (deux palpeurs, deux stylets simples et un systeme de changement de palpeur)

.,, ,

3 4 4 3

Key L@gende

1 Ram 3 stylus 1 Support du systeme de 3 Stylet

2 Probe 4 Stylus extension palpage 4 Rallonge de stylet2 Palpeur

Figure 7 — Probing system with multiple.sty!i (two single styli)

Figure 7 — Systeme de palpage avec stylets multiples (deux stylets simples)

11

.

[S 15635 (Part 1) :2006ISO 1.0360-1:2000

El-1

/3w

@

Key Legende1 Ram 1 Supportdu systeme de palpage2 Probe 2 Palpeur3 Star stylus 3 Stylet etoile

Figure 8 — Probing system with multiple styli (one star stylus)

Figure 8 — Systeme de palpage avec stylets multiples (un stylet etoile)

Key1 Ram

2 Probe

3 Stylus changing system4 Styli

Legende1 Support du systeme de

palpage2 Palpeur

1

2

3

3 Systeme dechangement de stylet

4 Stylets

Figure 9 — Probing system with mutipie styli (two single styli and a stylus changing system)

Figure 9 — Systeme de palpage avec stylets multiples (deux stylets simples et un systeme de changementde stylet)

12

IS 15635 (Part 1): 2006ISO 10360-1:2000

a

a Stylus length a Longueur du stylet

Figure 10 — Stylus length

Figure 10 — Longueur du stylet

5 Terms relating to the rotary table

5.1

rotary tableworkpiece mounting device which rotates a workpiece

with respect to the linear motion axes of a CMM (2.1)

NOTE The rotary table can be either of the indexing orthe infinite positioning type.

5.2

rotary table setupprocedure specified by the manufacturer for aligning(physicallyor in software) the rotary table (5.1) axiswith the linear motion axis system of a CMM (2.1)

6 Terms relating to the operationof the CMM

6.1

discrete-point probing speedmagnitude of the veldcity of a probing system (2.6)relative to a workpiece when discrete-point probing(2.7)

6.2

scanning speedmagnitude of the velocity of a probing systemrelative to a workpiece when scanning (2.9)

6.3

back off distance

(2.6)

distance from a new program point (2.1 O) to anintermediate point (2.1 1), where the intermediatepoint for the return movement of the stylus tip (4.2) isestablished from the immediately preceding programpoint

5 Termes relatifs au plateau tournant

5.1

plateau toumant, mdispositif de montage de piece qui fait tourner la pieceselon des axes de replacement Iineaire d’une MMT(2.1)

NOTE Le plateau tournant peut ~tre soit de type Aindexage, soit de type continu.

5.2

r6glage du plateau tournant, mprocedure specifiee par Ie fabricant pour degauchir(physiquement ou par Iogiciel) I’axe du plateautOUrtIaIIt (5.1) avec Ie systeme d’axes dereplacement Iineaire d’une MMT (2.1)

6 Termes relatifs au fonctionnementde la MMT

6.1

vitesse de palpage diacret, famplitude de la vitesse d’un systbme de palpage(2.6) par rapport a la piece soumise a palpage (2.7)discret

6.2

vitesse de scanning, famplitude de la vitesse d’un systbme de palpage(2.6) par rapport ala pi&e soumise a scanning (2.9)

6.3

distance de d6collage, fdistance d’un point de programme (2.1 O) nouveau ~un point intermediaire (2.11), oh Ie pointintermediaire pour Ie mouvement de retournement dela touche du stylet (4.2) est etabli A partir dupoint deprogramme immediatement prdcedent

1S-15635 (Part 1) :20061s0 10360-1:2000

7 Terms relating to scanning

7.1

corrected scan pointcorrected measured point (2.1 3) obtained during ascanning (2.9)

7.2

target scan lineline along which target contact points (2.1 4) lie

7.3

corrected scan lineline described by corrected measured points (2.13)obtained during scanning (2.9)

7.4

target scan pianeplane on which target contact points (2.14) lie

7.5

pre-defined path scanningmethod of scanning (2.9) in which the motion of the

probing system (2.6) between two defined end

points is directed by a target scan line (7.2)

NOTE The end points can be either target contactpointa (2.14) or corrected measured points (2.13).

7.6

not pre-defined path scanningmethod of scanning (2.9) in which the motion of theprobing system (2.6) between two defined end limitsis directed by feedback from the probing system

7.7

scan sequenceset of connected automated actions of a CMM (2.1)consisting of movement from an intermediate point(2.1 1) to a scanning (2.9) to another intermediatepoint

7.8

high point density (of a CMM)distribution of corrected scan points (7.1) with a

distance between every two consecutive scan points

IS 15635 (Part 1): 2006ISO1O36O-I :2000

7.9

low point density (of a CMM)distribution of corrected scan points (7.1) with a

distance between every two consecutive scan points>Imm

8 Terms relating to artefacts

8.1

material standardmaterial measure reproducing a traceable value of adimensional quantity of a feature

8.2

material standard of sizematerial standard (8.1 ) reproducing a feature of size

NOTE See also ISO 14660-1.

8.3

reference spherespherical material standard of size (8.2) placedwithin a measuring volume (2.3) of a CMM (2.1) forthe purpose of probing system qualification (3.7)

8.4

test spherespherical material standard of size (8.2) used foracceptance test (2.1 7) and reverification test (2.18)

9 Terms relating to CMM error or errorof indication

9.1error of indication of a CMM for size

measurementEerror of indication from which the size of a materialstandard of size (8.2) can be determined with aCMM (2.1), the measurement being-taken through twoopposite probing points on two nominally parallelplanes and normal to one of the planes, when theprobing points are approached from oppositedirections

NOTE The measurement for the material standard ofsize is taken through two opposite points on two opposedsurfaces, normal to one of the planes, when the points areapproached from opposite directions, see Figure 11 a)and b).

7.9

basse densit~ de points (d%me MMT), fdistribution de points issus du scanning corriges(7.1 ) pour Iaquelle toute distance entre deux pointsquelconques consecutifs est 21 mm

8 Termes relatifs aux etalons

8.1

6talon mat6rialis6, mmesure materialisee reproduisant une valeurraccordee d’une grandeur dimensionnelle d’unelement

8.2

6talon materialism de taille, metalon materialise (8.1) reproduisant une entitddimensionnelle

NOTE Voir aussi ISO 14660-1,

8.3

sph~re de ref6rence, fetalon materialise de taille (8.2) spherique, placeclans Ie volume de mesure (2.3) d’une MMT (2.1) envue d’une qualification du.systeme de palpage (3.7)

,,, ,8.4

sph-~re d’essai, fetalon materialise de taille (8.2), spherique, utilisepour i’essai de reception (2.17) et I’essai deverification periodique (2.18)

9 Termes relatifs a I’erreur d’indicationd’une MMT ou a I’erreur d’une MMT

9.1erreur d’indication d’une MMT pour

Ies mesures de taille, fEerreur d’indication pour Iaquelle la taille d’un etalonmaterialise de taille (8.2) peut 6tre determine avecune MMT (2.1), Ie mesurage etant realise parI’intermediaire de deux points de palpage opposes surdeux plans nominalement paralleled et perpendi-culairement a un des plans, Ies points palpds etantapproches depuis des directions opposees.

NOTE Le mesurage d’un etalon materialise de tailleest realise par I’intermediaire de deux pornts opposes surdeux surfaces opposees, perpendiculairement a un desplans, Ies points etant approches depuis des directionsopposees, voir Figure 11 a) et b).

