miniature signal relays ec2 series (dip type) ee2 series

52
Document No. 0170EMDD03VOL01E Date Published July 2002 P Printed in Japan MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES (SMD TYPE) TECHNICAL DATA

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Page 1: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

Document No. 0170EMDD03VOL01EDate Published July 2002 PPrinted in Japan

MINIATURE SIGNAL RELAYS

EC2 SERIES (DIP TYPE)EE2 SERIES (SMD TYPE)

TECHNICAL DATA

Page 2: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

MINIATURE SIGNAL RELAYS

EC2 SERIES (DIP TYPE)EE2 SERIES (SMD TYPE)

TECHNICAL DATA

Page 3: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

No part of th is document may be copied or reproduced in any form or by any means wi thout theprior written consent of NEC/TOKIN Corporation. NEC/TOKIN Corporation assumes no resposibil i tyfor any errors which may appear in th is document.

NEC/TOKIN Corporat ion does not assume any l iabi l i ty for infr ingement of patents, copyr ights orother intellectual property rights of third parties by or arising from use of a device described hereino r any o the r l i ab i l i t y a r i s ing f rom use o f such dev ice . No l i cense , e i the r exp ress , imp l ied o rotherwise, is granted under any patents, copyr ights or other in te l lectual proper ty r ights of NEC/TOKIN Corporat ion or o thers.

While NEC/TOKIN Corporat ion has been making cont inuous effort to enhance the rel iabi l i ty of i tse l e c t r o n i c components, the possibi l i ty of defects cannot be el iminated entirely. To minimize risksof damage or injury to persons or property arising from a defect in an NEC/TOKIN electronic component,customers must incorporate suf f ic ient safety measures in i ts des ign, such as redundancy, f i re-containment, and ant i - fa i lure features. NEC/TOKIN devices are classified into the fol lowing threequal i ty grades:" S t a n d a r d , " " S p e c i a l , " a n d " S p e c i f i c " . T h e S p e c i f i c q u a l i t y g r a d e a p p l i e s o n l y t o d e v i c e sd e v e l o p e d b a s e d o n a c u s t o m e r d e s i g n a t e d " q u a l i t y a s s u r a n c e p r o g r a m " f o r a s p e c i f i capp l ica t ion . The recommended applications of a device depend on its quality grade, as indicatedbe low. Customers must check the qua l i t y g rade o f each dev ice be fore us ing i t in a par t i cu la rapp l ica t ion . S tandard : Computers , o f f i ce equ ipment , communica t ions equ ipment , tes t and measurement equipment, audio and visual equipment, home electronic appl iances, machine tools, personal electronic equipment and industr ial robots Special: Transportat ion equipment (automobi les, t ra ins, ships, etc.) , t raf f ic control systems, a n t i - d i s a s t e r s y s t e m s , a n t i - c r i m e s y s t e m s , s a f e t y e q u i p m e n t a n d m e d i c a l equ ipment (no t speci f ical ly designed for l i fe support) Spec i f i c : A i r c ra f t s , ae rospace equ ipment , submers ib le repea te rs , nuc lea r reac to r con t ro l systems, l i fe support systems or medical equipment for l i fe support , etc.The quality grade of NEC/TOKIN devices is "Standard" unless otherwise specif ied in NEC/TOKIN’sData Sheets or Data Books. I f customers intend to use NEC/TOKIN devices for appl icat ions otherthan those specified for Standard quality grade, they should contact an NEC/TOKIN sales representativein advance.

(Note)(1) "NEC/TOKIN" as used in th is s ta tement means NEC/TOKIN Corpora t ion and a lso inc ludes i t s ma jo r i t y -owned subsid iar ies.(2) "NEC/TOKIN electronic component products" means any electronic component product developed or manufactured by or for NEC/TOKIN (as def ined above). DE0202

Page 4: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

- i -

CONTENTS

1. Preface ........................................................................................................................................... 1

2. Structure ........................................................................................................................................ 2

3. Basic Characteristics ................................................................................................................... 33.1 Switching power ..................................................................................................................................... 3

3.2 Life curve ................................................................................................................................................ 3

3.3 Maximum coil voltage ............................................................................................................................. 4

3.4 Coil temperature rise .............................................................................................................................. 4

3.5 Driving power vs. timing ......................................................................................................................... 5

3.6 Driving pulse width vs. set & reset voltages ........................................................................................... 6

3.7 Thermal characteristics .......................................................................................................................... 7

3.8 Magnetic interference ............................................................................................................................. 8

3.9 High-frequency characteristics ............................................................................................................... 9

3.10 Coil inductance ....................................................................................................................................... 103.10.1 Measurement by LCR meter .................................................................................................... 103.10.2 Measurement by coil current waveform ................................................................................... 10

3.11 Capacitance ........................................................................................................................................... 11

3.12 Resistance to surge voltage ................................................................................................................... 12

3.13 Current surge interrupt test .................................................................................................................... 13

3.14 Resistance to carrying current ................................................................................................................ 13

4. Distribution of Characteristics .................................................................................................... 144.1 Operate & release voltages (set & reset voltages) ................................................................................. 14

4.2 Operate & release times (set & reset times) .......................................................................................... 15

4.3 Transfer time .......................................................................................................................................... 16

4.4 Timing and details .................................................................................................................................. 17

4.5 Contact resistance.................................................................................................................................. 21

4.6 Breakdown voltage ................................................................................................................................. 22

4.7 Thermal Electromotive Force (EMF) (offset voltage between contacts) ................................................ 22

5. Test Data ....................................................................................................................................... 235.1 Environmental tests ................................................................................................................................ 24

5.1.1 High-temperature test ................................................................................................................. 245.1.2 Low-temperature test ................................................................................................................. 275.1.3 Moisture resistance test ............................................................................................................. 295.1.4 Heat shock test ........................................................................................................................... 315.1.5 Vibration test .............................................................................................................................. 335.1.6 Shock test ................................................................................................................................... 355.1.7 Resistance to solder heat test (only EC2 series) ....................................................................... 375.1.8 Resistance to reflow solder heat test (only EE2 series) ............................................................. 385.1.9 Terminal strength test (only EC2 series) .................................................................................... 40

