Microscopy Through the Centuries:An Exploration of Microscopic Imaging

Without Lenses

M. S. IsaacsonBaskin School of Engineering

University of California at Santa Cruzmsi@soe.ucsc.edu

IMC 17Pre-Congress IFSM Advanced School,

September 19, 2010Rio de Janeiro, Brazil

HOW WE VIEW THE WORLD?

HOW DO WE IMAGE THE SMALLEST OBJECTS?

•Reduce the imperfections (ie, aberrations) in the imaging system.

THEN

What are we left with for a “perfect” imaging system?

DIFFRACTION

Microscopy Through the Centuries

Microscopy Through the Centuries

MICROSCOPY WITHOUT LENSES

Point ProjectionStill diffraction limited

Scanned TipLimited by physical dimensions not diffraction

Ho Hi

Ho Hi

u v

uv

Hi/Ho = ‐v/u

Hi/Ho= v/u  = M

Pinhole camera

Projection Microscope

Imaging Without Lenses    

Blurring /  penumbral, dp = sv/u    /   diffraction,  dd = (λ(v‐u))1/2s = pinhole size or source size

pinhole

Source

Ibn Al-Haytham, “Kitab al-Manazir” (Book of Optics, abt. 1010). Translated into Latin (1572) as “Opticae Thesaurus”

Expanded drawing from Al-HaythamFrom: www.islamic-study.org/optics.htm

Principles of the Camera Obscura

Ho Hi

Ho Hi

u v

uv

Hi/Ho = ‐v/u

Hi/Ho= v/u  = M

Pinhole camera

Projection Microscope

Imaging Without Lenses    

Blurring /  penumbral, dp = sv/u    /   diffraction,  dd = (λ(v‐u))1/2s = pinhole size or source size

pinhole

Source

from, G.A. Morton and E.G. Ramberg, Phys. Rev. 56(7).1939. p.705

Earliest Point Projection Transmission Electron Micrographs

50 nm

Point Projection Microscopy: The Field Ion Microscope

Field Ion Micrograph: Platinum TipE. W. Mueller, Science. 149,591 (1965)

From Fink et.al., Phys.Rev.Let. 67(12)1991.

a) in-line holography b) projection microscopymagnification = D/d

Holograms of

Low voltage,point projection

200 keV transmissionElectron micrograph

Point Projection Microscopy:Carbon Filaments

All conventional transmission electron micrographs on the right are taken at 200KeV

Point Projection micrographs on the left

89 eV, 5000nm

65 eV, 1000nm

16 eV, 1700nm

From: Morin and Gargani,Phy. Rev.B. 48(9).1993. 6643-6645.

The distance is from the tip to the sample

From: J.Spence, Micron, 28(2), 1997. 101-116.

Electron Energy = 80eV,Carbon fiber

Electron energy =100eVPurple membrane

10 nm

Point Projection Imaging of Biomolecules

30 nm

MICROSCOPY WITHOUT LENSES

Scanned Tip (physical dimensions)Not diffraction limited

Point ProjectionDiffraction limited

Scanned Tip Microscopies

From: Wikipedia

First Demonstration of Tunneling with 0.1nm Gap ControlApplied Physics Letters.40 (1982).178-180.

From: G. Binnig and H. Roher. Surf. Sci.126 (1983).pp.236-244

The IBM Scanning Tunneling Microscope

STM Images of Silicon 7x7 Reconstructionon (111) Surface

http://www.fkp.uni-erlangen.de/methoden/stmtutor/stmpage.html

From: G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel. Phys. Rev. Lett. 50(2).1983.pp.120-123.

G. Binnig, C.F.Quate and Ch. Gerber, Phys. Rev. Lett. 56(9).1986. 930-933.

Atomic Force Microscopy

From K. Mitchell: 2010

Generic AFM Detection Scheme

AFM, real-time imaging of spores (Bacillus atrophaeus)Scale bars = 500nm.

a.3h40min, b.5hr45min, c.7hr5min, d.7hr,30min, e. 7hr45min

From: M. Plomp et.al. PNAS(USA).104 (2007).9644-9649.