15

IS 15635 (Part 1) :2006ISO 10360-1:2000

--E3-- Et----na) b)

Figure 11 — Directions of measurement

Figure 11 — Directions de mesure

9.2maximum permissible error of indication of

a CMM for size measurementMPEEextreme value of the error of indication of a CMMfor size measurement E, (9.1) permitted byspecifications, regulations etc. for a CMM (2.1)

NOTE 1 The maximum permissible error of indication ofa CMM for size measurement error, MPEE, is stated in oneof three forms:

a) MPEE = t minimum of (A + UK) and B (see Figure 12),or

b) MPEE = t (A + UK) (see Figure 13), or

c) MPEE = ~ B (see Figure 14)

where

A is a positive constant, expressed in micrometresand supplied by the manufacturer;

K is a dimensionless positive constant supplied bythe manufacture

L is the measured size, in millimetres;

B is the maximum permissible error MPE,c, inmicro metres, as stated by the manufacturer.

NOTE 2 The expressions apply for any tocation and/ororientation of the material standard of size (8.2) within themeasuring volume (2.3) of the CMM.

9.2erre.ur maximale toIer6e d’indication d’une

MMT #our Ies mesures de taille, f‘MPEE

valeur extr~me de I’erreur d’indication d’une MMTpour Ies mesures de taille E, (9.1), autorisee par Ies

specifications, reglements, etc., pour une MMT (2.1)

NOTE 1 L’erreur maximale toler6e d’indication d’uneMMT pour Ies mesures de taille, MPEE, est donn6e parI’une des trois formes suivantes:

a) MPEE = * minimum de (A + UK) et B (voir Figure 12),Ou

b) MPEE = + (A + L/K) (voir Figure 13), ou

c) MPEE = + B (voir Figure 14)

Ou

A

K

L

B

NOTE 2

est une constante positive, exprim6e enmicrombtres et fournie par Ie fabrican~ ~~

est une constante positive saris dimension fourniepar Ie fabricant;

est la taille mesuree, en millimetres;

est I’erreur maximale to16r6e MPEE, enmicrometres, specif%e par Ie fabricant.

Les expressions s’appliquent pour toute positionetiou orientation de Melon m“at6r”ialis& de taille” (8.2) al’iM%E?Ur du volume de meaure (2.3) de la MMT.

“*LFigure 12 — CMM maximum permissible error of indication for ske measurement error MPEE

[see 9.2, note 1, a)]

Figure 12 — Erreur maximale toleree d’indication d’une MMT pour Ies mesures de taille MPEE.[voir 9.2, note 1, a)]

16

K 15635 (Part 1): 2006ISO 10360-1:2000

+AkFigure 13 — CMM maximum permissible error of indication for size measurement error MPEE

[see 9.2, note 1, b)]

Figure 13 — Erreur maximale toleree d’indication d’une MMT pour Ies mesures de taille MPEE[voir 9.2, note 1,-b)]

“*-B-

Figure 14 — CMM maximum permissible error of indication for size measurement error MPEE ,,,[see 9.2, note 1, c)]

Figure 14 — Erreur maximale toleree d’indication d’une-MMT pour Ies mesures de taille MPEE[voir 9.2, note 1, c)]

9.3

probing errorPerror of indication within which the range of radii of aspherical material standard of size (8.2) can bedetermined by a CMM (2.1), the measurements beingtaken in a discrete-point probing (2.8) mode usingone stylus (4.1 ) on a test sphere (8.4)

9.3

erreur de palpage, fPerreur d’indication a I’interieur de Iaquelle I’etenduedes rayons d’un etalon materialism de tailie (8.2),spherique, peut ~tre determine par une MMT (2.1),Ies mesurages etant effectues en mode de palpagediscret (2.8) en utilisant un stylet (4.1) -sur unesphere d’essai (8.4)

See Figure 15.See Figure 15.

NOTE P is a positive value.NOTE Pest une valeur positive.

17

IS 15635 (Part 1) :2006ISO 10360-1:2000

NOTE f’ < MPEP

-.. _ /.’--__ —--

NOTE P < MPEP

Figure 15 — Probing error P

Figure 15 — Erreur de palpage P

9.4maximum permissible probing errorMPEPextreme value of the probing error, P (9.3), permittedby specifications, regulations etc. for a CMM (2.1 )

See Figure 15.

NOTE 1 The maximum permissible probing error of aCMM, MPEP, is stated as:

MPEP=A

where A is a positive constant, expressed in micrometres.

NOTE 2 The value of MPEP applies for any location ofthe spherical material standard of size (8.2) within themeasuring volume (2.3) of the CMM and for any probingdirection.

9.5

radial four-axis errorFRradial range of the error of indication of the testsphere (8.4) centre position as measured by theCMM (2.1) in the workpiece coordinate system(2.4) with the axis of a rotary table (5.1) as the fourthaxis

9.4errsur de palpage maximale to16r4e, fMPEPvaleur extr~me de I’erreur de palpage, P (9.’3),

autorisee par Ies specifi~ations, reglements, etc., pour

une MMT (2.1)

Voir Figure 15.

NOTE 1 L’erreur de palpage maximale tol&ee d’uneMMT, MPEP, est donnee par:

MPEP. A

ou A est une constante positive, en micrometres.

NOTE 2 La valeur de MPEP s’applique pour touteposition de I’etalon materialise de taille (8.2), sph6rique, aI’interieur du volume de mesure (2.3) de la MMT et pourtoute direction de palpage.

9.5

erreur radiale du quatrieme axe, fFRetendue radiale de I’erreur d’indication de la positiondu centre de la sphere d’essai (8.4) telle quemesuree par la MMT (2.1) clans Ie repere piece (2.4),avec I’axe d’un plateau tournant (5.1) commequatrieme axe

18

IS 15635 (Part 1): 2006ISO1O36O-1 :2000

9.6

tangential four-axis errorFTtangential range of the error of indication of the testsphere (8.4) centre position as measured by theCMM (2.1) in the workpiece coordinate system(2.4) with the axis of a rotary table (5.1) as the fourth

axis

9.7axial four-axis error[.’z.~

axial range of the error of indication of the test

sphere centre (8.4) position as measured by the

.CMM (2.1) in the workpiece coordinate system

(2,4) with the axis of a rotary table (5.1) as the fourth

axis

9.8maximum permissible radial four-axis errorMPE,R

extreme value of the radial fotrr-axis error FR (9.5)

permitted by specifications, regulations etc. for aCMM (2.1) with the axis of a rotary table (5.1) as thefourth axis

9.9maximum permissible tangential four-axis

errorMPEFTextreme value of the tangential four-axis error FT(9.6) permitted by specifications, regulations etc. for aCMM (2.1) with the axis of a rotary table (5.1) as thefourth axis

9.10maximum permissible axial four-axis errorMPEFAextreme value of the axial four-axis error FA (9.7)permitted by specifications, regulations etc. for aCMM (2.1) with the axis of a rotary table (5.1) as thefourth axis

9.11

scanning probing errorTijerror of indication within which the range of radii of atest sphere (8.4) can be determined by a CMM (2.1),the measurements being taken by scanning (2.9)using one stylus (4.1)

‘9.6

erreur tangentielle du quatri~me axe, fFTetendue tangentielle de I’erreur dindication de laposition du centre de la sphere d’essai (8.4) telle quemesuree par la MMT (2.1) clans Ie repere piece (2.4),avec I’axe d’un plateau tournant (5.1) commequatrieme axe