Page 5: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

- ii -

5.2 Contact life tests ..................................................................................................................................... 415.2.1 Non-load test A (Mechanical life test, Ta = 25˚C) ....................................................................... 415.2.2 Non-load test B (Mechanical life test, Ta = 85˚C) ....................................................................... 425.2.3 Resistive load test A (10 m Vdc, 10 µA, Ta = 25˚C) ................................................................... 425.2.4 Resistive load test B (10 Vdc, 10 mA, Ta = 85˚C) ...................................................................... 435.2.5 Resistive load test C (28 Vdc, 100 mA, Ta = 85˚C) .................................................................... 435.2.6 Resistive load test D (50 Vdc, 100 mA, Ta = 25˚C) .................................................................... 445.2.7 Resistive load test E (50 Vdc, 100 mA, Ta = 85˚C) .................................................................... 445.2.8 Inductive load test (48 Vdc, 110 mA, Ta = 25˚C) ........................................................................ 455.2.9 Resistive load test F (220 Vdc, 0.14 A, Ta = 25˚C) .................................................................... 455.2.10 Resistive load test G (125 Vdc, 0.5 A, Ta = 25˚C) ...................................................................... 465.2.11 Resistive load test H (30 Vdc, 1 A, Ta = 25˚C) ........................................................................... 46

Page 6: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

1

1. PrefaceMiniature signal relays are used in a wide range of application fields including communication, measurement, and

factory automation. This document gives the basic characteristics and test data of NEC’s EC2 and EE2 series

miniature signal relays.

Notes 1. The symbol shown in the graphs throughout this document indicates the maximum value of the data.

Likewise, indicates the minimum value, and indicates the mean value.

2. When a relay is driven by an IC, a protective element such as a diode may be connected in parallel

with the relay coil to protect the IC from damage caused by the counter-electromotive force (EMF) due

to the inductance of the coil. However, unless otherwise specified, the operate time and release time

(set and reset times) shown in this document are measured without such a protective element.

Diode

Power Supply

Relay Coil

Tr

For Right Use of Miniature Relays

DO NOT EXCEED MAXIMUM RATINGS.

Do not use relays under exceeding conditions such as over ambient temperature, over voltage and over

current. Incorrect use could result in abnormal heating, damage to related parts or cause burning.

READ CAUTIONS IN THE SELECTION GUIDE.

Read the cautions described in NEC/TOKIN’s “Miniature Relays” (0123EMDD03VOL01E) when you choose

relays for your application.

Page 7: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

2

2. StructureFigure 2.1 shows the structures of the EC2 and the EE2 series relays. EC2 series relay has a terminal configuration

called dual in-line leads (DIL), and EE2 series relay has a resistibility to solder heat, and a terminal configuration that

conforms to surface mounting. Table 2.1 lists the parts constituting relay.

EC2 series and EE2 series relays have a common structure except difference of a terminal configuration and some

parts.

1

2

6

4

10

7

1112

138

9

5

3

14

1

14

[EC2 series]

[EE2 series]

Figure 2.1 Structure of the EC2/EE2 Series Relay

Table 2.1 Parts of EC2/EE2 Series Relay

No. PartsMaterial

EC2 Series EE2 Series

1 Cover Polybutylene telephthalate* Liquid crystalline polymer*

2 Base Liquid crystalline polymer*

3 Base pad Liquid crystalline polymer*

4 Coil wire Polyurethane copper wire

5 Coil spool Polyphenylene sulfide#

6 Core Pure iron

7 Terminal Phosphor bronze (surface is treated with preparatory solder)

8 Moving contact Au-alloy + AgNi*

9 Stationary contact Au-alloy + AgNi*

10 Contact spring Phosphor bronze

11 Armature Pure iron

12 Armature block mold Polyethersulfone Liquid crystallene polymer

13 Magnet Cobalt magnet

14 Sealing material Epoxy resin

Note: *: Standard type

#: Conforms to UL94V-0

Page 8: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

3

3. Basic CharacteristicsThis section provides data necessary for designing an external circuit that uses the relay.

EC2 and EE2 series relays are designed with common specifications. So, this section shows common

characteristics of EC2 and EE2 series.

3.1 Switching powerIf the contact load voltage and current of the relay are in the region enclosed by the solid and dotted lines in the

figure below, the relay can perform stable switching operation. If the relay is used at a voltage or current exceeding

this region, the life of the contacts may be significantly shortened.

2.0

1.0

0.5

0.2

20 30 50 100 200 250

0.25 A

0.136 A

220 V

DC Resistive Load

AC Resistive Load

Load

Cur

rent

(A

)

Load Voltage (V)

Figure 3.1 Switching Power

3.2 Life curveThe life expectancy of the relay can be roughly estimated from the switching voltage and current of the contact

load shown in Figure 3.2.

200

100

50

20

10

0 0.5 1.0

Life

(×1

04 op

erat

ions

)

Switching Current (A)

30 Vdc Resistive Load

125 Vac Resistive Load

Figure 3.2 Life Curve

Page 9: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

4

3.3 Maximum coil voltageFigure 3.3 shows the ratio of maximum voltage that can be continuously applied to the coil of the relay to the nominal

voltage. As long as the relay is used in the enclosed region in this figure, the coil is not damaged due to burning

and the coil temperature does not rise to an abnormally high level.

150

100

0 –40 –20 0 20 40 60 80 100

85˚C

(Rated of decrease in maximum voltage: 50%/45˚C)

(* Rated Coil Voltage: 3 to 24 Vdc)

Rat

io o

f max

imum

app

lied

volta

geto

nom

inal

vol

tage

(%

)

Ambient temperature (˚C)

Figure 3.3 Maximum Voltage Applied to Coil

3.4 Coil temperature riseFigure 3.4 shows the relation between the rise in coil temperature and the power (product of the coil voltage and

current) dissipated by the coil. This figure shows the difference between the temperature before the power is applied

to the coil and the saturated temperature after application of power to the coil.

Tem

pera

ture

Ris

e (˚

C)

Applied Power (mW)

60

50

40

30

20

10

0 100 200 300 400

2 A

0 A

Carrying Current

Figure 3.4 Coil Temperature Rise

Page 10: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

5

3.5 Driving power vs. timingFigure 3.5 (1) shows the relations among the power applied to drive the relay, the operate time, and the bounce

time. Figure 3.5 (2) shows the relations among the supplied power, the release time, and the bounce time, and Figure

3.5 (3) shows the relations among the supplied power, the release time, and the bounce time when a diode is not

connected to the coil to absorb surges.

(1) Operate time

4

3

2

1

0 100 200 300 400

Operate timeOperate bounce time

Ope

rate

Bou

nce

Tim

e (m

s)O

pera

te T

ime

Applied Power (mW)

(2) Release time (with diode)

4

3

2

1

0 100 200 300 400

Release time

Release bounce time

Rel

ease

Bou

nce

Tim

e (m

s)(w

ith d

iode

)

Rel

ease

Tim

e

Applied Power (mW)

(3) Release time

4

3

2

1

0 100 200 300 400

Release time

Release bounce time

Applied Power (mW)

Rel

ease

Bou

nce

Tim

e (m

s)R

elea

se T

ime

Figure 3.5 Driving Power vs. Timing

Page 11: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

6

3.6 Driving pulse width vs. set & reset voltagesBecause the latching type relay can be driven on a pulse voltage, it can save power. However, if the pulse width

is too narrow, the relay does not operate correctly.