Atomic Force Microscopy

Reviews of Scanned Tip Microscopy(selected)

P. Hansma and J. Tersoff. Journal Appl. Phys. 61(2). 1987.R1-R23.“Scanning Tunneling Microscopy”

Y.F. Dufrene. Nature Reviews Microbiology. 6. 2008. 674-680,“Towards Nanomicrobiology Using Atomic Force Microscopy”.

B. Bhushan, ed. “Scanning probe Microscopy in Nanoscience and Nanotechnology”, (Springer-Verlag, Heidelberg, 2010).

A. Schulte, M. Nebel and W. Schuhmann. Ann. Rev. of Anal. Chem.3 (2010). 299-318.”Scanning Electrochemical Microscopy in Neuroscience”

Edward Hutchinson Synge

Letter to Albert Einstein, 1928

NSOM CONCEPTUAL BEGINNINGS

The Idea of Near Field Optical Imaging

From D. McMullan, Proc. RMS. 25(2).1990.p.130

E.H.Synge, Phil. Mag.6.(1928).pp.356-362. “A Suggested Method for Extending Microscopic Resolution into the Ultra-microscopic Region”.

E.H.Synge, Phil. Mag. S7(13).(1932).pp.297-300. “An Application of Piezo- electricity to Microscopy”.

NSOM CONCEPTUAL BEGINNINGS

Edward Hutchinson Synge

Letter to Albert Einstein, 1928

INITIAL THEORETICAL FOUNDATIONS OF NEAR-FIELD MICROSCOPY/IMAGING

H.A. Bethe, Phys. Rev. 66(1944).163,“Theory of Diffraction by Small Holes”

C.J. Bouwkamp, Philips Res. Rept. 5(1950).321-332,“On Bethe’s theory of Diffraction by Small Holes”.

C.J. Bouwkamp, Philips Res. Rept. 5(1950).410-422,“On the Diffraction of Electromagnetic Waves by Small Circular Holes and Disks”.

E. Betzig, A. Harootunian, A.Lewis and M.Isaacson, Appl. Opt.25 (1986).1890-1900,

“Near Field Diffraction by a Slit: Implications for Super-Resolution Microscopy”.

A.Roberts, J. Opt. Soc. Am. A4(1987).1970-1983,“Electromagnetic Theory of diffraction by a Circular Aperture

in a Thick, Perfectly Conducting Screen”.

Diffraction at an Aperture

Evanescent Waves and Diffraction

JOSA.46(5).1956.359 JOSA.46(10).1956.901

Rediscovery of Near Field Imaging

Letter width = λ/20

from E.A. Ash and G. Nicholls. Nature.237.(1972)510.

Rediscovery of Near-Field Imaging

Applied Optics.23(5).1984.658-659.

Near Field Scanning Optical Microscopy (NSOM)

50 nm

50 nm

Betzig, Isaacson, Lewis and Harootunian, 1986

Collection Illumination Collection/Illumination

Oblique Reflection Oblique Collection

Some Imaging Modes of NSOM: Pipette/Fiber Illumination

Adapted from Paessler and Moyer, 1996

INITIAL THEORETICAL FOUNDATIONS OF NEAR-FIELD MICROSCOPY/IMAGING

H.A. Bethe, Phys. Rev. 66(1944).163,“Theory of Diffraction by Small Holes”

C.J. Bouwkamp, Philips Res. Rept. 5(1950).321-332,“On Bethe’s theory of Diffraction by Small Holes”.

C.J. Bouwkamp, Philips Res. Rept. 5(1950).410-422,“On the Diffraction of Electromagnetic Waves by Small Circular Holes and Disks”.

E. Betzig, A. Harootunian, A.Lewis and M.Isaacson, Appl. Opt.25 (1986).1890-1900,

“Near Field Diffraction by a Slit: Implications for Super-Resolution Microscopy”.

A.Roberts, J. Opt. Soc. Am. A4(1987).1970-1983,“Electromagnetic Theory of diffraction by a Circular Aperture

in a Thick, Perfectly Conducting Screen”.