9.7erreur ax-isle du quatrieme axe, fFAetendue axiale de I’erreur d’indication de la positiondu centre de la sphere d’essai (8.4) telle quemesuree par la MMT (2.1) clans Ie repere piece (2.4),avec I’axe d’un plateau tournant (5.1) commequatrieme axe

9.8erreur radiale du quatrieme axe .maximale

toleree, fMPE~-R

valeur extr~me de I’erreur radiale du quatrleme axeFR (9.5) autorisee par Ies specifications, reglements,etc., pour une MMT (2.1) ayant I’axe d’un plateautournant (5.1) comme quatrieme axe

9.9erreur tangentielle du quatri~me axe

maximale toleree, f ,,, ,MPEn

valeur extr~me de I’erreur tangentielle du quatriemeaxe FT (9.6) autorisee par Ies specifications,reglements, etc., pour une MMT (2.1) ayant I’axe d’unplateau tournant (5.1) comme quatrieme axe

9.10erreur axiale du quatrieme axe maximale

toleree, fMPEFA

valeur extr~me de I’erreur axiale du quatrieme axeFA (9.7) autorisee par Ies specifications, reglements,etc., pour une MMT (2.1) ayant I’axe d’un plateautournant (5.1) comme quatrieme axe

9.11

erreur de palpage en mode scanning, fTij

erreur d’indication a I’interieur de Iaqueile I’etenduedes rayons d’une sphere d’essai (8.4) peut dredetermine par une MMT (2.1), Ies mesurages etanteffectues par scanning (2.9) avec un seul stylet (4.1)

IS 15635 (Part 1) :2006ISO 10360-1:2000

NOTE There are four scanning probing errors basedon different combinations of high point deneity (7.8) orlow point deneity (7.9) and pre-defined path ecenning(7.5) or non-predefined path scanning (7.6). These>combinations a(e designated&e follows: -

I Low(i=L) I TLP I TLN I

9.12maximum permissible scanning probing

errorMPETtiextreme value of the ecanning probing error(9.1 1) permitted by specifications, regulations etc.a CMM (2.1)

NOTE 1 The value of MPETjj is a positive constant which

applies for any location of the test sphere (8.4) within themeasuring volume (2.3) of the CMM and for any probingdirection.

NOTE 2 It is possible to state different values of MPETi/

for each of the four combinations.

“9.13

time for scanning testrelapsed time from the start of the first scan sequence(7.7) to the completion of the last scan sequence for

the procedure detailed

9.14maximum permissible time for scanning

W?stMPT,extreme value for the time for scanning test r (9.13)permitted by specifications, regulations etc. for a

CMM (2.1)

9.15fixed multiple-stylus probing system form

errorMFerror of indication within which the range of radii canbe determined by a least-squares fit of pointsmeasured on a spherical material standard of size(8.2), the measurements being taken on the testsphere (8.4) by a CMM (2.1) using fixed multiplestyli (3.8) in the discrete-point probing (2.8) mode

NOTE II y a quatre erreure de palpage en modescanning selon Ies diff6rentes combinaisons de hautedensit6 de pointe (7.6) ou baase densiti da points (7.9)et de trejectoira da scanning pr6d6finie (7.5) outrsjectoire de acenning non pr6d6finie (7.6). Cescombinaisons sent d&sign6es comme suit:

-

Basse (i= L) TLP TLN

9.12erreur de palpage maximale to14r6e en

mode scanning, fMPETti

valeur extttrme de I’erreur de palpage en modescanning Tij (9.11), autorisee par Ies specifications,reglements, etc., pour une MMT (2.1)

NOTE 1 La valeur de MPETV est une constante positivequi s’applique pour toute position de la sph?xe d’esaai (8.4)a I’interieur du volume de mesure (2.3) de la MMT pourtoute direction de palpage.

NOTE 2 II est possible de definir differences valeurs deMPETii pour chacune des quatre combinaisons.

9.13.,,

temps d~acquisition de I’essai de scanning, mrtemps ecoule entre Ie demarrage de la premieresequence de scanning (7.7) et I’achevement de laderniere sequence de scanning pour la proceduredetainee

9.14temps maximal to16re d’acquisition de

I’essai de scanning, mMPTT

valeur extr~me pour Ie temps d’acquisition de

I’essai de scanning, r (9.13), autorisee par Iesspecifications, reglements, etc., pour une MMT (2.1)

“9.1 5erreur de forme du systeme de palpage A

stylets multiples fixes, fMFerreur d’indication a I’interieur de Iaquelle I’etendue desrayons peut .6tre .determinee par une association desmoindres carr& des points mesures sur un etalonmatdrialise de taille (8.2), spherique, Ies mesuragesetant effectues sur la sphere d’essai (8.4) par uneMMT (2.1) utilisant des stylets multiples (.3.8) fixes,en mode de palpage discret (2.8)

20

IS 15635 (Part 1) :2006ISO 10360=1 :2000

9.16fixed multiple-stylus probing system size

errorMSerror of’ indication within which the diameter of a

spherical material standard of size (8.2) can be

determined by a least-squares fit of points, themeasurements being taken on the test sphere (8.4)

by a CMM (2.1) using fixed multiple styli (3.8) in the

-discrete-point probing (2.8) mode

9.17fixed multipte-stylus probing system

location errorMLerror of indication within which the range of centre

coordinates of a spherical material standard of size

(8.2) can be determined by a least-squares fit of

points, the measurements being taken on the test

sphere (8.4) by a CMM (2.1) using fixed multiplestyli (3.8) in the discrete-point probing (2.8) mode

9.48maximum permissible fixed multiple-stylus

probing -system form errorMPEMfi-extreme value of the fixed multiple-stylus probing

system form error MF (9.15) permitted by

specifications, regulations etc. for a CMM (2.1)

NOTE MPEMF can be specified by stylus length (4.5)

and stylus system (4.4).

9.19maximum permissible fixed muItiple-styl&s

probing system size errorMPEM,$

extreme value of the fixed multiple-stylus probing

system size error MS (9.16) permitted byspecifications, regulations etc. for a CMM (2.1)

NOTE MPEM~ maybe specified by stylus length (4.5)

and stylus system (4.4).

9.16erreur de taille du systeme de palpage A

stylets multiples fixes, fMSerreur d’indication a I’interieur de Iaquelle Ie diametred’un etalon materialise de taille (8.2), spherique,peut &tre determine par une association des moindrescarres des points mesures, Ies mesurages etanteffectues sur la sphere d’essai (8.4) par une MMT(2.1 ) utilisant des stylets multiples (3.8) fixes, enmode de palpage discret (2.8)

9.17erreur de position du systeme de palpage a

stylets multiples fixes, fMLerreur dindication a l’interieurde Iaquelle l’&endue descoordonnees du centre d’un etalon materialise detaille (8.2), spherique, peut ~tre determine par uneassociation des moindres carres des points mesurr%,Ies mesurages etant effectues sur la sphere d’essai(8,4) par une MMT (2.1 ) utilisant des stylets multiples(3.8) fixes, en mode de palpage discret (2.8)

9.18erreur maximale to16r6e de forme du

systeme de palpage A stylets multiiIesfixes, f

MPEMFvaleur extr~me de I’erreur de forme du systen$e de

palpage a stylets multiples fixes MF (9.15),autorisee par Ies specifications, r~glements, etc., pourune MMT (2.1)

NOTE MPEMF peut 6tre specifie par la Iongueur du

stylet (4.5) et Ie systbme de stytet (4.4).