Figure 3.6 shows the relations among the width of the pulse voltage applied to the coil, the set voltage, and the

reset voltage of the latching type relay.

(1) Set voltage

200

100

02 3 4 5 6 7 8 9 10 20

Rat

io o

f set

vol

tage

to

nom

inal

vol

tage

(%

)

Driving Pulse Width (ms)

(2) Reset voltage

200

100

02 3 4 5 6 7 8 9 10 20

Rat

io o

f res

et v

olta

ge to

no

min

al v

olta

ge (

%)

Driving Pulse Width (ms)

Figure 3.6 Driving Pulse Width vs. Set & Reset Voltages

(Hints on correct use)

If the driving pulse width is too narrow, the relay cannot be driven at the nominal voltage. Hence, in actual

applications, apply a pulse with a width of 10 ms or more to the relay.

Page 12: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

7

3.7 Thermal characteristicsThe general characteristics of a relay gradually change with the ambient temperature. Figure 3.7 shows the typical

characteristics of the EC2 series relay.

(1) Operate & release voltages

130

120

110

100

90

80

70

– 40 –20 0 20 40 60 80 100Ambient Temprature Ta (˚C)

Cha

nge

in M

ust O

pera

te a

nd M

ust

Rel

ease

Vol

tage

s (%

)

OperateRelease

(2) Contact resistance* (4) Transfer times

130

120

110

100

90

80

70

– 40 –20 0 20 40 60 80 100Ambient Temprature Ta (˚C)

Cha

nges

in C

onta

ct R

esis

tanc

e (%

)

130

120

110

100

90

80

70

– 40 –20 0 20 40 60 80 100Ambient Temprature Ta (˚C)

Can

ge in

Tra

nsfe

r T

ime

(%) Operate

Release

(3) Operate & release times (5) Coil resistance

130

120

110

100

90

80

70

– 40 –20 0 20 40 60 80 100Ambient Temprature Ta (˚C)

Cha

nge

in M

ust O

pera

te a

nd M

ust

Rel

ease

Tim

es (

%)

OperateRelease

130

120

110

100

90

80

70

– 40 –20 0 20 40 60 80 100Ambient Temprature Ta (˚C)

Cha

nge

in C

oil R

esis

tanc

e (%

)

Figure 3.7 Temperature Characteristics

* The contact resistance includes the conductive resistance of the terminals. It is this conductive resistance

component that changes with the temperature.

Page 13: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

8

3.8 Magnetic interferenceThis section describes changes in the operate voltage caused by mutual magnetic interference when several relays

are closely mounted on a printed circuit board (PCB). Figure 3.8 (1) shows the distance among the relays mounted

on the PCB. As shown, the pin pitch of each relay is 2.54 mm. Figure 3.8 (2) shows the relay that is subject to

interference. In this figure, the hatched relay shown in the center of each relay arrangement is subject to interference,

and the surrounding relays influence the center relay. The condition under which the center relay suffers interference

and the surrounding relays affect the center relay differs depending on whether power is supplied to each relay. Figure

3.8 (3) shows the deviation in percent of the operate and release voltages of the center relays in Figure 3.8 (2).

(1) Mounting pitch (mm) (2) Relay arrangement

2.54

6 ×

2.54

2.54

ON OFF OFF

ON

ON

OFF

OFF

Condition1 Condition2

Condition3 Condition4

OFF

OFF

ON

ON

ON OFF

Condition5 Condition6

3 × 2.54

ON

[EC2 series]

(3) Deviation of must operate and must release voltages10.16

6 ×

2.54

2.54

2.54

[EE2 series]

+20

+10

0

–10

–201 2 3 4 5 6

Condition

Dev

iatio

n of

Mus

t O

pera

te V

olta

ge (

%)

+20

+10

0

–10

–201 2 3 4 5 6

Condition

Dev

iatio

n of

Mus

t R

elea

se V

olta

ge (

%)

Figure 3.8 Magnetic Interference

Page 14: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

9

3.9 High-frequency characteristicsFigure 3.9 shows the performance of the EC2 and the EE2 series relays when a high-frequency signal is switched

by the contacts of the relay. Figure 3.9 (1) shows the test circuit. Figure 3.9 (2) shows the isolation loss of the relay.

Figure 3.9 (3) and Figure 3.9 (4) respectively show the insertion loss and return loss.

(1) Test circuit

Test equipment: HP8505A Network Analyzer (characteristic impedance: 50 Ω)

OUT

Network Analyzer

Isolation Loss

Test Set

IN

50 Ω

OUT

Network Analyzer

Insertion Loss

Test Set

IN

50 Ω

OUT

Network Analyzer

Return Loss

Bridge

50 Ω 50 Ω

IN

(2) Isolation loss

70

60

50

40

30

20

10

010 100 1000

Isol

atio

n Lo

ss (

dB)

Frequency (MHz)

(3) Insertion loss (4) Return loss

70

60

50

40

30

20

10

010 100 1000

Ret

urn

Loss

(dB

)

Frequency (MHz)

1.5

1.0

0.5

010 100 1000

Inse

rtio

n Lo

ss (

dB)

Frequency (MHz)

Return Loss

V. S. W. R.

V. S

. W. R

.

1

2

3

Figure 3.9 High-frequency characteristics

Page 15: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

10

3.10 Coil inductanceThe control input of a relay is the coil. The coil inductance can be measured using the following two methods.

Either method may be used based on preference.

Table 3.1.1 and 3.1.2 show the results of measurement.

3.10.1 Measurement by LCR meter

Table 3.1.1 Coil Inductance

(Unit: mH)

Part Number Part Number Part Number

Non-latching type Inductance Single coil Inductance Double coil Inductance

(Standard type) Latching type Latching type

EC2/EE2-3 30 EC2/EE2-3S 14 EC2/EE2-3T 10

EC2/EE2-4.5 48 EC2/EE2-4.5S 32 EC2/EE2-4.5T 21

EC2/EE2-5 64 EC2/EE2-5S 40 EC2/EE2-5T 26

EC2/EE2-6 83 EC2/EE2-6S 56 EC2/EE2-6T 38

EC2/EE2-9 180 EC2/EE2-9S 130 EC2/EE2-9T 78

EC2/EE2-12 340 EC2/EE2-12S 220 EC2/EE2-12T 135

EC2/EE2-24 868 EC2/EE2-24S 1450 EC2/EE2-24T 825

(Measurement frequency: 1 kHz)

3.10.2 Measurement by coil current waveform

The inductance is calculated by observation of τ equaling 63.2 % of max value

τ: Determined by current waveform I = Imax (1 – e-t/τ).