Power transmission through a metallic screen

A. Harootunian, 1987.

theoretical, Roberts (1989)

D = aperture diameterT = aperture thickness

Transmission Through Apertures Below Cutoffλ = 632.8 nm, T = 56 nm

M.isaacson, A. Harootunian, 1992

NSOM Instrument Constructed at Cornell

M.Isaacson, 8/3/10

NSOM Instrument Constructed at Cornell

M.Isaacson, 8/3/10

60 nm away

Effect of Distance on Spatial Resolution

600 nmM.Isaacson, et.al. 1990

60 nm away

600 nm away

Effect of Distance on Spatial Resolution

600 nmM.Isaacson, et.al. 1990

PSF(r) = |F[A(ρ)]F[A(ρ)*|

Far Field

From: M. Isaacson, et.al, Ultramicroscopy (1992)

Point Spread Functions for Microscopy

ρ

r

PSF(r) = |F[A(ρ)]F[A(ρ)*|

Far Field

PSF(r) = |A(ρ)A(ρ)*|

Near Field

From: M. Isaacson, et.al, Ultramicroscopy (1992)

Point Spread Functions for Microscopy

ρ

r

Far Field Near Field

Point Spread Functions for Near Field and Far Field Microscopy

r = radial distance in image plane, R = aperture radius, F=aperture to image plane distance (far field), λ = wavelength

From M.Isaacson, et.al. Ultramicroscopy. 47 (1992).15-22.

Far field Near field

NEAR FIELD PROBE INTENSITY DISTRIBUTION

r = radial distanceR =probe diameter

circles = metalized pipette, squares = metalized fiber

Data from: M.Isaacson et.al, JVST.B9,1991: E. Betzig, et. al. Science.51.1991

Effect of Polarization on NSOM Imaging

Aluminum letters on Silicon Nitride Substrate1 μm full horizontal scale

m.isaacson and j. cline, 1995

Near Field Scanning Optical Microscopy (Reflection)aluminum on silicon

Shear force NSOM

400nm

J. Cline and M. Isaacson, Ultramicroscopy,57(2/3), 147-152 (1995)

Shear Force Reflectiondetector at bottom of field

NSOM Imaging of Aluminum on Aluminum Patterns

J. Cline and M. Isaacson, 1995

1000 nm

Polarization Effects in Reflection NSOM

J. Cline and M. Isaacson, Appl. Opt.34(22).1995.4869-4876.

polarization

detector

From: J. Wessel, J.Opt.Sci.Am. B.2 (1985).p. 1538-1541.

NSOM by Light Scattering from a Point

From: E.P. Krider, Physics Today.Jan. 2006.p.42-48.

Enhanced Electric Fields at Pointed Metal Tips

NSOM by Light Scattering from a Tip. 2

From: F.Keilmann and R.Hilenbrand. Phil.Trans.Roy.Soc.A.362(2004).787-805.

AFM tip

Visible, λ = 633nm Infra-Red, λ = 9.7 μm

From: F.Keilmann and R.Hilenbrand. Phil.Trans.Roy.Soc.A.362(2004).787-805.T. Taubner, R. Hillenbrand and F. Keilmann, J. Microscopy.210(3).2003.311-314..

NSOM by Light Scattering from a Tip

AFM images

NSOM images

Various Types of “Sharp” Tips for Field Enhanced NSOM

From: A. Bouhelier. Micr. Res. & Tech. 69 (2006). 563-579.

Reviews of Near-Field Microscopy/ Optics(selected)

D. Courjon and C. Bainier, Rep. Prog. Phys. 1994.989-1028. Near Field Microscopy and Near Field Optics”.

M. Isaacson (ed.). Ultramicroscopy.57(2/3). 1995. 113-322,“Near-Field Optics”

M.A. Paessler and P.J.Moyer, “Near-Field Optics: Theory, Instrumentation and Applications”, (Wiley Interscience, New York, 1996)

D. Richards and A. Zayate, (eds.). Phil.Trans. Roy. Soc. London.A362 (2004).698-919, “Special issue on Nano Optics and Near-Field Microscopy”.

L. Novotny and B. Hecht. “Principles of Nano Optics”. (Cambridge University Press, Cambridge, 2006).

L. Novotny, in Progress In Optics. E. Wolf (ed.).(Elsevier, Amsterdam,2007).137-189,”History of near-Field Optics”.

Microscopy Through the Centuries:An Exploration of Microscopic Imaging

Without Lenses

IMC 17Pre-Congress IFSM Advanced School,

September 19, 2010Rio de Janeiro, Brazil

M. S. IsaacsonBaskin School of Engineering

University of California at Santa Cruzmsi@soe.ucsc.edu

Isaacson IFSM School.pdf