9.19erreur maximaie toleree de taille du

systeme de palpage ~ stylets multiplesfixes, f

MPEMsvaleur extr~me de I’erreur de taille du ~ysteme de

palpage a stylets multiples fixes MS (9.16),autorisee par Ies specifications, reglements, etc., pourune MMT (2.1)

NOTE MPEM~ peut &re specifie par la Iongueur du

stylet (4.5) et Ie syst~me de stylet (4.4).

21

IS 15635 (Part 1) :2006ISO 10360-1:2000

9.20maximum permissible fixed multiple-st-ylus

probing system location errorMPEML

extreme value of the fixed multiple-stylus probing

system location error ML (9.17), permitted .byspecifications, regulations etc. for a CMM (2.1)

NOTE MPEML maybe specified by stylus length (4.5)

and styfus system (4.4).

9.21articulated probing system form errorAFerror of indication within -which the range of radii can

be determined hy a least-squares fit of pointsmeasured on a spherical material standard of size

(8.2), the measurements being taken .on the testsphere (8.4) by a CMM (2.1) using an articulatingprobing system (3.6) in the discrete-point probing(2.8) mode

9.22articulated probing system size errorASerror of indication within which the diameter of aspherical material standard of size (8.2) can bedetermined by a least-squares fit of points, themeasurements being taken on the test sphere (8.4)by a CMM (2.1) using an articulating probingsystem (3.6) in the discrete-point probing (2.8)mode

9.23articulated probing system location errorALerror of indication within which the range of centrecoordinates of a spherical material standard of size(8.2) can. be determined by a least-squares fit ofpoints, the measurements being taken on the testsphere (8.4) by a CMM (2.1) using an articulatingprobing system (3.6) in the discrete-point probing(2.8) mode

9.20erreur maximale toleree de position du

systeme de palpage a stylets multiplesfixes, f

MPEMLvaleur extr~me de I’erreur de position du systeme

de palpage h stylets multiples fixes ML (9.17),autorisee Dar Ies s~ecifications, recrlements, etc., Dourune MMT”(2.1)

NOTE ivlPEML peut &re specifie par

st ylet (4.5) et Ie systeme de stylet (4.4).

9.21

la Iongueur du

erreur de forme du systt?me de palpagearticule, f

AFerreur dindication a I’interieur de Iaquelle I’etendu.edes rayons peut &re determine par une associationdes moindres carres des points mesures sur unetalon materialise de taille (8.2), spherique, Iesmesurages etant effectues sur la sphere d’essai(8.4) par une MMT (2.1) utilisant un systeme depalpage articule (3.6) en mode de palpage discret(2.8)

9.22erreur de teille cIu systeme de palpage

articule, fASerreur d’indication a I’interieur de Iaquelle le diarnetred’un etalon materialise de taille (8.2), spherique,peut We determine par une association des moindrescarres des points mesures, Ies mesurages etanteffectues sur la sphere d’essai (8.4) par une MMT(2.1 ) utilisant un systeme de palpage articule (3.6)en mode de palpage discret (2.8)

9.23

erreur de position du systeme de palpage

atilcu16, fALerreur d’indication a I’interieur de Iaquelle l’%tenduedes coordonnees du centre d’un etalon materialisede taille (8.2), spherique, peut ~tre determine parune association des moindres carres des pointsmesures, Ies mesurages etant effectues sur la sphered’essai (8.4) par une MMT (2.1) utilisant un systemede palpage articule (3.6) en mode de palpage

discret (2.8)

22

IS 15635 (Part 1): 2006ISO 10360-1:2000

9.24maximum permissible articulated probing

system form errorMPEAFextreme value of the articulated probing systemform error AF (9.21) permitted by specifications,regulations etc. for a CMM (2.1)

NOTE MPEAF can be specified by probe extensionlength and styfus system (4.4).

9.25maximum permissible articulated probing

system size errorMPEA~extreme value of the articulated probing systemsize error AS (9.22) permitted by specifications,regulations etc. for a CMM (2.1)

NOTE MPEA.s can be specified by probe extensionlength and stylus system (4.4).

9.26maximum permissible articulated probing

system location errorMPEALextreme value of the articulated probing systemlocation error AL. (9.23) permitted by specifications,

regulations etc. for a CMM (2.1)

NOTE MPEAL can be specified by probe extension

length and stylus system (4.4).

10 Terms relating to features

10.1Gaussian associated featureleast-squares associated featureassociated feature for which the sum of the squares ofthe residuals is a minimum

11 Terms relating to software

11.1

parametrization of a featurechoice of algebraic variables to represent a feature

NOTE 1 The parametrization depends on the type offeature.

9.24erreur maximale to16ree de forme du

systbme de palpage articu16, fMPEAFvaleur extr~me de I’erreur de forme du systbme depalpage articule AF (9.21),autorisee pour Iesspecifications, reglementations, etc., pour une MMT(2.1)

NOTE MPEAF peut r3tre specifie par la Iongueur de la

rallonge du palpeur et Ie systeme de styfet (4.4).

9.25erreur maximale to16r6e de taille du

systbme de palpage articu16, fMPEASvaleur extrdme de I’erreur de taille du system,e depalpage articule AS (9.22),autorisee pour Iesspecifications, reglementations, etc., pour une MMT(2.1”)

NOTE MPEA.s peut &re specifi6 par la Iongueur de larallonge du palpeur et le systeme de stylet (4.4).

9.26erreur maximale to16r6e de position du

systbme de paipage articui6, fMPEALvaleur extr6me de I’erreur de position du systemede palpage articule AL (9.23),autorisee pour Iesspecifications, reglementations, etc., pour une “hlMT(2.1)

NOTE MPE~L peut &re specifi6 par la kmgueur de la

rallonge du palpeur et Ie systeme de stylet (4.4).

10 Termes relatifs aux elements

10.1eiement associe gaussien, mei6ment associe des moindres carres, melement associe pour Iequel la somme des carres desresidusest minimale

11 Termes relatifs auxlogiciels

11.1

parametrisation d’un eiement, fchoix de variables algebriques pour represented unelement

NOTE 1 La parametrisation depend du type cf’element.

23

IS 15635 {Part 1) :20061S010360-1 :2000

NOTE 2 For any specific type of feawre, a choice ofparametrization is not unique. Forexample, astraight line inthree dimensions or the axis of a cylinder or a cone can bespecified by either a point on the axis and the directioncosines of the axis, ortwopoints on the axis.

NOTE 3 For any specific type of feature, a choice ofparametrization can depend on the nature .of that feature,e.g., -according to whether a cone has a large or small apexangle.

11.2

reference data setdata set produced for the purposes of testing softwarefor fitting a Gaussian associated feature (10.1)

11.3

reference parameter valuesnumerical values of the parameters in the referenceparametrization (11 .4)for a particular referencedata set (1 1.2), produced by a testing body, to beused as a reference for comparison

11.4

reference parametrizationparametrization of a feature (11.1) used by thetesting body

NOTE The parameters within a reference para-metrization may be measures of location (in millimetres),orientation (direction cosines, dimensionless), size (inmillimetres), and angle (in radians).

I’I.5

reference residualresidual (1 1.7) associated with a reference data set(11.2)

11.6

referent-e softwaresoftware for computing reference parameter values(1 1.3) and reference residuals (1 1.5) of theGaussian associated feature (10.1 ) for a data set

11.7

residualminimum perpendicular distancefeature to a point in a data set

from an associated

NOTE For some associated features (e.g., a cylinder),a residual possesses a numerical sign, i.e., is positive ornegative, depending on which side of the feature thecorresponding data point lies. For other associated features(e.g., a line in three dimensions), the residual is unsigned.