Coi

l Cur

rent

Time (t)

63.2 %

100 %

τ

= × R= Coil resistance= Coil current

LRI

τ

Table 3.1.2 Coil Inductance

(Unit: mH)

Part Number Part Number Part Number

Non-latching type Inductance Single coil Inductance Double coil Inductance

(Standard type) Latching type Latching type

EC2/EE2-3 19 EC2/EE2-3S 11 EC2/EE2-3T 7

EC2/EE2-4.5 46 EC2/EE2-4.5S 27 EC2/EE2-4.5T 20

EC2/EE2-5 54 EC2/EE2-5S 34 EC2/EE2-5T 23

EC2/EE2-6 88 EC2/EE2-6S 51 EC2/EE2-6T 36

EC2/EE2-9 206 EC2/EE2-9S 120 EC2/EE2-9T 85

EC2/EE2-12 392 EC2/EE2-12S 241 EC2/EE2-12T 151

EC2/EE2-24 983 EC2/EE2-24S 1100 EC2/EE2-24T 820

(Applied voltage = Nominal D.C. voltage)

Page 16: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

11

3.11 CapacitanceTable 3.2 shows the capacitance between terminals of the EC2 and the EE2 series relay.

Note that the terminals not tested are left open.

12 10 9 8

1 3 4 5

Internal Connection of Relay (Bottom View)

12 10 9 8

1 3 4 5

[EC2 series] [EE2 series]

Table 3.2 Capacitance

(Unit: pF)

ParameterTerminal

CapacitanceNumber

Between Coil and Contact 1, 4 1.44

9, 12 1.45

Between Opening Contacts 4, 5 0.56

8, 9 0.57

Between Adjacent Contacts 4, 8 0.34

4, 9 0.64

5, 8 0.19

5, 9 0.34

Page 17: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

12

3.12 Resistance to surge voltageWhen a relay is used in a communication circuit, it may be subjected to a lightning surge via the circuit or due to

induction. A surge voltage test is conducted to measure the resistance of the EC2 and the EE2 series relays to surge

voltage.

(1) Test condition 1

The voltage waveform used for this test is specified by the Federal Communications Commission (FCC) Standard

Part 68.

The EC2 series relay can withstand even if the surge voltage shown in Figure 3.10 is applied (1) between opening

contacts, (2) between coil and contacts, or (3) between adjacent contacts.

VMAX.

VMAX./2

0

VMAX. = 1500 V

Vol

tage

(V

)

10 sµ

Time

160 sµ

Figure 3.10 Surge Voltage Waveform

(2) Test condition 2

The voltage waveform used for this test is specified by the Bellcore Standard. The EC2 and the EE2 series relay

can withstand even if the surge voltage shown in Figure 3.11 is applied between coil and contact.

0

Vol

tage

(V)

Time

2500

10 sµ2 sµ

2250

1250

250

Figure 3.11 Surge Current Waveform

Page 18: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

13

3.13 Current surge interrupt testThis test is conducted for the relay used in a communication circuit to evaluate the resistance to abnormally high

current appeared in the case of a touch between the communication circuit and an electric power line.

[Test conditions]

1. Voltage : 700 Vac (50 Hz)

2. Current : 4.2 A

3. Switching times : 4 times (At N.C. contact)

3.14 Resistance to carrying currentIf an abnormally high current flows continuously through the closed contacts of the relay for a long time, meltdown

of inner mold of the relay, and large deviation of characteristics may occur.

Figure 3.12 shows the relation between the value of the carrying current at which the relay can operate normally

and time.

Meltdown of Inner Mold

<Destruction Region>

Large Deviation of Characteristics After Test

Car

ryin

g C

urre

nt (

A)

100

50

20

10

5

2

10 s 20 s 30 s 40 s 50 s 1 m 2 m 5 m

Time

Figure 3.12 Resistance to Carrying Current

(Hints on correct use)

Limit the carrying current of the contacts to a maximum of 2 A to maintain the reliability of the relay.

Page 19: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

14

4. Distribution of CharacteristicsThis chapter presents the distribution data of the general characteristic values of the EC2 series relay on behalf

of the EC2 and the EE2 series relays, because they are designed with common specifications. The data shown in

this chapter are sampled from a certain production lot, and do not necessarily guarantee the characteristics of any

particular lot that is shipped. The number of samples is 40 relays for each test.

4.1 Operate & release voltages (set & reset voltages)This section shows the distribution of the voltage at which the relay operates.

(1) Non-latching, 5-V type (EC2-5)

2.5 3.00

5

10

Operate Voltage (V)

Num

ber

of S

ampl

es

1.0 2.00

5

10

Release Voltage (V)

Num

ber

of S

ampl

es

(2) Non-latching, 12-V type (EC2-12)

5 80

5

10

Operate Voltage (V)

Num

ber

of S

ampl

es

32.5 4.543.5 50

5

10

Release Voltage (V)

Num

ber

of S

ampl

es

104 6 7 9

(3) Latching of single-wound coil, 5-V type (EC2-5S)

2.0 2.50

5

10

Set Voltage (V)

Num

ber

of S

ampl

es

2.0 2.50

5

10

Reset Voltage (V)

Num

ber

of S

ampl

es

3.0 3.0

Figure 4.1 Operate & Release Voltages

Page 20: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

15

4.2 Operate & release times (set & reset times)This section shows the operate time that elapses from the time when the relay coil is energized until the relay

contacts close, and the release time that elapses from the time when the relay coil is deenergized until the closed

contacts open.

The number of samples used for each measurement is 40.

(1) Non-latching, 5-V type (EC2-5)

0

10

20

Operate Time (ms)

Num

ber

of S

ampl

es

2.0 2.5 3.02.0 2.5 3.00

10

20

Release Time (ms)

Num

ber

of S

ampl

es(2) Non-latching, 12-V type (EC2-12)

2.0 2.5 3.00

10

20

Operate Time (ms)

Num

ber

of S

ampl

es

2.0 2.5 3.00

10

20

Release Time (ms)

Num

ber

of S

ampl

es

(3) Latching of single-wound coil, 5-V type (EC2-5S)

1.5 2.0 2.50

10

20

Set Time (ms)

Num

ber

of S

ampl

es

1.5 2.0 2.50

10

20

Reset Time (ms)

Num

ber

of S

ampl

es

Figure 4.2 Operate & Release Times

Page 21: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

16

4.3 Transfer timeThis section gives data on the transfer time, which is the total time between the breaking of one set of contacts

and the making of another. The number of samples used for each measurement of the transfer time is 40.