NOTE 2 Pour tout type specifique d’element, un choix deparametrisation n’est pas unique. Par exemple, une Iignedroite en trois dimensions, ou I’axe d’un cylindre ou d’unc6ne peuvent ~tre definis soit par un point de I’axe et Iecosinus directeur de I’axe, soit par deux points de I’z+xe.

NOTE 3 Pour tout type specifique d’element, un choix deparametrisation peut dependre de la nature de cet element,par exemple selon qu’un c6ne a un grand ou un petit angleau sommet.

11.2

ensemble de donnees de rdference, mensemble de donnees fournies a des fins d’essai deIogiciel pour ajuster I’element associe gaussien (10.1 )

11.3

valeurs des parametres de r6f&ence, fvaleurs numeriques des parametres clans laparametrisation de reference (1 1.4) pour unensemble de donnees de reference (11 .2)particulier, produites par un corps d’essai, devant &treutilisees comme reference pour la comparison

11.4

parametrisation de reference, fparametrisation d’un ‘element (1 1.1) utilisee par Iecorps d’essai

NOTE Les parametres au sein de la -parametrisationde reference peuvent etre des mesures de position’ (enmillimetres), orientation (cosinus directeur, saris dimension),taille (en millimetres) et angle (en radians).

11.5

residu de reference, mresidu (11.7) associe avec un ensemble dedonnees de reference (1 1.2)

11.6

Iogiciel de reference, mIogiciel pour calculer Ies valeurs des parametres dereference (1 1.3) et Ies residus de n$ference (1 1.5)de I’element associe gaussien (10.1) pour unensemble de donnees

11.7

residu, mdistance perpendiculaire minimale d’un elementassocie a un point clans un ensemble de donnees

NOTE Pour quelques elements associ&s (par exempleun cylindre), un residu possede un signe numerique, c’est-a-dire positif ou negatif, dependant du cbte de I’ekment ouse trouve la donnee correspondante. Pour dautreselements associes (par exemple une Iigne en troisdimensions), Ie residu n’a pas de signe.

24

IS 15635 (Part 1) :2006ISO 10360-1:2000

11.8

conversion rulerule by which the numerical values of the parameters

in a test parametrization (11.11) are converted intonumerical values of the parameters in the referenceparametrization (11 .4)

11.8

regle de conversion, fregle par Iaquelle Ies valeurs numeriques desparametres clans une parametrisation d’t?ssai(11.11) sent converties en valeurs numeriques desparametres clans une parametrisation de reference(11.4)

NOTE The rule can be implemented in software,

NOTE La regle peut iXre appliquee par un Iogiciel.

11.9

converted test parameter valuesnumerical values of the parameters obtained byapplying a conversion rule to test parameter values(11.10)

NOTE No conversion is necessary if the softwareunder test uses the reference parametrization (11.4), inwhich case the test parameter values (11. 10) are identicalto the converted test parameter values.

11.10

test parameter valuesnumerical values of the parameters in a lestparametrization (11. 11) computed by software undertest

11.11

test parametrizationparametrization of a feature (11.1) used by softwareunder test

11.12

test residualresidual (1 1.7) computed by software under test

11.13

extent (of a data set)region of an associated feature sampled by points

NOTE The extent can be stated as follows.

a) The extent of a line in two or three dimensions is asegment of that line.

b) The extent of a plane is a rectangular region containedin that plane.

c) The extent of a circle in two or three dimensions is anarc of that circle.

d) The extent of a sphere is a patch of -that spheredefined by intervals of the angular parameters (6, q)expressed in spherical coordinates (p, 0, p), the originbeing the sphere’s centre.

11.9

valeurs converties des parametres d’essai, fvaleurs numeriques des parametres obtenues enappliquant une regle de conversion aux valeurs desparametres d’essai (11.1 O)

NOTE Aucune conversion n’est n6cessaire si IeIogiciel dessai utilise la parametrisation de r6f6rence(1 1.4), clans Iaquelle Ies valeure des parambtres d’esaai(1 1.1 O) sent identiques aux valeurs converties desparametres d’essai.

11.10

valeurs des parambtres d~essai, fvaleurs numeriques des parametres clans uneparametrisation d’essai (1 1.11) calcdees par unIogiciel soumis a essai

11.11

parametrisation d’essai, f ,,, ,

parametrisation d’un element (11.1) utilisee par unIogiciel soumis a essai

11.12

residu d’essai, m~esidu (1 1.7) calcule par un Iogiciel soumis a essai

11.13

extension (dsun ensemble de donn6es), fzone d’un element associe echantillonne par points

NOTE Uextensiop peut &re definie comme suit,

a) L’extension d’une Iigne en deux ou trois dimensionsest un segment de cette Iigne.

b) L’extension d’un plan est une zone rectangulairecontenue clans ce plan.

c) L’extension dun cercle en deux ou trois dimensionsest un arc de ce cercle.

d) L’extension d’une sphere est urre portion de cettesphere definie par intervalles de parametres angulaires(d, @ exprimes en coordonnees sphf%iques (p, 8, q),I’origine etant Ie centre de la sphere.

25

IS 15635 (Part 1) :2006ISO 10360-1:2000

e) The extent of a cylinder is a patch of that cylinderdefined by intervals of the angular and lengthparameters (6, :) expressed in cylindrical coordinates(r, 0, z), the z-axis being the axis of the cylinder.

f) The extent of a cone is a patch of that cone (notcontaining the vertex) defined by intervals of theangular and length parameters (8, Z) expressed incylindrical coordinates, (r, 6’, :), the ::axis being theaxis of the cone.

g) The extent of a torus is a patch of that torus defined byintervals of angular parameters (0, p). 0 is the angularparameter in cylindrical coordinates (r, 6, z), the :-axisbeing the axis of the torus. Given a point on the torus,p, a circle is defined by the intersection of the toruswith the half-plane containing p and having the torusaxis as its boundary. q is defined as the angle betweenthe direction from the torus centre to this circle centreand the vector from this circle centre to p.

11.14

reference pair

(testing) reference data set (1 1.2) and thecorresponding reference parameter values (11 .3)

e)

f)

9)

L’extension d’un cylindre est une portion de ce cylindredefinie par intervalles de parametres angulaires et deIongueur (8, Z) exprimes en coordonn6es cylindriques(r, 0, z), I’axedes z etant I’axe du cylindre.

I_’extension d’un c6ne est une portion de ce c6ne (necontenant pas Ie sommet) d6finie par intervalles deparambtres angulaires et de Iangueur (19,Z) exprimesen, coordonn6es cylindriques (r, 0, z), I’axe des z etantI’axe du cbne.

I-’extension d’un tore est une portion de ce tore d&iniepar intervalles de parametres angulaires (0, q). 8 est Ieparametre angulaire en coordonnees cylindriques (r, 0,z), I’axedes z etant I’axe du tore. Soit un point, p, sur Ietore, un cercle est d&ini par I’intersection du tore et Iedemi-plan contenant p et ayant I’axe du tore commeIimite. p est defini comme I’angle entre la direction ducentre du tore a ce centre de cercle et Ie vecteur de cecentre de cercle a p.

11.14

paire de references, f

(essak) ensemble de donnees de reference (1 1.2)et Ies valeurs des parametres de reference (11,3)correspondantes

.

26

IS 15635 (Part 1) :2006ISO 10360-1:2000

Annex A

(informative)

Destiiption of CNtM types

A.1 Fixed table cantilever CMM

A.1.1 This is a CMM employing three componentsmoving along guideways perpendicular to oneanother, with the probing system attached to the firstcomponent, which is carried on, and moves verticallyin rekationto, the second.

A.f.2 The combined assembly of the first andsecond components moves horizontally relative to thethird.

A.1.3 The third component is supported at one endonly, cantilever fashion, and moves horizontallyrelative to the machine base, on which the workpieceis supported.

See Figure Al.

Schematic diagramDiagramme schematique

Annexe A

(informative)

Description des typ~ de MMT

A.1 MMT COI de cygne a plateau fixe

A.1.1 Cest une MMT utilisant trois parties mobilesse deplaqant chacune Ie long de glissieresperpendiculaires entre elles; Ie systeme de palpageest fixe solidairement a la premiere partie qui sedeplace verticalement suivant la deuxieme.

A.1.2 L’assemblage compose des premiere etdeuxieme parties se deplace horizontalement suivantla troisieme.

A.1.3 La troisieme partie n’est maintenue qu’a uneseule extremite, de type COI de cygne, -et se deplacehorizontalement suivant Ie plan de travail de lamachine; la piece est posee sur Ie plan de travail dela machine.

Voir Figure A.1.

NOTE The indicated directions are given for information NOTE Les directions indiquees scmt donnees pouronly. Other approaches exist. information seulement. Dautres approches existent.

Figure A.1 — Fixed table cantilever CMM

Figure A.1 — MMT COIde cygne a plateau fixe

27

IS 15635 (Pad 1) :2006ISO 10360-1:2000

A.2 Moving bridge CMM

A.2.1 This is a CMM employing three componentsmoving along guideways perpendicular to oneanother, with the probing system attached to the firstcomponent, which is carried on, and moves verticallyin rqlation to, the second.

A.2.2 The combined assembly of the first andsecond components moves horizontally relative to thethird.

A.2.3 The third component is supported on two legs-which descend on opposite sides of the machinebase, and moves horizontally relative to the base, onwhich the workpiece is supported.

See Figure A.2.

Schematic diagramDiagramme schematique

A.2 MMT a portique mobile

A.2.1 Cest une MMT utilisant trois parties mobilesse deplagant chacune Ie long de glissieresperpendiculaires entre elles; Ie systeme de palpageest fixd solidairement a la premiere partie qui seddplace verticalement suivant la deuxieme.

A.2.2 L’assemblage compose des premiere etdeuxibme parties se deplace horizontalement suivantla troisibme.

A.2.3 La troisieme partie est maintenue par deuxmontanta qui se trouvent sur deux c6t& opposes duplan de travail de la machine; la piece est posee surIe plan de travail de la machine.

Voir Figure A.2.

ExampleExemple

NOTE The indicated directions are given for informationonly. Other approaches exist.

NOTE Les directions indiquees sent donnbes pourinformation seulement. D’autres approches existent.

Figure A.2 — Moving bridge CMM

Figure A.2 — MMT a portique mobile

28

IS 15635 (Part 1) :2006ISO 10360-1:2000

A.3 Gantry CMM

A.3.1 This is a CMM employing three componentsmoving along guideways perpendicular to oneanother, with the probing system attached to the firstcomponent, which is carried on, and moves verticallyin relationto, the second.

A.3.2 The combined assembly of the first andsecond components moves horizontally relative to thethird.

A.3.3 The third component moves horizontally ontwo guide rails raised on either side above themachine base on which the workpiece.is supported.

See Figure A.3.

Schematic diagramDiagramme schematique

A.3 MMT pent

A.3.1 C’est une MMT utilisant trois parties mobilesse depla~ant chacune Ie long de glissieresperpendiculaires entre elles; Ie systbme de palpageest fixe solidairement ~ la premiere partie qui sed6place verticalement suivant la deuxibme.

A.3.2 L’assemblage compos6 des premiere etdeuxieme parties se deplace horizontalement suivantla troisibme.

A.3.3 La troisieme partie se ddplace horizon-talement sur deux rails surplombant de chaque c6te Ieplan de travail de la machine; la pibce est pos6e surIe plan de travail de la machine.

Voir Figure A.3.

ExampleExemple

NOTE The indicated directions are given for information NOTE Les directions indiquees sent donnees pouronly. Other approaches exist. information seulement. Dautres approches existent.

Figure A.3 — Gantry CMM

Figure A.3 — MMT pent

29

IS 15635 (Part 1) :2006ISO 10360-1:2000

A.4 L-shaped bridge CMM

A.4.1 This is a CMM employing three components.

moving along guideways perpendicular to oneanother, with the probing system attached to the first

component, which is carried on, and moves vertically

in relation to, the second.

A.4.2 The combined assembly of the first andsecond components moves horizontally relative to thethird.

A.4.3 The third component moves horizontally ontwo guide ways, one at the machine-base level or

below, the other raised above the base, on which the

workpiece is supported.

See Figure A.4.

Schematic diagramDiagramme schematique

NOTE The indicated directions are given for informationonly. Other approaches exist,

A.4 MMT a portique en L

A.4.1 Cest une MMT utiiisant trois parties mobilesse deplagant chacune Ie long de glissieresperpendiculaires entre elles; Ie systime de palpageest fixe solidairement a la premiere partie qui sedeplace verticalement suivant la deuxieme.

A.4.2 L’assemblage compose des premiere etdeuxieme parties se deplace horizontalement suivantla troisieme.

A.4.3 La troisieme partie se deplace horizon-talement sur deux rails, I’un au niveau ou en dessousdu plan de travail, I’autre surplombant Ie plan detravail; la piece est posee sur Ie plan de travail de lamachine.

Voir Figure A.4.

ExampleExemple

<

NOTE Les directions indiauees sent donnees Dourinformation seulement. D’autres approches existent. ‘

Figure A.4 — L-shaped bridge CMM

Figure A.4 — MMT a portique en L

30

..——— ———- —— --.. Q_ ———

A.5 Fixed bridge CMM

A.5.1 This is a CMM employing three componentsmoving along guideways perpendicular to oneanother, with the probing system attached to the firstcomponent, which is carried on, and moves verticallyin relation to, the second.

A.5:2 The combined assembly of the first andsecond components moves horizontally along abridge structure above, and rigidly attached at eachend of, the machine base, with the workpiecemounted on the third component.

See Figure A.5.

Schematic diagramDiagramme schematique

IS 15635 (Part 1) :2006ISO 10360-1:2000

A.5 MMT a portique fixe

A.5.1 C.est une MMT utilisant trois parties mobilesse deplagant chacune Ie long de glissieresperpendiculaires entre elles; Ie systeme de palpageest fixe solidairement a la premiere partie qui sedeplace verticalement suivant la deuxieme.

A.5.2 L’assemblage compose des premiere etdeuxieme parties se deplace horizontalement suivantune structure en pent, placee au dessus du plan detravail et fixee rigidement a chaque extFemite a ceplan; la pibce est posee sur la troisieme partie.

Voir Figure A.5.

ExampleExemple

NOTE The indicated directions are given for informationonly. Other approaches exist.

NOTE Les directions indiquees sent donnaes pourinformation seulement. Dautres approches existent.

Figure -A.5 — Fixed bridge CMM

Figure A.5 — MMT a portique fixe

31

IS 15635 (Part 1) :20061s0 10360-1:2000

A.6 Moving table cantilever CMM

A.6.1 This is a CMM employing three componentsmoving along guideways perpendicular to oneanother, with the probing system attached to the firstcomponent, which moves vertically in relation to thesecond.