(1) Non-latching, 5-V type (EC2-5)

0.5 1 1.50

10

20

Operate Transfer Time (ms)

Num

ber

of S

ampl

es

10.5 1.50

10

20

Release Transfer Time (ms)N

umbe

r of

Sam

ples

(2) Non-latching, 12-V type (EC2-12)

0.5 1 1.5 0.5 1 1.50

10

20

Operate Transfer Time (ms)

Num

ber

of S

ampl

es

0

10

20

Release Transfer Time (ms)

Num

ber

of S

ampl

es

(3) Latching of single-wound coil, 5-V type (EC2-5S)

0

10

20

Set Transfer Time (ms)

Num

ber

of S

ampl

es

0.5 1.510.5 1.510

10

20

Reset Transfer Time (ms)

Num

ber

of S

ampl

es

(without diode)

Figure 4.3 Transfer Times

Page 22: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

17

4.4 Timing and detailsThe EC2 and the EE2 series relays have two sets of transfer contacts. This section shows the movements of each

contact, which are not included in the timing specifications, using the timing chart shown in Figure 4.4A.

Normally OpenContact No. 2

Normally CloseContact No. 2

ON

OFF

ON

OFF

TOM1 THM1 TRM1

ON

OFF

TOB1

TRB1

TTO1THB1

TTR1

TOM2 THM2 TRM2

ON

OFF

ON

OFF

TOB2

TTO2

COO

TRB2 THB2

TTR2

COR

Coil Voltage

Energized

Not Energized

Normally OpenContact No. 1

Normally CloseContact No. 1

Figure 4.4A Timing Chart of Coil and Contacts

(Test results)

The timing specifications show the greater of the values of the two sets of contacts. The time difference between

the two contact sets, however, is almost negligible as shown in data (1) through (8) on the following pages. Practically,

therefore, the time difference can be ignored.

Page 23: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

18

The following charts show the distribution of timing. Twenty EC2-5’s are used as the samples.

(1) On times of make contacts at operation (TOM)

2.0 2.5

Contact #1

2.0 2.5

Contact #2

TOM1 (ms)

Num

ber

of S

ampl

es

0

10

20

TOM2 (ms)

Num

ber

of S

ampl

es

0

10

20

(2) Off times of break contacts at operation (TOB)

1.0 1.5 2.0 1.0 1.5 2.0TOB1 (ms)

Num

ber

of S

ampl

es

0

10

20

TOB2 (ms)

Num

ber

of S

ampl

es

0

10

20

Contact #2Contact #1

(3) Off times of make contacts at release (TRM)

1.0 1.5TRM1 (ms)

Num

ber

of S

ampl

es

0

10

20

1.0 1.5TRM2 (ms)

Num

ber

of S

ampl

es

0

10

20

Contact #1 Contact #2

Figure 4.4B Timing

Page 24: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

19

(4) On times of break contacts at release (TRB)

Num

ber

of s

ampl

es

1.5 2.0 2.5 1.5 2.0 2.50

10

20

TRB1 (ms)

Num

ber

of s

ampl

es

0

10

20

TRB2 (ms)

Contact #2Contact #1

(5) Bounce times of make contacts at operation (THM)

Num

ber

of s

ampl

es

0.5 1.00

10

20

THM1 (ms)

Num

ber

of s

ampl

es

0.5 1.00

10

20

THM2 (ms)

Contact #2Contact #1

(6) Bounce times of break contacts at release (THB)

Num

ber

of s

ampl

es

0.5 1.00

10

20

THB1 (ms)

Num

ber

of s

ampl

es

0.5 1.00

10

20

THB2 (ms)

Contact #2Contact #1

Figure 4.4C Timing

Page 25: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

20

(7) Operate transfer times (TTO)

1.0 1.5 1.0 1.50

10

20

Num

ber

of S

ampl

esContact #1

TTO1 (ms)

0

10

20

Num

ber

of S

ampl

es

Contact #2

TTO2 (ms)

(8) Release transfer times (TTR)

0

10

20

Num

ber

of S

ampl

es

TTR1 (ms)1.0 1.51.0 1.5

0

10

20

Num

ber

of S

ampl

es

TTR2 (ms)

Contact #1 Contact #2

(9) Common open times

1.0 1.5 1.00.50.5 1.50

10

20

Num

ber

of S

ampl

es

COO (ms)

0

10

20

Num

ber

of S

ampl

es

COR (ms)

At operation At release

Figure 4.4D Timing

Page 26: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

21

4.5 Contact resistanceThis section gives data on the resistance of the contacts when the contacts are closed. The number of sample

used for measurement of the contact resistance is 40 each.

(1) Non-latching, 5-V type (EC2-5)

35 40 450

10

20

Num

ber

of S

ampl

es

Contact Resistance (mΩ) (N.O. Contact)

35 40 450

10

20

Num

ber

of S

ampl

es

Contact Resistance (mΩ) (N.C. Contact)

(2) Non-latching, 24-V type (EC2-24)

35 40 450

10

20

Num

ber

of S

ampl

es

Contact Resistance (mΩ) (N.O. Contact)

35 40 450

10

20

Num

ber

of S

ampl

es

Contact Resistance (mΩ) (N.C. Contact)

(3) Latching of single-wound coil, 5-V type (EC2-5S)

35 40 450

10

20

Num

ber

of S

ampl

es

Contact Resistance (mΩ) (N.O. Contact)

35 40 450

10

20

Num

ber

of S

ampl

es

Contact Resistance (mΩ) (N.C. Contact)

Figure 4.5 Contact Resistance

Page 27: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

22

4.6 Breakdown voltageThis section gives data on the breakdown voltage between terminals of the EC2 series relay.

(Sample: EC2-5, n = 10 pcs.)

(a) Between open contacts (n = 20)

1.0 1.5 2.00

5

10

Num

ber

of S

ampl

es

Breakdown Voltage (kV)

(b) Between adjacent contacts (n = 10)

2.0 2.5 3.00

5

10

Num

ber

of S

ampl

es

Breakdown Voltage (kV)

1.5 2.0 2.50

5

10

Num

ber

of S

ampl

es

Breakdown Voltage (kV)

(c) Between coil and contacts (n = 20)

Figure 4.6 Breakdown Voltage

4.7 Thermal Electromotive Force (EMF) (offset voltage between contacts)

This section gives data on the thermal EMF which is a voltage that appears when the contacts are closed.

(Sample: EC2-5, number of samples = 10 pcs., number of data = 20)

(a) N.C. contact (not energized)

0.5 1.00

5

10

Num

ber

of S

ampl

es

Thermal EMF ( V)

(b) N.O. contact (energized)

0.5 1.0

5

10

Num

ber

of S

ampl

es

Thermal EMF ( V)µ µ0

Figure 4.7 Thermal EMF

Page 28: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

23

5. Test DataThis chapter shows examples of the results of environmental tests (refer to 5.1 for details) and contact life tests

(refer to 5.2). The table below lists the types of tests, conditions, and data. As the sample, the EC2/EE2-5 and EC2/

EE2-5S are used for the environmental tests, and the EC2-5 is used for the contact life tests.

Table 5 Types of Tests, Conditions, and Data

Test Test Conditions Refer to Page:

Environ- High-temperature test Ambient temperature: +105˚C 24 to 26

mental Duration: 672 hours

test Low-temperature test Ambient temperature: –40˚C 27, 28

Duration: 672 hours

Moisture resistance test Ambient temperature: –10˚C to +65˚C 29, 30

Humidity: 95% RH, test cycles: 10

Heat shock test Ambient temperature: –55˚C/+85˚C 31, 32

Test cycles: 100

Vibration test Amplitude: 1.52 mm, Test time: 2 hours each in X, Y, and Z directions 33, 34

Frequency: 10 Hz to 500 Hz, Peak acceleration: 20 G

Shock test Waveform: Half sine wave, 75 G max. 35, 36

6 Times each in X, Y, and Z directions, totaling 36 times

Resistance to solder Solder temperature: 260 ± 10˚C 37

heat test Immersion time: 10 seconds

Resistance to reflow Maximum temperature: 235 ˚C 38, 39

solder heat test Refer to Figure 5.8

Terminal strength Ambient temperature: 25˚C, Tensile strength: 1.36 kg 40

Number of times of bending: 2

Contact Non-load test A 25˚C 41

life Non-load test B 85˚C 42test

Resistive load test A 10 mV, 10 µA, 25˚C 42

Resistive load test B 10 Vdc, 10 mA, 85˚C 43

Resistive load test C 28 Vdc, 100 mA, 85˚C 43

Resistive load test D 50 Vdc, 100 mA, 25˚C 44

Resistive load test E 50 Vdc, 100 mA, 85˚C 44

Inductive load test 48 Vdc, 110 mA, 25˚C 45

Resistive load test F 220 Vdc, 0.14 A, 25˚C 45

Resistive load test G 125 Vdc, 0.5 A, 25˚C 46

Resistive load test H 30 Vdc, 1 A, 25˚C 46

Page 29: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

24

5.1 Environmental testsThis section shows the results of environmental tests to be conducted to evaluate the performance of the relay

under specific storage and operating environmental conditions. No abnormality was found after all the tests had been

conducted.

* The operate and release voltages, contact resistance, operate and release times, and transfer time of the sample

before and after each test were compared, but no major change in these parameters was observed, and the sample

still satisfied the initial standard values of the parameters after the test. For details, refer to the graph for each

test.

* The initial standard value of the insulation resistance of 109 Ω or higher was still satisfied after the test.

* The initial standard value of two breakdown voltages of 1500 Vac (between coil and contact), and of 1000 Vac

(between opening contacts, and between adjacent contacts) were satisfied for 1 minute after the test.

* After each test, no abnormality was found in the appearance. The cover of the relay was removed and the internal

mechanism was also inspected visually for dirt, deformation, and other abnormalities, but no such abnormalities

was found.

* After each test, a sealability test was conducted to examine the sealability of the relay by immersing the relay into

a fluorocarbon solution and checking to see if the internal gas of the relay leaked out. No abnormality was observed

as a result of this sealability test.

5.1.1 High-temperature test (test conditions: temperature: +105˚C, duration: 672 hours, sample: 10 pcs. each)

This test was conducted to check whether the performance of the relay is degraded after the relay has been left

at the upper-limit value of the rated ambient temperature for the specified duration.

[EC2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0

Before Test

Operate Voltage

Release Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

Normally Open (N.O.) Contact

Con

tact

Res

ista

nce

(mΩ

)

Normally Close (N.C.) Contact

(a) Operate & release voltages (b) Contact resistances

0

Before Test

Operate Time

Release Time

Ope

rate

& R

elea

se T

imes

(m

s)

1

1.5

1

0.5

0

Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

2.5

3

2

1.5

Figure 5.1 (1) High-temperature Test

Page 30: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

25

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0

Before Test

Set Voltage

Reset VoltageS

et &

Res

et V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

2

2.5

1.5

0

Before Test

Set Time

Reset Time

Set

& R

eset

Tim

es (

ms)

1

2

0.5

1.5

0

Before Test

Tra

nsfe

r T

ime

(ms)

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

At Set

At Reset

Figure 5.1 (2) High-temperature Test

Page 31: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

26

[EE2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0

Before Test

Operate Voltage

Release Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

Normally Open (N.O.) Contact

Con

tact

Res

ista

nce

(mΩ

)

Normally Close (N.C.) Contact

(a) Operate & release voltages (b) Contact resistances

0

Before Test

Operate Time

Release Time

Ope

rate

& R

elea

se T

imes

(m

s)

1

1.5

1

0.5

0

Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

2.5

3

2

1.5

Figure 5.1 (3) High-temperature Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0

Before Test

Set Voltage

Reset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

2

2.5

1.5

0

Before Test

Set Time

Reset Time

Set

& R

eset

Tim

es (

ms)

1

2

0.5

1.5

0

Before Test

Tra

nsfe

r T

ime

(ms)

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

At Set

At Reset

Figure 5.1 (4) High-temperature Test

Page 32: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

27

5.1.2 Low-temperature test (test conditions: temperature: –40˚C, duration: 672 hours, sample: 10 pcs. each)

This test is conducted to check whether the performance of the relay is degraded after the relay has been left at

the lower-limit value of the rated ambient temperature for the specified duration.

[EC2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2.5

2

1.5

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

1

0.5

2

1.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.2 (1) Low-temperature Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

1

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

2

1

1.5

0.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.2 (2) Low-temperature Test

Page 33: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

28

[EE2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2.5

2

1.5

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

1

0.5

2

1.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.2 (3) Low-temperature Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

1

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

2

1

1.5

0.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.2 (4) Low-temperature Test

Page 34: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

29

5.1.3 Moisture resistance test (test conditions: temperature: –10 C to 65˚C, humidity: 90 to 98% RH, test cycles:

10, sample: 10 pcs. each)

This test is conducted to check whether the performance of the relay is degraded after the relay has been left in

a highly humid atmosphere for the specified duration.