A.6.2 The second component is supported at oneend only, cantilever fashion, and moves horizontallyrelative to the machine base.

A.6.3 The third component moves horizontallyrelative to the machine base and the workpiece ismounted on the third component.

See Figure A.6.

Schematic diagramDiagramme schematique

NOTE The indicated directions are given for informationonly. Other approaches exist.

A.6 MMT COI de cygne a plateau mobile

A.6.1 C’est une MMT utilisant trois parties mobilesse ddplaqant chacune te long de glissieresperpendiculaires entre elles; Ie systtrme de palpageest fix6 solidairement a la premiere partie qui seddplace verticalement suivant la deuxieme.

A.6.2 La deuxieme partie n’est maintenue que parune extremit6, de type coi de cygne, et se deplacehorizontalement suivant Ie plan de travail de lamachine.

A.6.3 La troisieme partie se ddplace horizon-talement suivant Ie plan de travail de la machine; lapiece est pos6e sur la troisieme partie.

Voir Figure A.6.

ExampleExemple

NOTE Les directions indiquees sent donn6es pourinformation seulement. D’autres approches existent.

Figure A.6 — Moving table cantilever CMM

Figure A.6 — MMT cot de cygne ~ plateau mobile

32

IS 15635 (Part 1) :2006ISO 10360-1:2000

A.7 Column CMM

A.7.1 This is a CMM employing two movablecomponents, with the probing system attached to thefirst, which moves vertically relative to the machinebase.

A.7.2 The second component is mounted on andmoves along a horizontal plane relative to themachine base, while the workpiece is mounted on thiscomponent.

See Figure A.7.

Schematic diagramDiagramme schematique

A.7 MMT a colonne

A.7.I C’est une MMT utilisant deux parties mobiles;Ie systbme de palpage est fixe solidairement a lapremiere partie qui se deplace verticalement suivantplan de travail de la machine.

A.7.2 La seconde partie est montee sur Ie plan detravail de la machine et se ddplace clans un planhorizontal suivant ce plan; la piece est posee sur ladeuxieme partie.

Voir Figure A.7.

ExampleExemple

NOTE The indicated directions are given for information NOTE Les directions indiquees sent donn6es pour

only. Other approaches exist. information seulement. O’autres approches existent.

Figure A.7 — Column CMM

Figure A.7 — ‘MMT ~ colonne

33

IS 15635 (Part 1) :2006ISO 10360-1:2000

A.8 lWoving ram horizontal-arm CMM

A.8.1 This is a CMM employing three componentsmoving along guideways perpendicular to one

another, with the probing system attached to the firstcomponent, which is carried on, and moveshorizontally in relation to, the second.

A.8.2 The combined assembly of the first andsecond components moves vertically relative to thethird.

A.8.3 The third component moves horizontallyrelative to the machine base, on which the workpieceis mounted.

See Figure A.E3.

Schematic diagramDiagramme schematique

A.8 MMT a bras horizontal mobile(trusquin)

A.8.1 C’est une MMT utilisanttrois parties mobilesse deplaqzmt chacune Ie long de glissieresperpendiculaires entre elles; Ie systeme de palpageest fixe solidairement a la premiere partie qui sedeplace horizontalement suivant la deuxieme.

A.8,2 L’assemblage compose des premiere etdeuxieme parties se deplace verticalement suivant latroisieme.

A.8.3 La troisieme partie se deplace horizon-talement suivant Ie plan de travail de la machine; lapiece est pos4e sur Ie plan de travail de la machine.

Voir Figure A.8.

ExampleExemple

NOTE The indicated directions are given for information NOTE Les directions indiquees sent donnees pouronly. Other approaches exist. information seulement. Dautres approches existent.

Figure A.8 — Moving ram horizontal-arm CMM

Wqure A.8 — MMT a bras horizontal mobile (trusquin)

34

IS 15635 (Part 1) :2006ISO 10360-1:2000

A.9 Fixed table horizontal-arm CMM

A.9.1 This is a CMM employing three componentsmoving along guideways perpendicular to oneanother, with the probing system attached to the firstcomponent, which is supported horizontally at oneend only, cantilever fashion, and moves vertically inrelatlon to the second.

A.9.2 The second component moves horizontallyrelative to the third.

A.9.3 The third component moves horizontallyrelative to the machine base, on which the workpieceIS mounted.

See Figure A.9 a).

A.9.4 An alternate machine configuration is onewhere a rotary table is mounted on the machine base,

Its axis vertical. In this case the woFk piece is mounted

on the rotary table. This illustrates how rotary tables

can be configured on measuring machines. All of the

other machines shawn could also be equipped withrotary tables.

See Figure A.9 b).

A.9 MMT a bras hQriZO13ta[ a plateau fixe

A.9.1 Cest une MMT utilisant trois parties mobilesse depla~ant chacune Ie long de glissieresperpendiculaires entre elles; Ie systeme de palpageest fixe solidairement a la premiere partie qui n’estmaintenue horizontalement que par une extremite, detype COI de cygne, et qui se deplace verticalementsuivant la deuxieme.

A.9.2 La deuxieme partie se deplace horizon-talement suivant la troisieme.

A.9.3 La troisieme partie se deplace horizon-taiement suivant Ie plan de travail de la machine; la-piece est posee sur Ie plan de travail de la machine.

Voir Figure A.9 a).

A.9.4 Une alternative de cette configurationcorrsiste en un plateau tournant monte sur Ie plan detravail, son axe etant vertical. Dans ce cas, la pieceest posee sur Ie plateau tournant. Cet exemple a pourbut de montrer comment Ies plateaux tournantspeuvent @tre-configures sur Ies machines a mesurer.Toutes Ies autres machines representees pourraientegalement 6tre equipees de plateaux tournants.

VoirFigure A.9 b).

,,

35

IS 15635 (Part 1) :2006ISO 10360-1: 200(1

Schematic diagramDiagramme schematique

Schematic diagramDiagramme sch6matique

&/+\&/--

x

b)

ExampleExemple

a)

ExampleExemple

b)

NOTE The indicated directions are given for information NOTE Les directions indiqueesonly. Other approaches exist. information seulement. Dautres approches existent,

sent donn6es pour

Figure A.9 — Fixed table horizontal-arm CMM

Figure A.9 — MMT h bras horizontal 21plateau fixe

36

IS 15635 (Part 1) :2006ISO 10360-1:2000

A.1 O Moving table horizontal-arm CMM A.1 O MMT a bras horizontal a plateaumobile

A.1 0.1 This is a CMM employing three componentsmoving along guideways perpendicular to one

another, with the probing system attached to the firstcomponent, which is supported horizontally at one

end only, cantilever fashion, and is carried on, and

moves vertically in relation to, the second.

A.1 0.2 The combined assembly of the first, secondand third components moves horizontally relative tothe -machine base, with the workpiece mounted on thethird component.

See Figure A. IO.

Schematic-diagramDiagramme schematique

NOTE The indicated dkections are given for informationonly. Other approaches exist.

A.1 0.1 Cest une MMT utilisant trois parties mobilesse depla$ant chacune Ie long de glissieresperpendiculaires entre elles; Ie systeme de palpageest fixe solidairement a la premiere partie qui n’estmaintenue horizontalement que par une extremite, detype COI de cygne, et qui se ddplace verticalementsuivant la deuxieme.

A.1 0.2 L’assemblage compose des premiere etdeuxieme parties et la troisieme partie se deplacenthotizontalement suivant le plan de travail de lamachine; la piece est posee.sur la troisieme partie.