[EC2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2.5

1.5

2

1

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1.5

1

0.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.3 (1) Moisture Resistance Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

2.5

1.5

2

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

2

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.3 (2) Moisture Resistance Test

Page 35: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

30

[EE2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2.5

1.5

2

1

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1.5

1

0.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.3 (3) Moisture Resistance Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

2.5

1.5

2

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

2

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.3 (4) Moisture Resistance Test

Page 36: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

31

5.1.4 Heat shock test (test conditions: temperature: –55˚C to 85˚C, test cycles: 100, sample: 10 pcs, each)

This test is to check whether the performance of the relay is degraded if the ambient temperature abruptly changes.

[EC2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

3

2

1.5

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.4 (1) Heat Shock Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

1

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

2

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.4 (2) Heat Shock Test

Page 37: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

32

[EE2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

3

2

1.5

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.4 (3) Heat Shock Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

1

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

2

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.4 (4) Heat Shock Test

Page 38: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

33

5.1.5 Vibration test (test conditions: amplitude: 1.52 mm, frequency: 10 Hz to 500 Hz, 20 G peak, test time:

2 hours each in X, Y, and Z directions, totaling 6 hours, sample: 10 pcs. each)

This test is conducted to check whether the performance of the relay is degraded after vibration is continuously

applied to the relay while the relay is being transported.

[EC2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

1.5

3

2

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.5 (1) Vibration Test

(2) Latching of single-wound coil, 5-V

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

2

2

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

1

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.5 (2) Vibration Test

Page 39: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

34

[EE2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

1.5

3

2

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.5 (3) Vibration Test

(2) Latching of single-wound coil, 5-V

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

2

2

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

1

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.5 (4) Vibration Test

Page 40: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

35

5.1.6 Shock test (test conditions: waveform: half sine wave, peak acceleration: 75 G, 6 times each in X, Y, and

Z directions, totaling 36 times, sample: 10 pcs. each)

This test is conducted to check whether the performance of the relay is degraded after an abrupt shock is applied

to the relay while the relay is being transported.

[EC2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2

1

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.6 (1) Shock Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

2

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

1

1

1.5

0.5

0Before Test

At Set

Tra

nsfe

r T

ime

(ms) At Reset

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.6 (2) Shock Test

Page 41: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

36

[EE2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2

1

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

0Before Test

Tra

nsfe

r T

ime

(ms)

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

At OperationAt Release

Figure 5.6 (3) Shock Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

2

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

1

1

1.5

0.5

0Before Test

At Set

Tra

nsfe

r T

ime

(ms) At Reset

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.6 (4) Shock Test

Page 42: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

37

5.1.7 Resistance to solder heat test (test conditions: solder temperature = 260 ± 10˚C, immersion time: 10

seconds, sample: 10 pcs. each)

This test is conducted to check whether the performance of the relay is degraded after the relay has been exposed

to heat when it is soldered to a printed circuit board (PCB).

[EC2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Release Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2

1

2.5

1.5

0Before Test

Operate Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

0Before Test

At OperationT

rans

fer

Tim

e (m

s) At Release

(d) Transfer times

After TestAfter Test

After Test After Test

(c) Operate & release times

Release Time

Operate Voltage

Figure 5.7 (1) Resistance to Solder Heat Test

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

3

2

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

2

1

1.5

0.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.7 (2) Resistance to Solder Heat Test

Page 43: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

38

5.1.8 Resistance to reflow solder heat test

This test is conducted to check whether the performance of the relay is degraded after the relay has been exposed

to heat when it is soldered to a printed circuit board (PCB).

Test condition:

<1> Soldering method: IRS (Infrared Ray Soldering)

<2> PCB: Material epoxy-glass

Thickness 1.6 mm

Size 25 × 30 cm

<3> Temperature measurement point: Printed circuit board surface near the relay terminals

<4> Temperature profile: Refer to Figure 5.8

200 sec.80 sec.

30 sec.

200175150

Tem

pera

ture

(˚C

)

Tmax.: 235

Figure 5.8 Temperature Profiles

Page 44: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

39

[EE2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

100

50

20

10

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2

1

0Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(ms)

1

0.5

0Before Test

At Operation

Tran

sfer

Tim

e (m

s) At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.8 (1) Resistance to Reflow Solder Heat

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

100

50

20

10

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

2

1

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (m

s)

1

0.5

0Before Test

At Set

Tran

sfer

Tim

e (m

s) At Reset

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.8 (2) Resistance to Reflow Solder Heat

Page 45: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

40

5.1.9 Terminal strength test (test conditions: ambient temperature: 25˚C, tensile strength: 1.36 kg, number of

times of bending: 2, sample: 10 pcs. each)

The purpose of this test is to check whether the performance of the relay is degraded after an excessive force

is applied to the terminals of the relay when the relay is mounted on a PCB.

[EC2 series]

(1) Non-latching, 5-V type

5

4

3

2

1

0Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

Before Test

N. O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N. C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

1.5

0

3

2

Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Operate & release times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.9 (1) Terminal Strength

(2) Latching of single-wound coil, 5-V type

5

4

3

2

1

0Before Test

Set VoltageReset Voltage

Set

& R

eset

Vol

tage

s (V

)

200

100

50

20

Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

N.C. Contact

(a) Set & reset voltages (b) Contact resistances

2

1

2.5

1.5

0Before Test

Set TimeReset Time

Set

& R

eset

Tim

es (

ms)

1

1

1.5

0.5

0Before Test

At Operation

Tra

nsfe

r T

ime

(ms) At Release

(c) Set & reset times (d) Transfer times

After TestAfter Test

After Test After Test

Figure 5.9 (2) Terminal Strength

Page 46: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

41

5.2 Contact life testsThis section shows the results of tests conducted to examine the service life of the contacts, which has a significant

influence on the life of the relay.

To test the service life of the contacts, the operate and release voltages, contact resistance, operate and release

times, and transfer time of each relay is measured each time the relay has performed the specified number of

operations under the specified conditions.

The service life of contacts of the EC2 series relay is equal to the one of the EE2 series relay, because they have

common structure.

For changes in the characteristics, refer to the graphs shown below.

5.2.1 Non-load test A (driving frequency: 50 Hz, ambient temperature: +25˚C, sample: 10 non-latching types

(rated at 5 V))

The cleanness of the contact surfaces influences the result of this test because no electric load is applied to the

relay.

5

4

3

2

1

05 10Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

05 10Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×107 Times) Number of Operations (×107 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

1.5

3

2

15 10Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

05 10Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×107 Times) Number of Operations (×107 Times)

At Release

(c) Operate & release times (d) Transfer times

Figure 5.10 Non-load Test A

Page 47: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

42

5.2.2 Non-load test B (driving frequency: 50 Hz, ambient temperature: +85˚C, sample: 10 non-latching types

(rated at 5 V))

The conditions of this test are more stringent than those of the test in 5.2.1 because the relay is exposed to a higher

ambient temperature and consequently organic gas is more likely to be generated inside the relay housing.

5

4

3

2

1

05 10Before TestO

pera

te &

Rel

ease

Vol

tage

s (V

)

200

100

50

20

05 10Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×107 Times) Number of Operations (×107 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2

1

05 10Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

05 10Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×107 Times) Number of Operations (×107 Times)

At Release

(c) Operate & release times (d) Transfer times

Operate VoltageRelease Voltage

Figure 5.11 Non-load Test B

5.2.3 Resistive load test A (contact load: 10 mVdc, 10 µA, resistive, driving frequency: 25 Hz, ambient

temperature: +25˚C, sample: 10 non-latching types (rated at 5 V))

This test is conducted with the relay under the minimum applied load condition.

5

4

3

2

1

05 10Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

05 10Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×107 Times) Number of Operations (×107 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

3

2

1.5

05 10Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

05 10Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×107 Times) Number of Operations (×107 Times)

At Release

(c) Operate & release times (d) Transfer times

Figure 5.12 Resistive Load Test A

Page 48: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

43

5.2.4 Resistive load test B (contact load: 10 Vdc, 10 mA, resistive, driving frequency: 2 Hz, ambient temperature:

+85˚C, sample: 10 non-latching types (rated at 5 V))

This test is conducted with a load equivalent to the signal level of an IC applied to the relay.

5

4

3

2

1

05 10Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

05 10Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×105 Times) Number of Operations (×105 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2.5

2

1.5

05 10Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

1

1

05 10Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×105 Times) Number of Operations (×105 Times)

At Release

(c) Operate & release times (d) Transfer times

1.5

0.5

Figure 5.13 Resistive Load Test B

5.2.5 Resistive load test C (contact load: 28 Vdc, 100 mA, resistive, driving frequency: 2 Hz, ambient tempera-

ture: +85˚C, sample: 10 non-latching types (rated at 5 V))

This test is conducted with a load of medium level applied to the relay contacts.

5

4

3

2

1

02 5Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

100

50

20

10

02 5Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×105 Times) Number of Operations (×105 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2

2.5

1.5

02 5Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

1

1

1.5

0.5

02 5Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×105 Times) Number of Operations (×105 Times)

At Release

(c) Operate & release times (d) Transfer times

Figure 5.14 Resistive Load Test C

Page 49: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

44

5.2.6 Resistive load test D (contact load: 50 Vdc, 100 mA, resistive, driving frequency: 5 Hz, ambient tempera-

ture: +25˚C, sample: 10 non-latching types (rated at 5 V))

The load conditions of this test are equivalent to the voltage and current levels of a public telephone circuit.

5

4

3

2

1

05 10Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

05 10Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×105 Times) Number of Operations (×105 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2.5

2

1.5

05 10Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

05 10Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×105 Times) Number of Operations (×105 Times)

At Release

(c) Operate & release times (d) Transfer times

Figure 5.15 Resistive Load Test D

5.2.7 Resistive load test E (contact load: 50 Vdc, 100 mA, resistive, driving frequency: 5 Hz, ambient temperature:

+85˚C, sample: 10 non-latching types (rated at 5 V))

The conditions of this test are more stringent for the relay than those in 5.2.6 above because the ambient

temperature is higher.

5

4

3

2

1

05 10Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

05 10Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×105 Times) Number of Operations (×105 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

1.5

05 10Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

05 10Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×105 Times) Number of Operations (×105 Times)

At Release

(c) Operate & release times (d) Transfer times

1.5

0.5

3

1

Figure 5.16 Resistive Load Test E

Page 50: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

45

5.2.8 Inductive load test (contact load: 48 Vdc, 110 mA, inductive load by wire spring relay, driving frequency:

2 Hz, ambient temperature: +25˚C, sample: 10 non-latching types (rated at 5 V))

The conditions of this test are practical load conditions under which the relay is used to switch a public telephone

circuit.

5

4

3

2

1

05 10Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

05 10Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×105 Times) Number of Operations (×105 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

3

2

1.5

05 10Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

05 10Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×105 Times) Number of Operations (×105 Times)

At Release

(c) Operate & release times (d) Transfer times

Figure 5.17 Inductive Load Test

5.2.9 Resistive load test F (contact load: 220 Vdc, 0.14 A, resistive, driving frequency: 2 Hz, ambient temperature:

+25˚C, sample: 10 non-latching types (rated at 5 V))

The load conditions of this test are at the maximum switching voltage and maximum switching power with the

contacts switching a DC load.

5

4

3

2

1

01 2Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

01 2Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×105 Times) Number of Operations (×105 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

2.5

3

2

1.5

01 2Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

01 2Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×105 Times) Number of Operations (×105 Times)

At Release

(c) Operate & release times (d) Transfer times

Figure 5.18 Resistive Load Test F

Page 51: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES

46

5.2.10 Resistive load test G (contact load: 125 Vac, 0.5 A, resistive, driving frequency: 2 Hz, ambient tempera-

ture: +25˚C, sample: 10 non-latching types (rated at 5 V))

The load conditions of this test are at the maximum switching voltage and maximum switching power with the

contacts switching an AC load.

5

4

3

2

1

01 2Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

01 2Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×105 Times) Number of Operations (×105 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2.5

2

1.5

01 2Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

01 2Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×105 Times) Number of Operations (×105 Times)

At Release

(c) Operate & release times (d) Transfer times

Figure 5.19 Resistive Load Test G

5.2.11 Resistive load test H (contact load: 30 Vdc, 1 A, resistive, driving frequency: 2 Hz, ambient temperature:

+25˚C, sample: 10 non-latching types (rated at 5 V))

The load conditions of this test are at the maximum switching current and maximum switching power with the

contacts switching a DC load.

5

4

3

2

1

01 2Before Test

Operate VoltageRelease Voltage

Ope

rate

& R

elea

se V

olta

ges

(V)

200

100

50

20

01 2Before Test

N.O. Contact

Con

tact

Res

ista

nce

(mΩ

)

Number of Operations (×105 Times) Number of Operations (×105 Times)

N.C. Contact

(a) Operate & release voltages (b) Contact resistances

3

2.5

2

1.5

01 2Before Test

Operate TimeRelease Time

Ope

rate

& R

elea

se T

imes

(m

s)

2

1

1.5

0.5

01 2Before Test

At Operation

Tra

nsfe

r T

ime

(ms)

Number of Operations (×105 Times) Number of Operations (×105 Times)

At Release

(c) Operate & release times (d) Transfer times

Figure 5.20 Resistive Load Test H

Page 52: MINIATURE SIGNAL RELAYS EC2 SERIES (DIP TYPE) EE2 SERIES