Voir Figure A.I-O,

ExampleExemple

NOTE Les directions indiquees sent donn6es pourinformation seulement. D’autres approches existent.

Figure A.1O — Moving table horizontal-arm CMM

Figure A.fO — MMT a bras horizontal a plateau mobile

37

IS 15635 (Part 1) :2006ISO 10360-1:2000

Annex B(informative)

.

Relation to the GPS matrix model

For full details about the GPS matrix model see

lSO/lR 14638.

B.1 Information about this part of

ISO 10360 and its use

This part of ISO 10360 establishes a vocabulary tor

coordinate measuring machines (CMM), and theiracceptance and reverification tests.

B.2 Position in the GPS matrix model

This part of ISO 10360 is a General GPS standard,which influences the chain link 5 of the chains of

standards on size, distance, radius, angle, form,orientation, location, run-out and datums in the

general G PS matrix, as graphically illustrated inFigure B.1.

B.3 Related standards

The related standards are those of the chains ofstandards indicated in Figure B.1.

Annexe B(informative)

Relation avec la matrice GPS

Pour de plus amples renseignements a propos decette matrice, voir l’lSOflR 14638.

B.1 Information sur la presente partie de1’1S0 10360 et son utilisation

La presente partie de 1’1S0 10360 &ablit un vocabu-Iaire relatif aux machines a mesurer tridimensionnelles(MMT) eta Ieurs essais de r6ception et de verificationperiodique.

B.2 Situation clans la matrice GPS

La presente partie de I’ISO 10360 est une norme GPSgenerale, qui influence Ie maillon 5 des chalnes denormes relatives a la taille, la distance, Ie rayon,I’angle, la forme, I’orientation, la position, Ie batternentet Ies references clans la matrice GPS gen&ale,comme illustre a la Figure B.1.

B.3 Normes associees

Les normes associees sent celles des chaines denormes indiquees a la Figure B.1.

38

IS 15635 (Part 1) :2006ISO 10360-1:2000

.

Fundamental

GPS

standards

NormeaGPS

de base

! Global GPS etandarde 11 General GPS standards II Chain link number\ 1

Size I I I I

Dk3tance

Radius

Angle

Form of line independent of datum

dependent on datumb of— line—I Form of surface independent of datum 1111

Form of sutiace dependent on datum

.Orientationi{

Location4

Circular run-out

Total run-out

Datums IRoughness profile IWaviness Drofile I\Primaty profile ISurface imperfections

Figure B.1

.,

I Normes GPS globales 1

.—..- 1 I I [Distance I

Rayon I I I IAngle

Forme d’une Iigne independante d’une r~ference

Forme d’une Iigne dependante d’une reference

Forme d’une surface independante d’une reference

Forme d’une surface dependante dune reference I I I IOrientation

Position I I I IBattement circulaire

Battement total P

References @;.f&c@fl

Profil de rugosite

Profil d’undulation

Profil primaire

“Imperfections de surface

Ar&es

Figure 6.1

39

IS 15635 (Part 1): 20061S010360-1 :2000

Bibliography Bibliographic

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ISO 8402:1994, Quality management and qualityassurance— Vocabulary.

1S0 14253-1:1998, Geometric/ Product Specifi-cations (GPS) — Inspection by measurementof workplaces and measuring instruments —Part 1: Decision rules for proving conformanceor non-conformance with specification.

lSO/TR 14638:1995, Geometrical ProductSpecification (GPS) — Masterplan.

ISO 14660-1:1999, Geometrical-Product Specifi-cations (GPS) — Geometrical features — Part 1:General terms and definitions.

ISO 14660-2:1999, Geometrical Product Specifi-cations (GPS) — Geometrical features — Part 2:Extracted median line of a cylinder and a cone,extracted median surface, local size of anextracted feature.

International Vocabulary of Basic and GeneralTerms in Metrology (VIM). BIPM, IEC, IFCC,ISO, IUPAC, IUPAI?, OIML, 2nd edition, 1993.

Guide to the expression of uncertainty inmeasurement (GUM). 61PM, IEC, IFCC, ISO,IUPAC, IUPAP, first edition, 1993.

BS 6808-1:1987, CMMS — Part 1: Glossary ofterms.

ASME B89.1.12M:1 990, Methods for performanceevaluation of CMAA.

EA-1 0/05:19951), Coordinate measuring machinecalibration. Issued in January 1995 by theEuropean cooperation for Acc~editation ofLaboratories (EA).

1) Previously released as EAL-G17.

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ISO 8402:1994, Management de /a qua/ite etassurance de la qualite — Vocabulaire.

ISO 14253-1:1998, Specification geometriquedes produits (GPS) — Verification par la mesuredes p$ces et des equipments de mesure —Partie 1: R&g/es de decision pour prouverla conformity ou la non-conformity 2 laspecification.

lSO/TR 14638:1995, Specification geometriquedes produits (GPS) — Schema directeur.

ISO 14660-1:1999,Specification geometriquedes produits (GPS) — Elements geometriques —Partie 1: Termes generaux et definitions.

ISO 14660-2:.1999, Specification geometriquedes produits (GPS) — Elements geometriques —Partie 2: Ligne mediane extraite dun cylindre etdun the, surface mediane extraite, taille localed’un element extrait.

Vocabulaire international des termes fondamen-taux et generaux de m&rologie (VIM). 61PM,CEI, FICC, ISO, OIML, UICPA, UIPPA, 2e edition,1993.

Guide pour /’expression de /’incertitude demesure (GUM), 1‘eedition, 1995.

BS 6808-1:1987, CMMS — Part 1: Glossary ofterms.

ASME B89.1.12M:I 990, Methods for performanceevaluation of CMMS.

[1O]EA-10/05: 19951), Coordinate measuring machinecalibration. Public en janvier 1995 par Europeancooperation for Accreditation of Laboratories(EA).

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ts 15635 (Part 1) :2006 IISO 10360-1:2000

Index

A

acceptance test (of a CMM)(2.17) 7

actual contact point (2.15) 6articulated probing system form

error (9.21) 22articulated probing system location

error (9.23) 22articulated probing system size

error (9.22) 22articulating probing system

(3.6) 9axial four-axis error (9.7) 19

B

back off distance (6.3) T3

c

contacting probing system(3.2) 8

conversion rule (11 .8) 25converted test parameter values

(11.9) 25coordinate measurement (2.2) 1coordinate measuring machine

(CMM) (2.1) 1corrected measured point

(2.13) 5corrected scan ”line (7.3) 14corrected scan point (7.1 ) 14

D

discrete-point probing (2.8) 2discrete-point probing speed

(6.1) 13

E

error of indication of a CMM for.sizemeasurement (9.1) 15

extent (of a data set) (11.13) 25

F

fixed multiple-stylus probing systemform error (9.1 5) 20

fixed multiple-stylus probing systemlocation error (9.1 7) 21

fixed multiple-stylus probing systemsize error (9.16) 21

G

Gaussian associated feature(10.1) 23

Gaussian radial distance (2.20)

H

high point density (of a CMM)(7.8) 14

hysteresis (2.22) 8

I

indicated measured point(2.12) 5

interim check (of a CMM) (2.19)intermediate point (2.1 1) 2

L

least-squares associated feature(10.1) 23

low point density (of a CMM)(7.9) 15

7

7

M

machine coordinate system(2.5) 2

material standard (8.1 ) 15material standard of size (8.2) 15maximum permissible articulated

probing system form error(9.24) 23

maximum permissible articulatedprobing system location err